Ion beam paths on target surfaces for neutron beam generation

US12414219B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12414219-B2
Application numberUS-202318540447-A
CountryUS
Kind codeB2
Filing dateDec 14, 2023
Priority dateAug 26, 2020
Publication dateSep 9, 2025
Grant dateSep 9, 2025

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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Embodiments of systems, devices, and methods relate to selecting a raster profile for scanning a proton beam across a target. A raster profile is selected from among the plurality of plurality of possible raster profiles based on a value of a figure of merit. A beam is directed across the target surface to form a pattern that is repeated one or more times at different radial orientations to form a scanning profile. A target temperature is monitored while scanning the beam across the target surface according to the scanning profile. The scanning parameters are changeable to avoid target damaging, to improve thermal performance and to optimize particle loading.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of operating a beam, comprising: scanning the beam across a scannable surface of a target along a first path; and scanning the beam across the scannable surface of the target along a second path, wherein the first path forms a first pattern at a first radial orientation, and the second path forms substantially the first pattern at a second radial orientation different from the first radial orientation. 2. The method of claim 1 , wherein the beam is pulsed while scanning along the first path and the second path. 3. The method of claim 1 , wherein the beam continuously propagates while scanning along the first path and the second path. 4. The method of claim 1 , wherein the beam moves from an inner region to an outer region of the scannable surface and back to the inner region in the first pattern. 5. The method of claim 1 , wherein the beam moves from an outer region to an inner region of the scannable surface and back to the outer region in the first pattern. 6. The method of claim 1 , wherein the first pattern comprises a spiral and a mirror image of the spiral. 7. The method of claim 1 , wherein the first pattern has a first half and a second half, wherein the first half and the second half are symmetrical. 8. The method of claim 1 , wherein the first pattern has a start location and a stop location, wherein the start location is at or adjacent to the stop location. 9. The method of claim 1 , wherein the first radial orientation differs from the second radial orientation by 180 degrees. 10. The method of claim 1 , further comprising: scanning the beam across the scannable surface of the target along a third path, wherein the third path forms the first pattern at a third radial orientation different from the first radial orientation and the second radial orientation. 11. The method of claim 10 , wherein the first radial orientation, the second radial orientation, and the third radial orientation differ by 120 degrees. 12. The method of claim 10 , further comprising: scanning the beam across the scannable surface of the target along a fourth path, wherein the fourth path forms the first pattern at a fourth radial orientation different from the first radial orientation, the second radial orientation, and the third radial orientation. 13. The method of claim 12 , wherein the first radial orientation, the second radial orientation, the third radial orientation, and the fourth radial orientation differ by 90 degrees. 14. The method of claim 12 , further comprising: scanning the beam across the scannable surface of the target along a fifth path, wherein the fifth path forms the first pattern at a fifth radial orientation different from the first radial orientation, the second radial orientation, the third radial orientation, and the fourth radial orientation, wherein the first radial orientation, the second radial orientation, the third radial orientation, the fourth radial orientation, and the fifth radial orientation differ by 72 degrees. 15. The method of claim 1 , wherein the first path corresponds to a first instance of a cycle, and the second path corresponds to a second instance of the cycle, wherein scanning of the first instance of the cycle and the second instance of the cycle forms a closed loop. 16. The method of claim 1 , wherein the beam is a proton beam and the scannable surface is a lithium or beryllium surface. 17. The method of claim 1 , wherein the target generates neutrons when scanned. 18. The method of claim 1 , wherein the beam is scanned across the scannable surface of the target along a plurality of paths, wherein the plurality of paths comprises the first path and the second path, wherein a quantity N of paths in the plurality of paths is two or more, wherein the N paths together form a closed loop, and wherein each of the N paths forms substantially the first pattern radially offset from an adjacent one of the paths by 360/N degrees. 19. The method of claim 1 , wherein the beam has a cross-sectional profile that is at least one of circular, elliptical, annular, and hollow. 20. The method of claim 1 , wherein the beam is generated by a beam system comprising: an ion source; a first beamline coupled with the ion source; a tandem accelerator coupled with the first beamline; a second beamline coupled with the tandem accelerator; and the target coupled with the second beamline.

Assignees

Inventors

Classifications

  • for measuring beam parameters · CPC title

  • for modifying beam trajectory, e.g. gantries · CPC title

  • Targets for producing nuclear reactions (supports for targets or objects to be irradiated G21K5/08 {; preparation of tritium C01B4/00; targets, e.g. pellets for fusion reactions by laser or charged particles beam injection H05H1/22}) · CPC title

  • Neutrons · CPC title

  • X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy (A61N5/01 takes precedence) · CPC title

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What does patent US12414219B2 cover?
Embodiments of systems, devices, and methods relate to selecting a raster profile for scanning a proton beam across a target. A raster profile is selected from among the plurality of plurality of possible raster profiles based on a value of a figure of merit. A beam is directed across the target surface to form a pattern that is repeated one or more times at different radial orientations to for…
Who is the assignee on this patent?
Tae Tech Inc
What technology area does this patent fall under?
Primary CPC classification H05H7/001. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 09 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).