Native sampler feedback technology

US12412332B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12412332-B2
Application numberUS-202117485244-A
CountryUS
Kind codeB2
Filing dateSep 24, 2021
Priority dateSep 24, 2021
Publication dateSep 9, 2025
Grant dateSep 9, 2025

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

Methods, systems and apparatuses may provide for hardware sampler technology that determines mip region dimensions of a feedback map based on a description of the feedback map, identifies accessed texels in a texture based on a view of a resource that is paired with the feedback map, and records the accessed texels in the feedback map based on the mip region dimensions.

First claim

Opening claim text (preview).

We claim: 1. A computing system comprising: a host processor; and a graphics processor coupled to the host processor, wherein the graphics processor includes sampler logic coupled to one or more substrates, the sampler logic to: determine mip region dimensions of a feedback map based on a description of the feedback map, identify accessed texels in a texture based on a view of a resource that is paired with the feedback map, and record the accessed texels in the feedback map based on the mip region dimensions; wherein the graphics processor further includes a native copy operation to transfer mip region information between the feedback map and an application resource, wherein the native copy operation is to operate via one or more of: bypassing a padded portion of the feedback map, or bypassing, by the mip region information, a color compression surface. 2. The computing system of claim 1 , wherein the sampler logic is to translate coordinates of the accessed texels into mip region coordinates in the feedback map based on the mip region dimensions, and wherein the accessed texels are recorded in the feedback map in accordance with the mip region coordinates. 3. The computing system of claim 1 , wherein each pixel in the feedback map is to contain information for one complete mip region. 4. The computing system of claim 1 , wherein the accessed texels are recorded in the feedback map in an application-usable data storage layout. 5. The computing system of claim 1 , wherein the view is a subset of all array elements of the resource. 6. The computing system of claim 1 , wherein the view is a subset of all mip levels of the resource. 7. The computing system of claim 1 , wherein the view is to be a shader resource view. 8. A semiconductor apparatus comprising: one or more substrates; and sampler logic coupled to the one or more substrates, wherein the sampler logic is implemented at least partly in one or more of configurable or fixed-functionality hardware, the sampler logic to: determine mip region dimensions of a feedback map based on a description of the feedback map; identify accessed texels in a texture based on a view of a resource that is paired with the feedback map; and record the accessed texels in the feedback map based on the mip region dimensions; wherein the semiconductor apparatus further includes a native copy operation to transfer mip region information between the feedback map and an application resource, wherein the native copy operation is to operate via one or more of: bypassing a padded portion of the feedback map, or bypassing, by the mip region information, a color compression surface. 9. The semiconductor apparatus of claim 8 , wherein the sampler logic is to translate coordinates of the accessed texels into mip region coordinates in the feedback map based on the mip region dimensions, and wherein the accessed texels are recorded in the feedback map in accordance with the mip region coordinates. 10. The semiconductor apparatus of claim 8 , wherein each pixel in the feedback map is to contain information for one complete mip region. 11. The semiconductor apparatus of claim 8 , wherein the accessed texels are recorded in the feedback map in an application-usable data storage layout. 12. The semiconductor apparatus of claim 8 , wherein the view is a subset of all array elements of the resource. 13. The semiconductor apparatus of claim 8 , wherein the view is a subset of all mip levels of the resource. 14. The semiconductor apparatus of claim 8 , wherein the view is to be a shader resource view. 15. A method comprising: determining, by a hardware sampler of a graphics processor, mip region dimensions of a feedback map based on a description of the feedback map; identifying, by the hardware sampler, accessed texels in a texture based on a view of a resource that is paired with the feedback map; and recording, by the hardware sampler, the accessed texels in the feedback map based on the mip region dimensions; wherein the graphics processor further includes a native copy operation to transfer mip region information between the feedback map and an application resource, wherein the native copy operation operates via one or more of: bypassing a padded portion of the feedback map, or bypassing, by the mip region information, a color compression surface. 16. The method of claim 15 , further including translating, by the hardware sampler, coordinates of the accessed texels into mip region coordinates in the feedback map based on the mip region dimensions, wherein the accessed texels are recorded in the feedback map in accordance with the mip region coordinates. 17. The method of claim 15 , wherein each pixel in the feedback map contains information for one complete mip region. 18. The method of claim 15 , wherein the accessed texels are recorded in the feedback map in an application-usable data storage layout. 19. The method of claim 15 , wherein the view is a subset of all array elements of the resource. 20. The method of claim 15 , wherein the view is a subset of all mip levels of the resource. 21. The method of claim 15 , wherein the view is a shader resource view.

Assignees

Inventors

Classifications

  • General purpose rendering architectures · CPC title

  • Memory management · CPC title

  • Processor architectures; Processor configuration, e.g. pipelining · CPC title

  • G06T15/04Primary

    Texture mapping · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US12412332B2 cover?
Methods, systems and apparatuses may provide for hardware sampler technology that determines mip region dimensions of a feedback map based on a description of the feedback map, identifies accessed texels in a texture based on a view of a resource that is paired with the feedback map, and records the accessed texels in the feedback map based on the mip region dimensions.
Who is the assignee on this patent?
Intel Corp
What technology area does this patent fall under?
Primary CPC classification G06T15/04. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Sep 09 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).