Infrared transmissivity measurement method of quartz glass crucible

US12392050B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12392050-B2
Application numberUS-202418443722-A
CountryUS
Kind codeB2
Filing dateFeb 16, 2024
Priority dateDec 27, 2018
Publication dateAug 19, 2025
Grant dateAug 19, 2025

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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Abstract

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An infrared transmissivity measurement method is for measuring an infrared transmissivity of a quartz glass crucible which includes a transparent layer made of quartz glass that does not contain bubbles, a bubble layer formed outside the transparent layer and made of quartz glass containing bubbles, and a semi-molten layer formed outside the bubble layer and made of raw material silica powder solidified in a semi-molten state. The infrared transmissivity measurement method includes processing an outer surface of the quartz glass crucible formed by the semi-molten layer to lower a surface roughness of the outer surface; and measuring an infrared transmissivity of the quartz glass crucible based on infrared light passing through the outer surface after processing the outer surface.

First claim

Opening claim text (preview).

The invention claimed is: 1. An infrared transmissivity measurement method of a quartz glass crucible, in which the quartz glass crucible includes a transparent layer made of quartz glass that does not contain bubbles, a bubble layer formed outside the transparent layer and made of quartz glass containing bubbles, and a semi-molten layer formed outside the bubble layer and made of raw material silica powder solidified in a semi-molten state, the infrared transmissivity measurement method comprising: a step of processing an outer surface of the quartz glass crucible formed by the semi-molten layer to remove a part of the semi-molten layer to form at least one recess in the semi-molten layer as a semi-molten layer removed portion such that a surface roughness of the semi-molten layer removed portion is lower than a surface roughness of the outer surface, wherein the semi-molten layer removed portion is surrounded by the semi-molten layer; and a step of measuring an infrared transmissivity of the quartz glass crucible based on infrared light passing through the semi-molten layer removed portion. 2. The infrared transmissivity measurement method of a quartz glass crucible according to claim 1 , wherein, in the step of processing the outer surface, the outer surface is processed so that an arithmetic average roughness Ra of the outer surface becomes 15 μm or less. 3. The infrared transmissivity measurement method of a quartz glass crucible according to claim 1 , wherein the infrared transmissivity is measured using a crucible piece cut out from the quartz glass crucible. 4. The infrared transmissivity measurement method of a quartz glass crucible according to claim 1 , wherein the step of processing the outer surface is a polishing treatment or a blasting treatment. 5. The infrared transmissivity measurement method of a quartz glass crucible according to claim 1 , wherein the quartz glass crucible has a cylindrical side wall portion, a bottom portion, and a corner portion connecting the side wall portion and the bottom portion to each other, and wherein the semi-molten layer removed portion is constituted by a first semi-molten layer removed portion provided in the side wall portion, a second semi-molten layer removed portion provided in the corner portion, and a third semi-molten layer removed portion provided in the bottom portion.

Assignees

Inventors

Classifications

  • Glass · CPC title

  • for analysing solids; Preparation of samples therefor · CPC title

  • Crucibles · CPC title

  • Silicon · CPC title

  • Surface treatment of glass, not in the form of fibres or filaments, by mechanical means (sand-blasting, grinding, or polishing glass B24) · CPC title

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What does patent US12392050B2 cover?
An infrared transmissivity measurement method is for measuring an infrared transmissivity of a quartz glass crucible which includes a transparent layer made of quartz glass that does not contain bubbles, a bubble layer formed outside the transparent layer and made of quartz glass containing bubbles, and a semi-molten layer formed outside the bubble layer and made of raw material silica powder s…
Who is the assignee on this patent?
Sumco Corp
What technology area does this patent fall under?
Primary CPC classification C03B19/095. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Aug 19 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).