Sparkle contrast correcting method, comparing method, comparing apparatus, electronic display manufacturing method, and anti-glare layer manufacturing method

Patent metadata

Field	Value
Publication number	US-12379322-B2
Application number	US-202018247570-A
Country	US
Kind code	B2
Filing date	Nov 24, 2020
Priority date	Oct 2, 2020
Publication date	Aug 5, 2025
Grant date	Aug 5, 2025

Abstract

A sparkle contrast correcting method includes a step of acquiring a first sparkle contrast that is caused by an anti-glare layer that is disposed on a surface of an electronic display and information that represents a first measurement condition, the first sparkle contrast being used as a comparison standard and being measured in the first measurement condition by using a first imaging lens that images emitted light from the anti-glare layer and a first two-dimensional image sensor on which the emitted light is imaged, a step of acquiring a second sparkle contrast that is caused by the anti-glare layer and information that represents a second measurement condition, the second sparkle contrast being used as a comparison target and being measured in the second measurement condition that differs from the first measurement condition by using a second imaging lens that images emitted light from the anti-glare layer and a second two-dimensional image sensor on which the emitted light is imaged, and a step of correcting the second sparkle contrast, based on a ratio between the first measurement condition and the second measurement condition for comparison with the first sparkle contrast.

First claim

The invention claimed is:

1. A sparkle contrast correcting method comprising: a step of acquiring a first sparkle contrast that is caused by an anti-glare layer that is disposed on a surface of an electronic display and information that represents a first measurement condition, the first sparkle contrast being used as a comparison standard and being measured in the first measurement condition by using a first imaging lens that images emitted light from the anti-glare layer and a first two-dimensional image sensor on which the emitted light is imaged;
a step of acquiring a second sparkle contrast that is caused by the anti-glare layer and information that represents a second measurement condition, the second sparkle contrast being used as a comparison target and being measured in the second measurement condition that differs from the first measurement condition by using a second imaging lens that images emitted light from the anti-glare layer and a second two-dimensional image sensor on which the emitted light is imaged; and
a step of correcting the second sparkle contrast, based on a ratio between the first measurement condition and the second measurement condition for comparison with the first sparkle contrast.

2. The sparkle contrast correcting method according to claim 1 , wherein the step of correcting the second sparkle contrast is performed in accordance with a numerical formula (1) expressed as:
S P 2 a=S P 2×( F 2/ F 1)×( d 2/ d 1)×( f 1/ f 2)×( M 2/ M 1) 0.5 ,  (1)

where S P 2a is the second sparkle contrast that is corrected,
S P 2 is the second sparkle contrast that is not corrected,
F1 is an image effective F-number of the first imaging lens, included in the first measurement condition,
F2 is an image effective F-number of the second imaging lens, included in the second measurement condition,
d1 is a distance from the anti-glare layer to the first imaging lens, included in the first measurement condition,
d2 is a distance from the anti-glare layer to the second imaging lens, included in the second measurement condition,
f1 is an effective focal length of the first imaging lens, included in the first measurement condition,
f2 is an effective focal length of the second imaging lens, included in the second measurement condition,
M1 is a value that is calculated by using a numerical formula (2), and
M2 is a value that is calculated by using a numerical formula (3), the numerical formula (2) being expressed as:

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Ac
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where Ac1 is a parameter expressed as (((4/π)×F1×λ)/2) 2 ×π, where λ is a wavelength of the emitted light,
Am1 is a parameter expressed as p1 2 , where p1 is a pixel pitch of the first two-dimensional image sensor, included in the first measurement condition, and
erf is a standard error function, the numerical formula (3) being expressed as:

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Assignees

• Dainippon Printing Co Ltd

Inventors

• Kurashige Makio
• Furui Gen
• Ishida Kazutoshi
• Suzuki Hiroko
• Tsunekawa Masayuki
• Iwata Yukimitsu
• Nakamura Norinaga
• NISHIO Shumpei

Classifications

• G01N2021/9513

  Liquid crystal panels · CPC title

• G01N2021/8427

  Coatings · CPC title

• G02B5/0221

  the surface having an irregular structure (G02B5/0226 takes precedence) · CPC title

• G01N21/8422 Primary

  Investigating thin films, e.g. matrix isolation method · CPC title

• G01M11/02 Primary

  Testing optical properties · CPC title