Flitch tracking

US12370713B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12370713-B2
Application numberUS-202418588618-A
CountryUS
Kind codeB2
Filing dateFeb 27, 2024
Priority dateFeb 27, 2017
Publication dateJul 29, 2025
Grant dateJul 29, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

In various embodiments, a scanner optimizer system may generate a virtual model of a predicted flitch based on a 3D model of a log/cant and a cut solution for the log/cant. The scanner optimizer system may compare a virtual model of an actual flitch to virtual models of predicted flitches by comparing data points at a fixed elevation relative to one or both faces of the models. Based on the comparisons, the scanner optimizer system may identify the source log from which the actual flitch was cut. In addition, the scanner optimizer system may identify the saw used to cut the actual flitch, and/or other relevant information, and use the additional information to monitor and adjust the saws and other equipment. Embodiments of corresponding apparatuses and methods are also described.

First claim

Opening claim text (preview).

What is claimed is: 1. A system for identifying a primary workpiece as a source of a flitch, wherein the primary workpiece is a log or a cant, the system comprising: a plurality of first geometric sensors collectively operable to measure a geometric profile of the primary workpiece as the primary workpiece is transported along a first path of flow; a plurality of second geometric sensors collectively operable to measure a geometric profile of an actual flitch that has been cut from the primary workpiece; and a computer system programmed with instructions operable, upon execution by one or more processors of the computer system, to cause the computer system to: receive or generate a 2D model of a predicted flitch to be cut from the primary workpiece, wherein the 2D model of the predicted flitch represents an outer contour of the predicted flitch at a first elevation relative to a first face of the predicted flitch, receive or generate a 2D model of an actual flitch that has been cut from the primary workpiece, wherein the 2D model of the actual flitch represents an outer contour of the actual flitch at the first elevation relative to a first face of the actual flitch, compare the 2D model of the actual flitch to the 2D model of the predicted flitch, and based on the comparison, identify the primary workpiece as the source of the actual flitch. 2. The system of claim 1 , wherein the first geometric sensors and the second geometric sensors are configured to obtain surface measurement data, filter the surface measurement data, and convert the surface measurement data to dimension coordinates. 3. The system of claim 2 , wherein the first geometric sensors and the second geometric sensors are laser profile sensors. 4. The system of claim 1 , wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to identify, based at least on the geometric profile of the primary workpiece and a cut solution for the primary workpiece, a group of first data points that represents said outer contour of the predicted flitch, wherein the cut solution defines the first face of the predicted flitch. 5. The system of claim 4 , wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to: identify, based at least on the geometric profile of the actual flitch, a group of second data points that represents said outer contour of the actual flitch; and compare the 2D model of the actual flitch to the 2D model of the predicted flitch by comparing at least some of the first data points to corresponding ones of the second data points. 6. The system of claim 4 , wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to: receive or generate a 3D model of the actual flitch based on the geometric profile of the actual flitch; identify, based at least on the 3D model of the actual flitch, a plurality of second data points that represents said outer contour of the actual flitch; and compare the 2D model of the actual flitch to the 2D model of the predicted flitch by comparing the first data points to corresponding ones of the second data points. 7. The system of claim 1 , wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to: receive or generate a 3D model of the primary workpiece based on the geometric profile of the primary workpiece; and identify, based on the 3D model of the primary workpiece and a cut solution for the primary workpiece, a group of first data points that represents said outer contour of the predicted flitch, wherein the cut solution defines the first face of the predicted flitch. 8. The system of claim 7 , wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to: identify, based at least on the geometric profile of the actual flitch, a plurality of second data points that represents said outer contour of the actual flitch; and compare the 2D model of the actual flitch to the 2D model of the predicted flitch by comparing the first data points to corresponding ones of the second data points. 9. The system of claim 7 , wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to: receive or generate a 3D model of the actual flitch based on the geometric profile of the actual flitch; identify, based at least on the 3D model of the actual flitch, a plurality of second data points that represents said outer contour of the actual flitch; and compare the 2D model of the actual flitch to the 2D model of the predicted flitch by comparing the first data points to corresponding ones of the second data points. 10. The system of claim 1 , further including one or more additional sensors, wherein the first geometric sensors are positioned to form a first scan zone along the first path of flow upstream of a first machine center, and the first machine center is configured to cut or chip the primary workpiece to thereby form a secondary workpiece with flat faces along opposite sides thereof, wherein the one or more additional sensors is positioned to form a second scan zone along said first path of flow downstream of the first machine center and operable to obtain measurements of at least the flat faces, and wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to: determine a difference between the secondary workpiece and a predicted secondary workpiece based at least on a cut solution for the primary workpiece and the measurements obtained by the one or more third sensors; and adjust the 2D model of the predicted flitch based on said difference before comparing the 2D model of the actual flitch to the 2D model of the predicted flitch. 11. The system of claim 1 , wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to: determine a difference between the actual flitch and the predicted flitch; determine an adjustment to a saw, a chip head, or a transport system based at least on the difference; and cause a controller to implement the adjustment or cause a display to display the adjustment. 12. The system of claim 11 , wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to: match additional actual flitches to additional predicted flitches by comparing 2D models of the additional actual flitches to 2D models of the additional predicted flitches; determine additional differences between the additional actual flitches the corresponding additional predicted flitches; and determine the adjustment to the saw, the chip head, or the transport system based at least on the additional differences. 13. The system of claim 1 , wherein a plurality of cutting members are arranged across the first path of flow, the cutting members define a plurality of zones, and each one of said zones is associated with a respective pair of the cutting members, and wherein the instructions are further operable, upon execution by the one or more processors, to cause the computer system to: associate the actual flitch with a corresponding one of the zones; and based on the association, identify the pair of cutting members used to cut the actual flitch from the primary workpiece. 14. The system of claim 1 , wherein the first elevation does not coincide with the first face

Assignees

Inventors

Classifications

  • Geometric CAD · CPC title

  • Adjusting equipment, e.g. using optical projection {(see also B27L5/022)} · CPC title

  • characterised by using design data to control NC machines, e.g. CAD/CAM (G05B19/4093 takes precedence) · CPC title

  • 3-D cad-cam · CPC title

  • Management or planning · CPC title

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Frequently asked questions

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What does patent US12370713B2 cover?
In various embodiments, a scanner optimizer system may generate a virtual model of a predicted flitch based on a 3D model of a log/cant and a cut solution for the log/cant. The scanner optimizer system may compare a virtual model of an actual flitch to virtual models of predicted flitches by comparing data points at a fixed elevation relative to one or both faces of the models. Based on the com…
Who is the assignee on this patent?
Usnr Llc
What technology area does this patent fall under?
Primary CPC classification B27B1/007. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jul 29 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).