Measurement application device calibration unit, measurement system, method

Patent metadata

Field	Value
Publication number	US-12355498-B2
Application number	US-202217815757-A
Country	US
Kind code	B2
Filing date	Jul 28, 2022
Priority date	Jul 28, 2022
Publication date	Jul 8, 2025
Grant date	Jul 8, 2025

Abstract

The present disclosure provides a measurement application device calibration unit, comprising a coupling element comprising a first connection and a second connection for coupling the coupling element into a signal measurement path, and a third connection, wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path, and comprising a signal processing device that is coupled to the third connection of the coupling element and that is configured to receive the predetermined calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection, and to generate a predetermined calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path.

First claim

What is claimed is:

1. A measurement application device calibration unit, comprising:
at least one coupling element comprising:
a first connection and a second connection for coupling the coupling element into a signal measurement path that is coupled to a measurement application device; and
a third connection;

wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path; and
a signal processing device that is coupled to the third connection of the coupling element and that is configured:
to receive a predetermined calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection; and
to generate the predetermined calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path,

wherein the measurement application device is configured to calibrate the signal measurement path based on:
the calibration signal measured by the measurement application device calibration unit, or
the calibration signal as coupled into the signal measurement path and measured by the measurement application device;
wherein when calibrating the measurement application device is configured to determine a mismatch between a first impedance and a second impedance;
wherein the first impedance comprises an impedance from a reference plane towards a device under test, and wherein the second impedance comprises an impedance from the reference plane towards the measurement application device.

2. The measurement application device calibration unit of claim 1 , wherein the signal processing device comprises:
a reference receiver when the coupling element couples out a signal from the signal measurement path into the third connection; and
a reference signal generator when the coupling element couples in a signal from the third connection into the signal measurement path.

3. A measurement system, comprising:
a measurement application device;
a signal measurement path from the measurement application device to a reference plane; and
a measurement application device calibration unit configured to at least one of couple out a predetermined calibration signal from the signal measurement path and measure the predetermined calibration signal, and generate a predetermined calibration signal and couple in the predetermined calibration signal into the signal measurement path;
wherein the measurement application device is configured to calibrate the signal measurement path based on:
the calibration signal measured by the measurement application device calibration unit, or
the calibration signal as coupled into the signal measurement path and measured by the measurement application device;
wherein when calibrating the measurement application device is configured to determine a mismatch between a first impedance and a second impedance;
wherein the first impedance comprises an impedance from the reference plane towards a device under test, and wherein the second impedance comprises an impedance from the reference plane towards the measurement application device.

4. The measurement system according to claim 3 , wherein the measurement application device calibration unit comprises:
a coupling element comprising:
a first connection and a second connection for coupling the coupling element into the signal measurement path; and
a third connection;
wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path; and
a signal processing device that is coupled to the third connection of the coupling element and that is configured:
to receive the calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection; and
to generate a calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path.

5. The measurement system according to claim 3 , wherein the measurement application device comprises:
a measurement signal generator that is coupled to the signal measurement path when the measurement application device calibration unit couples out the predetermined calibration signal from the signal measurement path; and
a measurement signal receiver that is coupled to the signal measurement path when the measurement application device calibration unit couples in the predetermined calibration signal into the signal measurement path.

6. The measurement system according to claim 3 , comprising three different calibration standards;
wherein the measurement application device is configured to determine S-parameters of an error network of the signal measurement path while the three different calibration standards are consecutively coupled to the signal measurement path at the reference plane.

7. The measurement system according to claim 6 , wherein the measurement application device is configured to set one of the S-parameters to 1.

8. The measurement system according to claim 6 , wherein the three different calibration standards comprise an open calibration standard, and a short calibration standard, and a matched calibration standard.

9. The measurement system according to claim 3 , comprising an active calibration standard that is couplable to the reference plane and that is configured to generate a predetermined known calibration signal and input the known calibration signal into the signal path at the reference plane;
wherein the measurement application device is configured to determine a transmission parameter for the signal path from the reference plane to the measurement application device calibration unit based on the known calibration signal and stored information about the known calibration signal; and
wherein the measurement application device is configured to take into account the transmission parameter when calibrating the signal measurement path.

10. The measurement system according to claim 3 , comprising an active calibration standard that is couplable to the reference plane and that is configured to receive a predetermined known calibration signal;
wherein the measurement application device is configured to determine a transmission parameter for the signal path from the measurement application device calibration unit to the reference plane based on the known calibration signal as received by the active calibration standard and stored information about the active calibration standard; and
wherein the measurement application device is configured to take into account the transmission parameter when calibrating the signal measurement path.

11. The measurement system according to claim 3 , comprising:
a first measurement application device calibration unit configured to couple out a predetermined calibration signal from the signal measurement path and measure the predetermined calibration signal;
a first measurement application device configured to calibrate the signal measurement path based on the calibration signal measured by the measurement application device calibration unit;
a second measurement application device calibration unit configured to generate a predetermined calibration signal and couple in the predetermined calibration signal into a second signal measurement path; and
a second measurement application device configured to calibrate the second signal measurement path based on the calibration signal as coupled into the signal measurement

Assignees

• Rohde & Schwarz

Inventors

• Ramian Florian
• Gerbl Florian
• Mueller-Remer Daniel

Classifications

• H04B17/0085

  using test signal generators · CPC title

• G01R31/2824

  testing of oscillators or resonators · CPC title

• G01D18/00

  Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 · CPC title

• H04B17/11 Primary

  for calibration · CPC title

• G01R35/00 Primary

  Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title