Electronic devices having antennas with symmetric feeding
US-11088452-B2 · Aug 10, 2021 · US
US12355157B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12355157-B2 |
| Application number | US-202418597231-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 6, 2024 |
| Priority date | Oct 22, 2021 |
| Publication date | Jul 8, 2025 |
| Grant date | Jul 8, 2025 |
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Example embodiments relate to a substrate integrated waveguide (SIW) with dual circular polarizations. An example SIW may include a dielectric substrate and a first metallic layer coupled to a top surface of the dielectric substrate with a through-hole extending through the dielectric substrate and the first metallic layer. The SIW also includes a dielectric layer coupled to a top surface of the first metallic layer. A second metallic layer is coupled to a top surface of the dielectric layer. The second metallic layer includes a non-conductive opening, a plurality of feeds with a first end in the non-conductive opening and a second end including a single-ended termination, and an impedance transformer. The SIW also includes a third metallic layer coupled to a bottom of the dielectric substrate, and a set of metallic via-holes proximate the non-conductive opening and coupling the second metallic layer to the third metallic layer.
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What is claimed is: 1. An apparatus comprising: at least two metallic layers, wherein one of the at least two metallic layers comprises: an opening, and a plurality of feeds, wherein a first end of each feed is located in the opening and a second end of each feed is a termination; a dielectric substrate disposed between the at least two metallic layers, wherein a through-hole extends through the dielectric substrate, and wherein the opening is disposed over the through-hole and in the same position as the through-hole; and a set of metallic via-holes positioned around the opening and proximate the through-hole, wherein the set of metallic via-holes electrically couple the at least two metallic layers. 2. The apparatus of claim 1 , further comprising a third metallic layer, wherein the third metallic layer is a middle metallic layer disposed between the dielectric substrate and one of the metallic layers. 3. The apparatus of claim 2 , wherein the through-hole extends through the middle metallic layer. 4. The apparatus of claim 2 , further comprising a dielectric layer disposed between the middle metallic layer and one of the metallic layers. 5. The apparatus of claim 4 , wherein the dielectric layer extends across the through-hole. 6. The apparatus of claim 4 , wherein the set of metallic via-holes extend between the at least two metallic layers, through the dielectric layer, through the middle metallic layer, and through the dielectric substrate. 7. The apparatus of claim 1 , wherein the opening is a non-conductive opening. 8. The apparatus of claim 1 , wherein the termination is a single-ended termination. 9. A system comprising: a waveguide; a substrate integrated waveguide (SIW) transition coupled to the waveguide, wherein the SIW transition comprises: at least two metallic layers, wherein one of the at least two metallic layers comprises: an opening, and a plurality of feeds, wherein a first end of each feed is located in the opening and a second end of each feed is a termination; a dielectric substrate disposed between the at least two metallic layers, wherein a through-hole extends through the dielectric substrate, and wherein the opening is disposed over the through-hole and in the same position as the through-hole; and a set of metallic via-holes positioned around the opening and proximate the through-hole, wherein the set of metallic via-holes electrically couple the at least two metallic layers. 10. The system of claim 9 , further comprising a third metallic layer, wherein the third metallic layer is a middle metallic layer disposed between the dielectric substrate and one of the metallic layers. 11. The system of claim 10 , wherein the through-hole extends through the middle metallic layer. 12. The system of claim 10 , further comprising a dielectric layer disposed between the middle metallic layer and one of the metallic layers. 13. The system of claim 12 , wherein the dielectric layer extends across the through-hole. 14. The system of claim 12 , wherein the set of metallic via-holes extend between the at least two metallic layers, through the dielectric layer, through the middle metallic layer, and through the dielectric substrate. 15. The system of claim 9 , wherein the opening is a non-conductive opening. 16. The system of claim 9 , wherein the termination is a single-ended termination. 17. A method comprising: generating at least two metallic layers; generating an opening and a plurality of feeds on one of the metallic layers, wherein a first end of each feed is located in the opening and a second end of each feed is a termination; layering a dielectric substrate between the at least two metallic layers, wherein a through-hole extends through the dielectric substrate, and wherein the opening is disposed over the through-hole and in the same position as the through-hole; and forming a set of metallic via-holes positioned around the opening and proximate the through-hole, wherein the set of metallic via-holes electrically couple the at least two metallic layers. 18. The method of claim 17 , wherein the metallic layer that includes the opening and the plurality of feeds is covered with a PCB laminate, and wherein generating the opening and the plurality of feeds on one of the metallic layers comprises etching through the PCB laminate to the metallic layer. 19. The apparatus of claim 1 , wherein the opening is a circular shape, and wherein the set of metallic via-holes encircle the opening. 20. The apparatus of claim 19 , wherein the metallic via-holes extend through the dielectric substrate and encircle the through-hole.
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