Microscope device, spectroscope, and microscope system

Patent metadata

Field	Value
Publication number	US-12352945-B2
Application number	US-202017756226-A
Country	US
Kind code	B2
Filing date	Nov 20, 2020
Priority date	Nov 29, 2019
Publication date	Jul 8, 2025
Grant date	Jul 8, 2025

Abstract

A microscope device includes an opening ( 31 ) that includes a first slit and a second slit through which a plurality of pieces of light from an observation target resulting from a plurality of pieces of irradiation light emitted to the observation target and having different wavelengths pass, a dispersion element that wavelength-disperses the plurality of pieces of light passing through the opening ( 31 ), and an imaging element ( 32 ) that receives the plurality of pieces of light wavelength-dispersed by the dispersion element. The imaging element ( 32 ) performs light reception so that, as for the plurality of pieces of light wavelength-dispersed, zeroth-order light of light passing through the second slit and first-order light of light passing through the first slit do not overlap with each other.

First claim

The invention claimed is:

1. A microscope device comprising:
an opening that includes a first slit and a second slit through which a plurality of pieces of light from an observation target resulting from a plurality of pieces of irradiation light emitted to the observation target and having different wavelengths pass;
a dispersion element that wavelength-disperses the plurality of pieces of light passing through the opening; and
an imaging element that receives the plurality of pieces of light wavelength-dispersed by the dispersion element,
wherein the imaging element performs light reception so that, as for the plurality of pieces of light wavelength-dispersed, zeroth-order light of light passing through the second slit and first-order light of light passing through the first slit do not overlap with each other.

2. The microscope device according to claim 1 , further comprising an irradiation unit that irradiates the observation target with the plurality of pieces of irradiation light having different wavelengths.

3. The microscope device according to claim 2 , wherein the irradiation unit emits excitation light serving as a plurality of pieces of the irradiation light having different wavelengths in a line form.

4. The microscope device according to claim 1 , further comprising a correction unit that processes imaging data received from the imaging element.

5. The microscope device according to claim 4 , wherein, as for light information respectively obtained from the plurality of pieces of light wavelength-dispersed, the correction unit corrects light information obtained from the light passing through the first slit on a basis of light information obtained from the light passing through the second slit.

6. The microscope device according to claim 4 , further comprising
a scanning mechanism that changes a position of the observation target irradiated with the irradiation light over time,
wherein, by driving the scanning mechanism, the imaging element continuously images the plurality of pieces of light wavelength-dispersed in a scanning direction over time, and the correction unit processes the imaging data received from the imaging element to acquire two-dimensional data or three-dimensional data of the observation target.

7. The microscope device according to claim 1 , wherein the imaging element performs light reception so that the zeroth-order light of the light passing through the second slit is located between zeroth-order light and the first-order light of the light passing through the first slit.

8. The microscope device according to claim 1 , wherein the imaging element performs light reception so that the zeroth-order light of the light passing through the second slit is located further on a second-order light side than the first-order light of the light passing through the first slit.

9. The microscope device according to claim 1 , further comprising an optical filter that allows only light in a predetermined wavelength range out of the plurality of pieces of light from the observation target pass through.

10. The microscope device according to claim 1 , wherein a wavelength band of the first-order light of at least one of the plurality of pieces of light wavelength-dispersed includes a part or all of 400 to 800 nm.

11. The microscope device according to claim 1 , wherein the dispersion element is a diffraction grating that causes wavelength dispersion due to coherence of light.

12. The microscope device according to claim 11 , wherein the diffraction grating is a blazed diffraction grating in which a cross-sectional shape of a groove is a sawtooth shape.

13. The microscope device according to claim 1 , wherein the imaging element receives a plurality of pieces of fluorescence obtained by irradiating the observation target with excitation light serving as a plurality of pieces of the irradiation light having different wavelengths.

14. The microscope device according to claim 1 , wherein a slit distance of the opening is equal to or less than a field of view of imaging data provided by the imaging element defined by an objective lens and an image forming lens.

15. A microscope system comprising: the microscope device according to claim 1 ; and a program used for processing imaging data imaged by the microscope device,
wherein the program is a program for causing an information processing device to execute correction processing for processing the imaging data.

16. A spectroscope in a microscope device, comprising:
an opening that includes a first slit and a second slit through which a plurality of pieces of light from an observation target resulting from a plurality of pieces of irradiation light emitted to the observation target and having different wavelengths pass;
a dispersion element that wavelength-disperses the plurality of pieces of light passing through the opening; and
an imaging element that receives the plurality of pieces of light wavelength-dispersed by the dispersion element,
wherein the imaging element performs light reception so that, as for the plurality of pieces of light wavelength-dispersed, zeroth-order light of light passing through the second slit and first-order light of light passing through the first slit do not overlap with each other.

Assignees

• Sony Group Corp

Inventors

• Kuwayama Tetsuro
• Tatsuta Hirokazu
• Hashimoto Gakuji

Classifications

• G01J2003/045

  Sequential slits; Multiple slits · CPC title

• G01J3/2823

  Imaging spectrometer · CPC title

• G01J3/18

  using diffraction elements, e.g. grating (gratings per se G02B) · CPC title

• G01J3/04 Primary

  Slit arrangements {slit adjustment} · CPC title

• G01J3/0208

  using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction · CPC title