Semiconductor device and semiconductor device package
US-2019341536-A1 · Nov 7, 2019 · US
US12349473B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12349473-B2 |
| Application number | US-202117759040-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 15, 2021 |
| Priority date | Jan 20, 2020 |
| Publication date | Jul 1, 2025 |
| Grant date | Jul 1, 2025 |
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Provided is an ultraviolet light receiving device having photosensitivity effective to target wavelengths in the ultraviolet region. A Schottky junction ultraviolet light receiving device has the photosensitivity peak wavelength in an ultraviolet region of 230 nm or more and 320 nm or less, and exhibits a rejection ratio of 10 5 or more, the rejection ratio being the ratio of the responsivity Rp to the peak photosensitivity wavelength to the average of the responsivity Rv to a visible region of 400 nm or more and 680 nm or less (Rp/Rv).
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The invention claimed is: 1. A Schottky ultraviolet light receiving device configured to have a peak photosensitivity wavelength in an ultraviolet region of 230 nm or more and 320 nm or less, wherein a rejection ratio that is a ratio of a responsivity Rp to the peak photosensitivity wavelength to an average of responsivity Rv to a visible region of 400 nm or more and 680 nm or less (Rp/Rv) is 10 5 or more, the Schottky ultraviolet light receiving device comprises an AlN layer on a sapphire substrate and an AlGaN laminate made up of a plurality of AlGaN layers having different Al composition ratios on the AlN layer, wherein the AlGaN laminate has an Al w Ga 1-w N buffer layer (0.5≤w≤0.95) and an Al z Ga 1-z N light receiving layer in this order from the AlN layer side; the values of the Al composition ratios satisfy a relationship of z<w; the AlGaN laminate has an n-type Al x Ga 1-x N current spreading layer and an n-type Al y Ga 1-y N ohmic contact layer in this order from the AlN layer side between the Al w Ga 1-w N buffer layer and the Al z Ga 1-z N light receiving layer; the values of the Al composition ratios satisfy a relationship of z≤y<x≤w; illumination light for measuring the responsivity enters through the sapphire substrate; and a half width of a photosensitivity spectrum of the ultraviolet light receiving device is 40 nm or less. 2. The ultraviolet light receiving device according to claim 1 , wherein the Al z Ga 1-2 N light receiving layer has an etched portion where the n-type Al y Ga 1-y N ohmic contact layer is exposed, an n-type ohmic electrode is provided on the exposed n-type Al y Ga 1-y N ohmic contact layer, and a Schottky electrode is placed on the Al z Ga 1-z N light receiving layer.
having three or more elements, e.g. GaAlAs, InGaAs or InGaAsP · CPC title
for devices having potential barriers · CPC title
the potential barrier being a Schottky barrier · CPC title
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