Dielectric reproducing device and dielectric recording and reproducing device

Patent metadata

Field	Value
Publication number	US-12347473-B2
Application number	US-202318839178-A
Country	US
Kind code	B2
Filing date	Mar 13, 2023
Priority date	Mar 30, 2022
Publication date	Jul 1, 2025
Grant date	Jul 1, 2025

Abstract

A dielectric reproducing device and a dielectric recording and reproducing device that can improve the reproduction speed. A detection means is provided so as to be able to detect a polarization state of each bit 1 a corresponding to the data recorded in a data recording layer by relatively scanning the data recording layer made of a dielectric material. A heating means is provided so as to be able to heat the bit to be detected to a predetermined temperature while the detection means detects the polarization state. A reproducing means is provided so as to be able to reproduce the data based on the polarization state of each bit detected by the detection means.

First claim

The invention claimed is:

1. A dielectric reproducing device for reproducing data recorded on a data recording layer made of a dielectric material,
the data recording layer being capable of recording data based on a polarization state of each bit formed on the dielectric material, the dielectric reproducing device comprising:
a detection means provided to be able to detect a nonlinear dielectric constant due to the polarization state of each bit corresponding to the data by relatively scanning the data recording layer;
a heating means provided to be able to heat the bit to be detected to a predetermined temperature while the detection means detects the nonlinear dielectric constant due to the polarization state; and
a reproducing means provided to be able to reproduce the data based on the nonlinear dielectric constant due to the polarization state of each bit detected by the detection means.

2. The dielectric reproducing device according to claim 1 , wherein the heating means is configured to heat the bit in synchronization with a timing at which the detection means detects the nonlinear dielectric constant due to the polarization state of the bit to be detected.

3. The dielectric reproducing device according to claim 2 , wherein the heating means has an emission means for emitting a laser beam and a lens for focusing the laser beam emitted from the emission means, and is configured to heat the bit to be detected by irradiation with the laser beam focused by the lens.

4. The dielectric reproducing device according to claim 3 , further comprising a light absorbing layer provided on a side of the data recording layer opposite to a side on which the detection means scans relatively, wherein
the data recording layer is transparent to the laser beam.

5. The dielectric reproducing device according to claim 3 , wherein the laser beam has a wavelength shorter than an absorption edge of the dielectric material.

6. The dielectric reproducing device according to claim 2 , wherein
the detection means has a probe provided so as to be capable of relatively scanning the data recording layer, and is configured to detect the polarization state of the bit to be detected when a tip of the probe moves relatively to a position facing the bit, and
the heating means is capable of generating near-field light, is provided near the probe so as to be movable together with the probe, and is configured to be able to heat the bit to be detected by the near-field light.

7. The dielectric reproducing device according to claim 6 , further comprising a light absorbing layer provided on the side of the data recording layer opposite to the side on which the detection means is relatively scanned, wherein
the data recording layer is transparent to the near-field light.

8. The dielectric reproducing device according to claim 6 , wherein the near-field light has a wavelength shorter than an absorption edge of the dielectric material.

9. The dielectric reproducing device according to claim 2 , wherein
the detection means has a metal probe provided so as to be capable of relatively scanning the data recording layer, and is configured to detect the nonlinear dielectric constant due to the polarization state of the bit to be detected when a tip of the probe moves relatively to a position facing the bit, and
the heating means is provided so as to be capable of generating near-field light by irradiating the tip of the probe with a laser beam, and is configured to be able to heat the bit to be detected by the near-field light.

10. The dielectric reproducing device according to claim 2 , wherein the dielectric material is a ferroelectric material.

11. A dielectric recording and reproducing device, comprising:
the dielectric reproducing device according to claim 2 ; and
a recording means configured to record data on the data recording layer, wherein
the dielectric reproducing device is capable of reproducing the data recorded by the recording means.

12. The dielectric reproducing device according to claim 1 , wherein the heating means has an emission means for emitting a laser beam and a lens for focusing the laser beam emitted from the emission means, and is configured to heat the bit to be detected by irradiation with the laser beam focused by the lens.

13. The dielectric reproducing device according to claim 12 , further comprising a light absorbing layer provided on a side of the data recording layer opposite to a side on which the detection means scans relatively, wherein
the data recording layer is transparent to the laser beam.

14. The dielectric reproducing device according to claim 12 , wherein the laser beam has a wavelength shorter than an absorption edge of the dielectric material.

15. The dielectric reproducing device according to claim 1 , wherein
the detection means has a probe provided so as to be capable of relatively scanning the data recording layer, and is configured to detect the polarization state of the bit to be detected when a tip of the probe moves relatively to a position facing the bit, and
the heating means is capable of generating near-field light, is provided near the probe so as to be movable together with the probe, and is configured to be able to heat the bit to be detected by the near-field light.

16. The dielectric reproducing device according to claim 15 , further comprising a light absorbing layer provided on the side of the data recording layer opposite to the side on which the detection means is relatively scanned, wherein
the data recording layer is transparent to the near-field light.

17. The dielectric reproducing device according to claim 15 , wherein the near-field light has a wavelength shorter than an absorption edge of the dielectric material.

18. The dielectric reproducing device according to claim 1 , wherein
the detection means has a metal probe provided so as to be capable of relatively scanning the data recording layer, and is configured to detect the nonlinear dielectric constant due to the polarization state of the bit to be detected when a tip of the probe moves relatively to a position facing the bit, and
the heating means is provided so as to be capable of generating near-field light by irradiating the tip of the probe with a laser beam, and is configured to be able to heat the bit to be detected by the near-field light.

19. The dielectric reproducing device according to claim 1 , wherein the dielectric material is a ferroelectric material.

20. A dielectric recording and reproducing device, comprising:
the dielectric reproducing device according to claim 1 ; and
a recording means configured to record data on the data recording layer, wherein
the dielectric reproducing device is capable of reproducing the data recorded by the recording means.

Assignees

• Univ Tohoku

Inventors

• Cho Yasuo

Classifications

• G11B9/1409

  Heads · CPC title

• G11B11/08

  using recording by electric charge or by variation of electric resistance or capacitance {(G11B11/002, G11B11/10 take precedence)} · CPC title

• G11B2005/0021

  Thermally assisted recording using an auxiliary energy source for heating the recording layer locally to assist the magnetization reversal · CPC title

• G11B9/14

  using microscopic probe means {, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information (marking using electrical current B41M5/20; measuring roughness or irregularity of surfaces G01B7/34; details of scanning-probe microscopes G01Q)} · CPC title

• G11B5/02

  Recording, reproducing, or erasing methods; Read, write or erase circuits therefor · CPC title