Sensor system and method for calibrating a sensor system

Patent metadata

Field	Value
Publication number	US-12345752-B2
Application number	US-202318341295-A
Country	US
Kind code	B2
Filing date	Jun 26, 2023
Priority date	Jun 26, 2023
Publication date	Jul 1, 2025
Grant date	Jul 1, 2025

Abstract

A sensor system for sensing EM radiation and a method for calibrating the system are provided. The system includes a sensing element that receives calibration signals or signal components with different frequencies. Recording device records responses of the sensing element to at least two calibration signals or signal components. A respective response to a calibration signal of the at least two calibration signals or signal components depends on an excitation of one or more of the resonances by the calibration signal. A part of the recorded responses to and/or information derived from at least a part of the recorded responses is stored in a model which correlates the responses to frequencies and/or signal levels of the corresponding calibration signals or signal components. Processor uses the model to convert a response of the sensing element to an EM signal to be analyzed into a frequency spectrum of the EM signal.

First claim

The invention claimed is:

1. A sensor system for sensing electromagnetic, EM, radiation, comprising:
a sensing element having multiple resonances;
wherein the sensing element is arranged to receive a number of calibration signals or signal components with different frequencies;
a recording device configured to record responses of the sensing element to at least two of the number of calibration signals or signal components, wherein the respective responses depend on an excitation of one or more of the resonances by the corresponding calibration signals or signal components;
a data storage configured to store at least a part of the recorded responses and/or information derived from at least a part of the recorded responses in a model which correlates the responses to frequencies and/or signal levels of the corresponding calibration signals or signal components; and
a processor configured to use the model to convert a further response of the sensing element to an EM signal to be analyzed into a frequency spectrum of the EM signal.

2. The system of claim 1 , further comprising:
a magnetic and/or electric field generator configured to generate a temporally and/or spatially varying magnetic and/or electric field in the sensing element;
wherein the magnetic and/or electric field generator is configured to vary the field strength of the electric and/or magnetic field in a determined range during the recording of the respective responses to the at least two calibration signals or signal components.

3. The system of claim 2 ,
wherein the recording device is configured to record the responses of the sensing element to the at least two calibration signals or signal components as a function of the temporally and/or spatially varying electric and/or magnetic field strength.

4. The system of claim 1 , further comprising:
an RF field generator configured to generate an RF field in the sensing element;
wherein a frequency and/or an intensity of the RF field changes over time and/or wherein the RF field has a spatially varying intensity distribution.

5. The system of claim 1 ,
wherein the model comprises at least one matrix or at least one look-up-table which correlate the responses of the sensing element to the frequencies and/or the signal levels of the corresponding calibration signals or signal components.

6. The system of claim 1 ,
wherein the model is a neural network.

7. The system of claim 1 ,
wherein the processor is configured to adapt the model such that the stored response exhibits a linear relation to the signal levels of the calibration signals or signal components.

8. The system of claim 1 ,
wherein, to calculate the frequency spectrum of the EM signal, the processor is configured to linearize the further response of the sensing element and apply the thus linearized further response to the model.

9. The system of claim 1 ,
wherein the sensor system is a quantum sensor system.

10. The system of claim 1 , further comprising:
a signal source configured to transmit the number of calibration signals or signal components towards the sensing element.

11. A method for calibrating a sensor system for sensing electromagnetic, EM, radiation, wherein the sensor system comprises a sensing element having multiple resonances, the method comprising the steps of:
transmitting a number of calibration signals or signal components with different frequencies towards the sensing element;
recording responses of the sensing element to at least two of the number of calibration signals or signal components, wherein the respective responses depend on an excitation of one or more of the resonances by the corresponding calibration signals or signal components; and
storing at least a part of the recorded responses and/or information derived from at least a part of the recorded responses in a model which correlates the responses to frequencies and/or signal levels of the corresponding calibration signals or signal components;
wherein the model enables the sensor system to convert a further response of the sensing element to an EM signal to be analyzed into a frequency spectrum of the EM signal.

12. The method of claim 11 ,
wherein the sensor system comprises a magnetic and/or electric field generator configured to generate a temporally and/or spatially varying magnetic and/or electric field in the sensing element; and wherein the method comprises the further step of:
varying the field strength of the electric and/or a magnetic field in a determined range during the recording of the respective responses to the at least two calibration signals or signal components.

13. The method of claim 12 ,
wherein the responses of the sensing element to the at least two calibration signals or signal components are recorded as a function of the temporally and/or spatially varying electric and/or magnetic field strength.

14. The method of claim 11 ,
wherein the model comprises at least one matrix or at least one look-up-table which correlate the response of the sensing element to the frequencies and/or the signal levels of the corresponding calibration signals or signal components.

15. The method of claim 11 ,
wherein the model is adapted such that the stored response exhibits a linear relation to the signal levels of the calibration signals or signal components.

16. The method of claim 11 ,
wherein, to calculate the frequency spectrum of the EM signal, the further response of the sensing element to the EM signal is linearized and the thus linearized further response is applied to the model.

17. The method of claim 11 ,
wherein the sensor system is a quantum sensor system.

Assignees

• Rohde & Schwarz
• Univ Of Basel

Inventors

• Ruster Thomas
• Shi Yongqi
• Treutlein Philipp
• Ho Melvyn

Classifications

• G01R35/005

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title

• G01R29/0892 Primary

  Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value · CPC title

• G01R23/18

  with provision for recording frequency spectrum · CPC title

• G01R23/16

  Spectrum analysis; Fourier analysis · CPC title

• G01R29/0878 Primary

  Sensors; antennas; probes; detectors (wave guide measuring sections G01R1/24) · CPC title