Removing test equipment intermodulation interference and noise from power spectral density measurements

Patent metadata

Field	Value
Publication number	US-12345748-B2
Application number	US-202318143886-A
Country	US
Kind code	B2
Filing date	May 5, 2023
Priority date	Apr 26, 2023
Publication date	Jul 1, 2025
Grant date	Jul 1, 2025

Abstract

An example method includes following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal and intermodulation interference; (iv) obtaining a power spectral density value, where the power spectral density value comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal, the noise signal, and the intermodulation interference; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.

First claim

What is claimed is:

1. A method comprising the following operations:
(i) receiving a device signal from a device under test (DUT);
(ii) setting an attenuation value;
(iii) applying the attenuation value to attenuate the device signal for input to a frequency spectrum analyzing device, the frequency spectrum analyzing device producing a noise signal and intermodulation interference that are added to the device signal;
(iv) obtaining a power spectral density value, where the power spectral density value comprises a power, at a frequency value, of a combined signal that is based on the device signal, the noise signal, and the intermodulation interference;
(v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values;
(vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and
(vii) obtaining a power spectral density of the device signal having at least some of the intermodulation interference from the frequency spectrum analyzing device removed by performing an optimization process that is based on the multiple power spectral density values.

2. The method of claim 1 , wherein the optimization process produces the power spectral density of the device signal and the following power densities:
a first power spectral density based on the intermodulation interference produced by the frequency spectrum analyzing device;
a second power spectral density based on the noise signal; and
a third power spectral density based on an intermodulation correlation power associated with the device signal and the intermodulation interference of the frequency spectrum analyzing device.

3. The method of claim 2 , wherein the power spectral density of the device signal does not include all or part of each of: the first power spectral density, the second power spectral density, or the third power spectral density.

4. The method of claim 3 , wherein the power spectral density of the device signal comprises an intermodulation component from the DUT.

5. The method of claim 1 , wherein the optimization process comprises the following operations:
(viii) selecting a frequency value among multiple frequency values;
(ix) performing an optimization using ones of the multiple power spectral density values associated with the selected frequency value; and
(x) repeating operations (viii) and (ix) one or more times to obtain values for the power spectral density of the device signal.

6. The method of claim 1 , wherein the attenuation value is set in a digital step attenuator (DSA), the DSA being part of the frequency spectrum analyzing device.

7. The method of claim 1 , wherein the attenuation value is set in a digital step attenuator (DSA), the DSA being external to the frequency spectrum analyzing device.

8. The method of claim 1 , wherein the attenuation value is set in a digital step attenuator (DSA), the DSA being between the frequency spectrum analyzing device and the DUT.

9. The method of claim 1 , wherein operations (i) to (vi) are performed on a test instrument; and
wherein operation (vii) is performed by one or more processing devices.

10. The method of claim 1 , wherein operations (i) to (vii) are performed on a test instrument.

11. The method of claim 1 , wherein each frequency value corresponds to a bin covering a span of multiple frequencies.

12. The method of claim 1 , wherein the DUT comprises network infrastructure equipment and the frequency spectrum analyzing device comprises a vector signal analyzer.

13. A system comprising:
one or more apparatuses comprising a frequency spectrum analyzing device, the one or more apparatuses being configured to perform operations comprising:
(i) receiving a device signal from a device under test (DUT);
(ii) setting an attenuation value;
(iii) applying the attenuation value to the device signal to attenuate the device signal for input to the frequency spectrum analyzing device, the frequency spectrum analyzing device producing a noise signal and intermodulation interference that are added to the device signal;
(iv) obtaining a power spectral density value, where the power spectral density value comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal, the noise signal, and the intermodulation interference;
(v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; and
(vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and

one or more processing devices configured to perform operations comprising:
(vii) obtaining a power spectral density of the device signal having at least some of the intermodulation interference from the frequency spectrum analyzing device removed by performing an optimization process that is based on the multiple power spectral density values.

14. The system of claim 13 , wherein the optimization process produces the power spectral density of the device signal and the following power densities:
a first power spectral density based on the intermodulation interference produced by the frequency spectrum analyzing device;
a second power spectral density based on the noise signal; and
a third power spectral density based on an intermodulation correlation power associated with the device signal and the intermodulation signal of the frequency spectrum analyzing device.

15. The system of claim 14 , wherein the power spectral density of the device signal does not include all or part of each of: the first power spectral density, the second power spectral density, or the third power spectral density.

16. The system of claim 15 , wherein the power spectral density of the device signal comprises an intermodulation component from the DUT.

17. The system of claim 13 , wherein the optimization process comprises the following operations:
(viii) selecting a frequency value among multiple frequency values;
(ix) performing an optimization using ones of the multiple power spectral density values associated with the selected frequency value; and
(x) repeating operations (viii) and (ix) one or more times to obtain values for the power spectral density of the device signal.

18. The system of claim 13 , wherein the attenuation value is set in a digital step attenuator (DSA), the DSA being part of the frequency spectrum analyzing device.

19. The system of claim 13 , wherein the attenuation value is set in a digital step attenuator (DSA), the DSA being external to the frequency spectrum analyzing device.

20. The system of claim 13 , wherein the attenuation value is set in a digital step attenuator (DSA), the DSA being between the frequency spectrum analyzing device and the DUT.

21. The system of claim 13 , further comprising:
a test instrument comprising the one or more apparatuses and the one or more processing devices.

22. The system of claim 13 , further comprising:
a test instrument comprising the one or more apparatuses; and
one or more computing devices comprising the one or more processing devices.

23. The system of claim 13 , wherein each frequency value corresponds to a bin covering a span of multiple frequencies.

24. The system of claim 13 , wherein the DUT comprises network infrastructure equipment and the

Assignees

• Litepoint Corp

Inventors

• Cao Chen
• Olgaard Christian Volf
• Wang Ruizu
• Lu Qingjie

Classifications

• G01R29/26

  Measuring noise figure; Measuring signal-to-noise ratio · CPC title

• G01R27/30

  with provision for recording characteristics, e.g. by plotting Nyquist diagram · CPC title

• G01R23/20

  Measurement of non-linear distortion · CPC title

• G01R23/18 Primary

  with provision for recording frequency spectrum · CPC title

• G01R23/16 Primary

  Spectrum analysis; Fourier analysis · CPC title