Driving belt inspection device and method for wafer transfer module

US12344482B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12344482-B2
Application numberUS-202318377440-A
CountryUS
Kind codeB2
Filing dateOct 6, 2023
Priority dateOct 12, 2022
Publication dateJul 1, 2025
Grant dateJul 1, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A driving belt inspection device and method for a wafer transfer module is disclosed. The driving belt inspection device for a wafer transfer module includes: a data receiving unit for receiving current data of a motor connected to a driving belt; a calculation unit for calculating the rate of change of instantaneous current of the motor according to the received current data and acquiring a calculated value for inspection according to the calculated rate of change of instantaneous current of the motor; and a result determination unit for determining, if the calculated value is lower than a first reference value, that the driving belt is in a normal operation state, and determining, if the calculated value is higher than a second reference value, that the driving belt is in an abnormal operation state.

First claim

Opening claim text (preview).

What is claimed is: 1. A driving belt inspection device for a wafer transfer module, comprising: a data receiving unit for receiving current data of a motor connected to a driving belt; a calculation unit for calculating the rate of change of instantaneous current of the motor according to the received current data and acquiring a calculated value for inspection according to the calculated rate of change of instantaneous current of the motor; and a result determination unit for determining, if the calculated value is lower than a first reference value, that the driving belt is in a normal operation state, and determining, if the calculated value is higher than a second reference value, that the driving belt is in an abnormal operation state. 2. The driving belt inspection device according to claim 1 , wherein the calculated value is a value calculated to be verified through a sequential probability ratio test. 3. The driving belt inspection device according to claim 2 , wherein the calculated value is a value calculated according to the peak value and variance of the rate of change of instantaneous current. 4. The driving belt inspection device according to claim 3 , wherein changes in the peak value and variance of the rate of change of instantaneous current are reflected to acquire the calculated value. 5. The driving belt inspection device according to claim 1 , wherein the result determination unit delays a determination as to whether the driving belt is in the normal or abnormal operation state if the calculated value is between the first reference value and the second reference value. 6. The driving belt inspection device according to claim 5 , wherein if the determination through the result determination unit is delayed, the calculation unit re-acquires the calculated value through the current data and next current data. 7. A driving belt inspection method for a wafer transfer module, comprising the steps of: receiving current data of a motor connected to a driving belt; calculating the rate of change of instantaneous current of the motor according to the received current data and acquiring a calculated value for inspection according to the calculated rate of change of instantaneous current of the motor; and if the calculated value is lower than a first reference value, determining that the driving belt is in a normal operation state, and if the calculated value is higher than a second reference value, determining that the driving belt is in an abnormal operation state. 8. The driving belt inspection method according to claim 7 , wherein the calculated value is a value calculated to be verified through a sequential probability ratio test. 9. The driving belt inspection method according to claim 8 , wherein the calculated value is a value calculated according to the peak value and variance of the rate of change of instantaneous current. 10. The driving belt inspection method according to claim 9 , wherein changes in the peak value and variance of the rate of change of instantaneous current are reflected to acquire the calculated value. 11. The driving belt inspection method according to claim 7 , wherein the determining step delays a determination as to whether the driving belt is in the normal or abnormal operation state if the calculated value is between the first reference value and the second reference value. 12. The driving belt inspection method according to claim 11 , further comprising the step of, if the determination is delayed, re-acquiring the calculated value through the current data and next current data.

Assignees

Inventors

Classifications

  • detecting dangerous physical condition of load carriers, e.g. for interrupting the drive in the event of overheating · CPC title

  • detecting slip between driving element and load-carrier, e.g. for interrupting the drive {(B65G43/02 takes precedence)} · CPC title

  • comprising an articulated arm · CPC title

  • Wafer cassette · CPC title

  • Power-transmitting endless elements, e.g. belts or chains · CPC title

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What does patent US12344482B2 cover?
A driving belt inspection device and method for a wafer transfer module is disclosed. The driving belt inspection device for a wafer transfer module includes: a data receiving unit for receiving current data of a motor connected to a driving belt; a calculation unit for calculating the rate of change of instantaneous current of the motor according to the received current data and acquiring a ca…
Who is the assignee on this patent?
Research & Business Found Sungkyunkwan Univ
What technology area does this patent fall under?
Primary CPC classification B65G43/00. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jul 01 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).