Removing test equipment noise from power spectral density measurements

Patent metadata

Field	Value
Publication number	US-12332299-B2
Application number	US-202318144019-A
Country	US
Kind code	B2
Filing date	May 5, 2023
Priority date	Apr 26, 2023
Publication date	Jun 17, 2025
Grant date	Jun 17, 2025

Abstract

An example method includes the following operations: (i) receiving a device signal from a device under test (DUT); (ii) setting an attenuation value; (iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, where the frequency spectrum analyzing device produces a noise signal; (iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal; (v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; (vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and (vii) obtaining a power spectral density of the device signal.

First claim

What is claimed is:

1. A method comprising the following operations:
(i) receiving a device signal from a device under test (DUT);
(ii) setting an attenuation value;
(iii) applying the attenuation value to the device signal to produce an attenuated device signal for a frequency spectrum analyzing device, the frequency spectrum analyzing device producing a noise signal;
(iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal;
(v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values;
(vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and
(vii) obtaining a power spectral density of the device signal by removing at least some of the noise signal from the combined signal by performing an optimization process that disassembles the combined signal into the power spectral density of the device signal and a power spectral density of the noise signal, the optimization process being based on the multiple power spectral density values.

2. The method of claim 1 , wherein the optimization process results in a power spectral density of the noise signal and a power spectral density of the device signal; and
wherein the power spectral density of the device signal is obtained by subtracting the power spectral density of the noise signal from the multiple power spectral density values.

3. The method of claim 1 , wherein the optimization process comprises the following operations:
(viii) selecting a frequency value among multiple frequency values;
(ix) performing an optimization using one of the multiple power spectral density values associated with the selected frequency value; and
(x) repeating operations (viii) and (ix) one or more times to obtain power spectral density values for the device signal.

4. The method of claim 3 , wherein the optimization process is based on a function to minimize a difference that is based on ones of the multiple power spectral density values and corresponding theoretical power spectral density values for the combined signal.

5. The method of claim 1 , wherein the power spectral density of the device signal is in the frequency domain.

6. The method of claim 1 , wherein the attenuation value is set in a digital step attenuator (DSA), the DSA being part of the frequency spectrum analyzing device.

7. The method of claim 1 , wherein the attenuation value is set in a digital step attenuator (DSA), the DSA being external to the frequency spectrum analyzing device.

8. The method of claim 1 , wherein operations (i) to (vi) are performed on the frequency spectrum analyzing device; and
wherein operation (vii) is performed by one or more processing devices.

9. The method of claim 1 , wherein operations (i) to (vii) are performed on a test instrument.

10. The method of claim 1 , wherein each frequency value corresponds to a bin covering a span of multiple frequencies.

11. The method of claim 1 , wherein the DUT comprises network infrastructure equipment and the frequency spectrum analyzing device comprises a vector signal analyzer.

12. A system comprising:
one or more apparatuses comprising a frequency spectrum analyzing device that produces a noise signal, the one or more apparatuses being configured to perform operations comprising:
(i) receiving a device signal from a device under test (DUT);
(ii) setting an attenuation value;
(iii) applying the attenuation value to the device signal to produce an attenuated device signal for the frequency spectrum analyzing device, the frequency spectrum analyzing device producing a noise signal;
(iv) obtaining a power spectral density value using the frequency spectrum analyzing device, where a power spectral density comprises a power, at a frequency value, of a combined signal that is based on the attenuated device signal and the noise signal;
(v) repeating operations (ii), (iii), and (iv) one or more times to produce multiple power spectral density values; and
(vi) repeating operations (i), (ii), (iii), (iv), and (v) one or more times to add power spectral density values to the multiple power spectral density values; and

one or more processing devices configured to perform operations comprising:
(vii) obtaining a power spectral density of the device signal by removing at least some of the noise signal from the combined signal by performing an optimization process that disassembles the combined signal into the power spectral density of the device signal and a power spectral density of the noise signal, the optimization process being that is based on the multiple power spectral density values.

13. The system of claim 12 , wherein the optimization process results in a power spectral density of the noise signal and a power spectral density of the device signal; and
wherein the power spectral density of the device signal is obtained by subtracting the power spectral density of the noise signal from the multiple power spectral density values.

14. The system of claim 12 , wherein the optimization process comprises the following operations:
(viii) selecting a frequency value among multiple frequency values;
(ix) performing an optimization on ones of the multiple power spectral density values associated with the selected frequency value; and
(x) repeating operations (viii) and (ix) one or more times to obtain power spectral density values for the device signal.

15. The method of claim 14 , wherein the optimization process is based on a function to minimize a difference that is based on ones of the multiple power spectral density values and corresponding theoretical power spectral density values for the combined signal.

16. The system of claim 12 , wherein the power spectral density of the device signal is in the frequency domain.

17. The system of claim 12 , wherein the one or more apparatuses comprise:
a digital step attenuator (DSA) to set the attenuation value; and
the frequency spectrum analyzing device, the DSA being part of the frequency spectrum analyzing device.

18. The system of claim 12 , wherein the one or more apparatuses comprises:
a digital step attenuator (DSA) to set the attenuation value; and
the frequency spectrum analyzing device, the DSA being external to the frequency spectrum analyzing device.

19. The system of claim 12 , wherein the one or more apparatuses comprises:
a digital step attenuator (DSA) to set the attenuation value; and
the frequency spectrum analyzing device, the DSA being between the DUT and the frequency spectrum analyzing device.

20. The system of claim 12 , wherein the one or more processing devices are part of the frequency spectrum analyzing device.

21. The system of claim 12 , further comprising:
a test instrument comprising at least one of the apparatus or the one or more processing devices.

22. The system of claim 12 , wherein each frequency value corresponds to a bin covering a span of multiple frequencies.

23. The system of claim 12 , wherein the DUT comprises network infrastructure equipment and the frequency spectrum analyzing device comprises a vector signal analyzer.

Assignees

• Litepoint Corp

Inventors

• Cao Chen
• Olgaard Christian Volf
• Wang Ruizu
• Lu Qingjie

Classifications

• G01R31/2841

  Signal generators · CPC title

• G01R23/18

  with provision for recording frequency spectrum · CPC title

• G01R31/2837 Primary

  Characterising or performance testing, e.g. of frequency response (transient response G01R27/28) · CPC title

• G01R23/163 Primary

  adapted for measuring in circuits having distributed constants · CPC title

• G01R35/005 Primary

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title