Method, device and system for measuring frequency domain characteristics, and storage medium

US12320830B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12320830-B2
Application numberUS-202318164095-A
CountryUS
Kind codeB2
Filing dateFeb 3, 2023
Priority dateApr 22, 2022
Publication dateJun 3, 2025
Grant dateJun 3, 2025

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  2. Abstract

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  5. First independent claim

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Abstract

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A method for measuring frequency domain characteristics of a PDN having an output terminal connected to a power supply end of a functional circuit. The method includes: a to-be-measured output interface of the functional circuit is acquired; the to-be-measured output interface is controlled to output a first level signal having a first preset rule; remaining at least one output interface of the functional circuit, other than the to-be-measured output interface, is controlled to output a second level signal having a second preset rule according to a first frequency; changing voltage values corresponding to the first frequency and output by the to-be-measured output interface are acquired; and a characteristic impedance of the PDN at the first frequency is determined based on the changing voltage values corresponding to the first frequency.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for measuring frequency domain characteristics of a Power Delivery Network (PDN) having an output terminal connected to a power supply end of a functional circuit, the method comprising: acquiring a to-be-measured output interface of the functional circuit; controlling the to-be-measured output interface to output a first level signal having a first preset rule; controlling remaining at least one output interface of the functional circuit, other than the to-be-measured output interface, to output a second level signal having a second preset rule according to a first frequency; acquiring changing voltage values corresponding to the first frequency and output by the to-be-measured output interface; and determining a characteristic impedance of the PDN at the first frequency based on the changing voltage values corresponding to the first frequency; wherein the first level signal having the first preset rule represents a level signal whose signal value is constant at a first level; and the second level signal having the second preset rule represents a level signal whose signal value has the first level and a second level with a preset duty ratio, wherein the first level is greater than the second level. 2. The method of claim 1 , wherein a voltage corresponding to the first level is substantially identical to a voltage provided by the PDN to the functional circuit. 3. The method of claim 1 , wherein the preset duty ratio is 50%. 4. The method of claim 1 , wherein the preset duty ratio comprises a plurality of duty ratios; wherein acquiring the changing voltage values corresponding to the first frequency and output by the to-be-measured output interface comprises: acquiring a plurality of groups of changing voltage values corresponding to the first frequency and output by the to-be-measured output interface, wherein each of the plurality of groups of changing voltage values corresponds to a respective one of the plurality of duty ratios; and wherein determining the characteristic impedance of the PDN at the first frequency based on the changing voltage values corresponding to the first frequency comprises: determining a plurality of preliminary characteristic impedances of the PDN at the first frequency based on the plurality of groups of changing voltage values corresponding to the first frequency, wherein each preliminary characteristic impedance corresponds to a respective one of the plurality of duty ratios; and determining an average value of the plurality of preliminary characteristic impedances corresponding to the first frequency as the characteristic impedance of the PDN at the first frequency. 5. The method of claim 1 , wherein determining the characteristic impedance of the PDN at the first frequency based on the changing voltage values corresponding to the first frequency comprises: determining a power supply noise value corresponding to the first frequency based on the changing voltage values corresponding to the first frequency; and determining the characteristic impedance of the PDN at the first frequency based on the power supply noise value corresponding to the first frequency. 6. The method of claim 5 , wherein determining the characteristic impedance of the PDN at the first frequency based on the power supply noise value corresponding to the first frequency comprises: acquiring a current value corresponding to the first frequency at the remaining at least one output interface; and determining, a quotient of the power supply noise value corresponding to the first frequency and the current value corresponding to the first frequency, as the characteristic impedance at the first frequency. 7. The method according to claim 1 , wherein the first frequency is a certain frequency within a preset frequency range, and the method further comprises: controlling the remaining at least one output interface to output the second level signal according to each remaining frequency in a set of frequencies other than the first frequency, wherein the set of frequencies comprise a plurality of frequencies within the preset frequency range; acquiring the changing voltage values corresponding to each remaining frequency output by the to-be-measured output interface; and determining the characteristic impedance of the PDN at each remaining frequency based on the changing voltage values corresponding to each remaining frequency. 8. The method of claim 7 , wherein the preset frequency range comprises at least a range from 10 MHz to 1000 MHz. 9. The method of claim 7 , further comprising: determining a frequency domain characteristic curve of the PDN based on the characteristic impedance of the PDN at the first frequency and the characteristic impedance of the PDN at each remaining frequency. 10. The method of claim 9 , further comprising: acquiring a simulated frequency domain characteristic curve of the PDN obtained by modeling and simulating the PDN; and verifying an accuracy of the simulated frequency domain characteristic curve based on the simulated frequency domain characteristic curve and the frequency domain characteristic curve. 11. The method of claim 1 , wherein the PDN at least comprises a Power Management Integrated Circuit (PMIC), Printed Circuit Board (PCB) power planes, package power planes, and a power processing sub-circuit disposed at the power supply end of the functional circuit. 12. A non-transitory computer-readable storage medium having stored thereon computer programs that, when executed by a processor, cause the processor to implement operations of the method for measuring frequency domain characteristics of a Power Delivery Network (PDN) of claim 1 . 13. A device for measuring frequency domain characteristics of a Power Delivery Network (PDN) having an output terminal connected to a power supply end of a functional circuit, the device comprising: a memory storing processor-executable instructions; and a processor configured to execute the stored processor-executable instructions to perform an operation of: acquiring a to-be-measured output interface of the functional circuit; controlling the to-be-measured output interface to output a first level signal having a first preset rule; controlling remaining at least one output interface of the functional circuit, other than the to-be-measured output interface, to output a second level signal having a second preset rule according to a first frequency; acquiring changing voltage values corresponding to the first frequency and output by the to-be-measured output interface; and determining a characteristic impedance of the PDN at the first frequency based on the changing voltage values corresponding to the first frequency; wherein the first level signal having the first preset rule represents a level signal whose signal value is constant at a first level; and the second level signal having the second preset rule represents a level signal whose signal value has the first level and a second level with a preset duty ratio, wherein the first level is greater than the second level. 14. A system for measuring frequency domain characteristics of a Power Delivery Network (PDN), comprising: a chip, a control circuit, a detection circuit, and an analysis circuit, wherein the chip comprises the PDN and a functional circuit, an output terminal of the PDN being connected to a power supply end of the functional circuit, and the PDN being configured to supply power to the functional circuit; the detection circuit is configured to acquire a to-be-measured output interface of the functional circuit; the control circ

Assignees

Inventors

Classifications

  • by converting frequency into an amplitude of current or voltage · CPC title

  • Testing of integrated circuits [IC] (G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801) · CPC title

  • Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] (G01R31/318508 takes precedence; contactless testing G01R31/302; testing contacts or connections G01R31/66) · CPC title

  • computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging · CPC title

  • Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude) · CPC title

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What does patent US12320830B2 cover?
A method for measuring frequency domain characteristics of a PDN having an output terminal connected to a power supply end of a functional circuit. The method includes: a to-be-measured output interface of the functional circuit is acquired; the to-be-measured output interface is controlled to output a first level signal having a first preset rule; remaining at least one output interface of the…
Who is the assignee on this patent?
Changxin Memory Tech Inc
What technology area does this patent fall under?
Primary CPC classification G01R23/005. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 03 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 5 related publications on this page (citations in our corpus or others sharing the same primary CPC).