Compact optical system for improving sample imaging

Patent metadata

Field	Value
Publication number	US-12313836-B2
Application number	US-202017775577-A
Country	US
Kind code	B2
Filing date	Nov 9, 2020
Priority date	Nov 7, 2019
Publication date	May 27, 2025
Grant date	May 27, 2025

Abstract

A microscopy imaging system and methods for improving an assaying of a sample is disclosed.

First claim

We claim:

1. A microscopy imaging system comprising:
a sample card for holding a sample, comprising two plates and spacers of uniform height for sandwiching the sample into a layer having a thickness between the two plates, wherein the spacers are fixed on one of the two plates, and the thickness of the layer is regulated by the two plates and the spacers between the two plates;
a sample card holder for holding the sample card;
a camera module having an image sensor and an internal lens;
an external lens situated between the camera module and the sample card device, where the image sensor, the internal lens, and the external lens are situated on a common optical axis, and
scale calibration marks that are on one or both of the plates, have a predetermined geometry, are visible to an imager, and provide a lateral dimension of the sample;
wherein:
the sample card holder removably holds the sample card;
the distance between the sample card holder and the camera module is fixed; and
at least one of the image sensor, the internal lens, and the external lens is adjustable by a displacement amount “d” from 0 to d max along the common optical axis to form and record a focused microscopic image on the image sensor.

2. The microscopy imaging system of claim 1 , wherein each calibration mark has an actual x dimension of from 1 micrometer to 100 micrometers and an actual y dimension of from 1 micrometer to 100 micrometers.

3. The microscopy imaging system of claim 1 , wherein the displacement amount “d” is from 10 micrometers to 100 millimeters.

4. The microscopy imaging system of claim 1 , wherein the image sensor is selected from CMOS, CCD, a camera, or a combination thereof.

5. The system of claim 1 , wherein a distance between the object plane on the sample and the image plane on the imager is in the range of 5 mm to 25 mm.

6. The system of claim 1 , wherein the internal lens or the external lens can be a single lens or a group of lenses with a fixed distance between each other.

7. The system of claim 1 , wherein the scale calibration marks are 2-dimensional marks and are printed or etched on a surface of one or both of the plates of the sample card.

8. The system of claim 1 , wherein the scale calibration marks are 3-dimensional marks and are fabricated or extruded from a surface of one or both of the plates of the sample card.

9. The system of claim 1 , wherein the displacement of at least one of the image sensor, the internal lens and the external lens results in the change of an imaging magnification factor of the system.

10. The system of claim 1 , wherein the scale calibration marks are arranged in a period array with a period from 5 micron to 5 mm.

11. The system of claim 1 , wherein the scale calibration marks comprise a period array of spacers.

12. The system of claim 1 , wherein the scale calibration marks comprise the spacers.

13. A microscopy imaging system comprising:
a sample card holder;
a sample card comprising two plates for holding a liquid sample or a solid sample in a uniformly thick layer between the two plates, wherein the two plates are separated by a plurality of evenly separated spacers of uniform height that are fixed on one of the plates, and the horizontal in-plane cross-section of the plurality of spacers provide a plurality of calibration marks;
a camera module having an image sensor and an internal lens; and
an external lens situated between the camera module and the sample card device, where the image sensor, the internal lens, and the external lens are situated on a common optical axis,
wherein:
the sample card holder removably holds the sample card; and
the sample holder is moveable along the common optical axis.

14. The system of claim 13 , wherein a distance between the object plane on the sample and the image plane on the imager is in the range of 5 mm to 25 mm.

15. The system of claim 13 , wherein the sample holder is movable along the common optical axis with a displacement in the range of 10 micrometers to 10 centimeters.

16. A method for scaling an image in a microscopy imaging system, comprising:
forming and recording on the image sensor in the microscopy imaging system of claim 1 a focused microscopic image of an area of the sample and the sample card having scale calibration marks;
measuring a virtual size dimension or virtual period dimension of at least one pair of the calibration marks on the focused microscopic image;
dividing an actual period dimension by the virtual period dimension to obtain a scale value wherein the actual period dimension of the scale calibration marks is predetermined in a manufacture of the sample card or known; and
applying the scale value to a virtual object in the focused microscopic image to provide an actual dimension of the virtual object.

17. The method of claim 16 , wherein the scale calibration marks are arranged in a period array with a period from 5 micron to 5 mm.

18. The method of claim 16 , wherein the scale calibration marks comprise a period array of spacers.

19. The method of claim 16 , wherein the scale calibration marks comprise the spacers.

20. A method of determining an optical magnification of a microscopy imaging system, comprising:
forming and recording on the image sensor in the microscopy imaging system of claim 1 a focused microscopic image of an area of the sample card having scale calibration marks;
measuring a virtual size dimension or a virtual period dimension of at least one pair of the scale calibration marks on the focused microscopic image;
dividing an actual period dimension by the virtual period dimension to obtain a magnification factor, wherein the actual period dimension of the scale calibration marks is predetermined in a manufacture of the sample card or known.

Assignees

• Essenlix Corp

Inventors

• Qi Ji
• Chou Stephen Y
• Chou Wu
• Ding Wei

Classifications

• G02B21/26

  Stages; Adjusting means therefor · CPC title

• G02B21/362 Primary

  Mechanical details, e.g. mountings for the camera or image sensor, housings (G02B21/364 takes precedence) · CPC title

• G02B21/16

  adapted for ultraviolet illumination {; Fluorescence microscopes (G02B21/0076 takes precedence)} · CPC title

• G02B21/12

  affording bright-field illumination (G02B21/14 takes precedence) · CPC title

• G02B21/0008 Primary

  Microscopes having a simple construction, e.g. portable microscopes · CPC title