Ion trap system

Patent metadata

Field	Value
Publication number	US-12308135-B2
Application number	US-202117359909-A
Country	US
Kind code	B2
Filing date	Jun 28, 2021
Priority date	Dec 28, 2018
Publication date	May 20, 2025
Grant date	May 20, 2025

Abstract

An ion trap system includes a laser adjustment and control module configured to split a light beam into P first light beams and Q second light beams. N first light beams in the P first light beams are transmitted to N ions, respectively, and tM second light beams in the Q second light beams are transmitted to M monitoring units, respectively. The M monitoring units are configured to monitor the M second light beams, respectively, and obtain spatial information of the M second light beams. The system further includes a feedback control module configured to receive the spatial intensity distribution information of the M second light beams, determine N first control signals based on the spatial information of the M second light beams, and transmit the N first control signals to the laser adjustment and control module.

First claim

What is claimed is:

1. An ion trap system comprising:
a laser adjustment and control module;
an ion trapping module comprises M detectors disposed in a vacuum system; and
a feedback control module;
wherein the laser adjustment and control module is configured to:
split an input light beam from a laser into P first light beams and Q second light beams, transmit N first light beams in the P first light beams to N ions in the ion trapping module respectively, and
transmit M second light beams in the Q second light beams to the M detectors respectively, wherein the N first light beams are in a one-to-one correspondence with the N ions, the M second light beams are in a one-to-one correspondence with the M detectors, each first light beam is used to perform quantum state manipulation on a corresponding ion of the N ions, the M second light beams are used to determine second shift information, the second shift information is used to indicate a degree to which each of the M second light beams shifts from an initialization position;
wherein the M detectors are configured to:
monitor the M second light beams, and
obtain spatial information of the M second light beams, respectively, wherein the spatial information corresponding to the M second light beams is used to indicate a spatial location of each second light beam on a corresponding detector in the M detectors, wherein the spatial information comprises spatial intensity distribution information of the M second light beams indicating a relationship between a light intensity and a spatial location of each of the M second light beams on a corresponding detector;
wherein the feedback control module is configured to
receive the spatial information of the M second light beams;
determine N first control signals based on the spatial information of the M second light beams, and transmit the N first control signals to the laser adjustment and control module, wherein the N first control signals are in a one-to-one correspondence with the N first light beams, and the first control signals control the laser adjustment and control module to align each of the N first light beams with a corresponding ion;
wherein the feedback control module comprises a feedback circuit and a controller; wherein the feedback circuit is configured to receive the spatial intensity distribution information of the M second light beams, determine the second shift information based on the spatial intensity distribution information of the M second light beams to obtain M pieces of second shift information, determine first shift information of the N first light beams based on the M pieces of second shift information, determine a first feedback signal based on the first shift information of the N first light beams to obtain N first feedback signals, and transmit the N first feedback signals to the controller, wherein the first shift information is used to indicate a degree to which each first light beam shifts from an initialization position; and wherein the controller is configured to determine the N first control signals based on the N first feedback signals, and transmit the N first control signals to the laser adjustment and controller.

2. The system according to claim 1 wherein the feedback circuit is further configured to:
determine a second feedback signal based on the second shift information to obtain M second feedback signals, and transmit the M second feedback signals to the controller; and
the controller is further configured to:
determine a second control signal based on the second feedback signal to obtain M second control signals, and transmit the M second control signals to the laser adjustment and control module, wherein the M second control signals are in a one-to-one correspondence with the M second light beams, and the second control signal is used to control the laser adjustment and control module to align each of the M second light beam with a corresponding detector.

3. The system according to claim 2 , wherein the M detectors are configured to:
monitor the M second light beams at a first time point to obtain first spatial intensity distribution information of the M second light beams, and monitoring the M second light beams at a second time point to obtain second spatial intensity distribution information of the M second light beams;
wherein the feedback circuit is configured to:
receive the first spatial intensity distribution information of the M second light beams and the second spatial intensity distribution information of the M second light beams;
determine the second shift information of the M second light beams based on the first spatial intensity distribution information of the M second light beams and the second spatial intensity distribution information of the M second light beams to obtain the M pieces of second shift information; and
determine the first shift information of the N first light beams based on the M pieces of second shift information and a light beam transmission ABCD matrix between the laser adjustment and control module and the ion trapping module to obtain N pieces of first shift information.

4. An ion trap system comprising:
a laser adjustment and control module;
an ion trapping module comprises M detectors disposed in a vacuum system; and
a feedback control module;
wherein the laser adjustment and control module is configured to:
split an input light beam from a laser into P first light beams and Q second light beams, transmit N first light beams in the P first light beams to N ions in the ion trapping module respectively, and transmit M second light beams in the Q second light beams to the M detectors respectively, wherein the N first light beams are in a one-to-one correspondence with the N ions, the M second light beams are in a one-to-one correspondence with the M detectors, each first light beam is used to perform quantum state manipulation on a corresponding ion of the N ions, the M second light beams are used to determine second shift information, the second shift information is used to indicate a degree to which each of the M second light beams shifts from an initialization position;
wherein the M detectors are configured to:
monitor the M second light beams, and obtain spatial information of the M second light beams, respectively, wherein the spatial information corresponding to the M second light beams is used to indicate a spatial location of each M second light beam on a corresponding detector in the M detectors, wherein the spatial information comprises spatial intensity distribution information of the M second light beams indicating a relationship between a light intensity and a spatial location of each of the M second light beams on a corresponding detector;
wherein the feedback control module is configured to:
receive the spatial information of the M second light beams;
determine N first control signals based on the spatial information of the M second light beams, and transmit the N first control signals to the laser adjustment and control module, wherein the N first control signals are in a one-to-one correspondence with the N first light beams, and the first control signals control the laser adjustment and control module to align each of the N first light beams with a corresponding ion;
wherein the feedback control module comprises a feedback circuit and a controller, wherein the feedback circuit is configured to receive the spatial intensity distribution information of the M second light beams, determine the second shift information based on the spatial intensity distribution information of the M second light beams to obtain M pieces of second shift information, and transmit the M pieces of second shift information to the controller; and
wherein the controller is configured to determine first shift information of the N first light b

Assignees

• Huawei Tech Co Ltd

Inventors

• Shen Yangchao
• Li Zhengyu
• Su Changzheng

Classifications

• G21K1/20 Primary

  for confining charged particles or handling confined charged particles, e.g. ion traps · CPC title

• G02F1/29

  for the control of the position or the direction of light beams, i.e. deflection · CPC title

• G02F1/11

  based on acousto-optical elements, e.g. using variable diffraction by sound or like mechanical waves (acousto-optical deflection G02F1/33) · CPC title

• G02B26/0833 Primary

  the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD (G02B26/0825 takes precedence; micromechanical devices in general B81B) · CPC title

• G06N10/40

  Physical realisations or architectures of quantum processors or components for manipulating qubits, e.g. qubit coupling or qubit control · CPC title