Method for manufacturing a flux detector of a first and a second ionizing radiation

Patent metadata

Field	Value
Publication number	US-12287440-B2
Application number	US-202218262784-A
Country	US
Kind code	B2
Filing date	Jan 24, 2022
Priority date	Jan 27, 2021
Publication date	Apr 29, 2025
Grant date	Apr 29, 2025

Abstract

A method for manufacturing a detector of a first and a second incident ionizing radiation including determining the abscissa e m of a point of intersection between a first and a second curve, with the first and second curves representing the evolution of the number of photons or electrical charges generated per second by a transducing material as a function of the total thickness of an amplifying material when the transducing material is irradiated, through this thickness of transducing material, by the first and second incident ionizing radiation, respectively; then selecting the total thickness of amplifying material between 0.9 e m and 1.1 e m and producing the detector with the selected thickness of amplifying material.

First claim

The invention claimed is:

1. A method for manufacturing a detector for detecting the flows of a first and a second incident ionizing radiation that only differ from each other by the fact that the median energies of the ionizing particles in the first and second incident ionizing radiation are equal to a first and to a second value, respectively, with the second value differing from the first value by at least 500 keV, said method comprising:
acquiring the first and second values separated from each other by at least 500 keV; then
selecting a total thickness of amplifying material traversed when this detector is exposed to the first and second incident ionizing radiation, with this total thickness of amplifying material being able to generate a lower energy secondary ionizing radiation when it is excited by the first and second incident ionizing radiation, this total thickness being greater than 15 μm; then
producing a stack comprising, in the direction of propagation of the first and second incident ionizing radiation, the selected total thickness of amplifying material and a thickness of transducing material, with this thickness of transducing material being able to generate photons or electrical charges when it is excited by the secondary ionizing radiation generated by the total thickness of amplifying material;
connecting a sensor of photons or electrical charges to the produced stack in order to count the number of photons or electrical charges generated per second by the thickness of transducing material,
wherein selecting the total thickness of amplifying material comprises:
determining the abscissa e m of a point of intersection between a first and a second curve, with the first and second curves representing the evolution of the number of photons or electrical charges generated per second by the transducing material as a function of the total thickness of amplifying material when the transducing material is irradiated, through this thickness of transducing material, by the first and second incident ionizing radiation, respectively; then
selecting the total thickness of amplifying material between 0.9 e m and 1.1 e m .

2. The method as claimed in claim 1 , wherein the method comprises selecting the one or more amplifying materials used to produce 70% of the thickness of amplifying material in the group made up of gold (Au), lead (Pb) and tungsten (W).

3. The method as claimed in claim 1 , wherein the production of the stack is selected from the group made up of:
producing a stack comprising a single amplifying layer made of amplifying material and a single layer of transducing material, with the thickness of the single amplifying layer ranging between 0.9 e m and 1.1 e m ; and
producing a stack comprising only a first and a second amplifying layer made of amplifying material and a single layer of transducing material interposed between the first and second amplifying layers, with the sum of the thicknesses of the first and second amplifying layers ranging between 0.9 e m and 1.1 e m .

4. The method as claimed in claim 1 wherein the first value is less than 2.5 MeV and the second value is greater than 4 MeV.

5. The method as claimed in claim 4 , wherein the first and second values are equal to 500 keV and 10 MeV, respectively.

6. A method for measuring flows of incident ionizing radiation, said method comprising a step of measuring, using the same detector, flows of multiple incident ionizing radiation levels successively emitted one after the other, with the median energies of the ionizing particles of these incident ionizing radiation levels to be measured varying between a minimum value and a maximum value, with the minimum and maximum values being spaced apart by at least 500 keV;
wherein the detector used to measure the flows of these incident ionizing radiation levels comprises:
a single stack containing, in a direction of propagation of the incident ionizing radiation, a total thickness e T of amplifying material and a thickness of a transducing material traversed by the incident ionizing radiation to be measured,
with the thickness of transducing material being able to generate photons or electrical charges when it is excited by a lower energy secondary ionizing radiation than the energy of the incident ionizing radiation to be measured that is currently emitted,
with the total thickness of amplifying material being able to generate this lower energy secondary ionizing radiation when it is excited by the incident ionizing radiation to be measured that is currently emitted, this total thickness e T being greater than 15 μm; and
a sensor for photons or electrical charges connected to the stack for counting the number of photons or electrical charges generated per second by the thickness of transducing material,
wherein the total thickness e T of amplifying material of the detector used to measure the flows of these incident ionizing radiation levels ranges between 0.9 e m and 1.1 e m , where the thickness e m is the total thickness of amplifying material for which the numbers of photons or electrical charges generated per second by the thickness of transducing material when the stack is irradiated by first and second incident ionizing radiation, respectively, are equal,
with this first and second incident ionizing radiation being equal to the ionizing radiation for which the median energies of the ionizing particles are equal to said minimum and maximum values, respectively, implemented during the measurement step.

7. The method as claimed in claim 6 , wherein the stack of the detector, used to measure the flows of incident ionizing radiation, belongs to the group made up of:
a stack comprising a single amplifying layer made of amplifying material and a single layer of transducing material, with the thickness of the single amplifying layer ranging between 0.9 e m and 1.1 e m ; and
a stack comprising only a first and a second amplifying layer made of amplifying material and a single layer of transducing material interposed between the first and second amplifying layers, with the sum of the thicknesses of the first and second amplifying layers ranging between 0.9 e m and 1.1 e m .

8. A detector for detecting the flows of a first and a second incident ionizing radiation that differ from each other only by the fact that the median energies of the ionizing particles in the first and second incident ionizing radiation are equal to a first and a second value, respectively, with the first and second values being selected from the group made up of:
a first value equal to 100 keV and a second value equal to 600 keV;
a first value equal to 2 MeV and a second value equal to 4.5 MeV;
a first value equal to 500 keV and a second value equal to 10 MeV;
a first value equal to 25 MeV and a second value equal to 50 MeV; and
a first value equal to 230 MeV and of a second value equal to 250 MeV;
said detector comprising:
a single stack containing, in a direction of propagation of the first and second incident ionizing radiation, a total thickness e T of amplifying material and a thickness of a transducing material traversed by the first and second incident ionizing radiation to be measured,
with the thickness of transducing material being able to generate photons or electrical charges when it is excited by lower energy secondary ionizing radiation than the energy of the first and second incident ionizing radiation,
with the total thickness of amplifying material being able to generate this lower energy secondary ionizing radiation when it is excited by the first and second incident ionizing radiation, this total thickness e T being greater than 15 μm; and
a sensor for photons or electrical charges connected to the stack for cou

Assignees

• Centre Nat Rech Scient
• Univ Aix Marseille
• Inst Nat Sante Rech Med
• Inst Paoli Irene Calmettes Centre Regional De Lutte Contre Le Cancer
• Inst Jean Paoli & Irene Calmettes Centre Regional De Lutte Contre Le Cancer

Inventors

• Darreon Julien
• Debnath Sree Bash Chandra
• Tonneau Didier
• Fauquet Carole
• Tallet Agnès

Classifications

• G01T1/20

  with scintillation detectors · CPC title

• G01T1/28 Primary

  with secondary-emission detectors · CPC title