Magnetic particle imaging device

US12287388B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12287388-B2
Application numberUS-202017912042-A
CountryUS
Kind codeB2
Filing dateApr 16, 2020
Priority dateApr 16, 2020
Publication dateApr 29, 2025
Grant dateApr 29, 2025

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A static magnetic field generator generates a non-magnetic field region. An AC magnetic field application instrument applies an AC magnetic field to the non-magnetic field region. A detection coil has an axis parallel to a direction of the AC magnetic field in order to detect a magnetization signal. A measuring instrument is connected to the detection coil. A resonance frequency variable device includes a capacitor connected in parallel to the detection coil in order to adjust a resonance frequency of the detection coil and the measuring instrument. A capacity of the capacitor is adjusted such that a resonance frequency of a closed circuit including the detection coil, the measuring instrument, and the resonance frequency variable device including the capacitor coincides with a frequency of a harmonic signal.

First claim

Opening claim text (preview).

The invention claimed is: 1. A magnetic particle imaging device to image a distribution of a magnetic particle in an inspection object, the magnetic particle imaging device comprising: a static magnetic field generator to generate a non-magnetic field region; an alternating current (AC) magnetic field application instrument to apply an AC magnetic field to the non-magnetic field region; and a magnetization distribution measuring instrument to measure a harmonic signal emitted from a magnetic particle in the non-magnetic field region, wherein the magnetization distribution measuring instrument includes: a detection coil having an axis parallel to a direction of the AC magnetic field in order to detect a magnetization signal; a measuring instrument connected to the detection coil; and a resonance frequency variable device including a capacitor connected in parallel to the detection coil in order to adjust a resonance frequency of the detection coil and the measuring instrument, and a capacity of the capacitor is adjusted such that a resonance frequency of a closed circuit including the detection coil, the measuring instrument, and the resonance frequency variable device coincides with a frequency of the harmonic signal, the measuring instrument includes: a transfer coil to be energized with a current based on a magnetic signal generated from the inspection object, and to excite a magnetic field based on an energizing current; and a magnetic measuring instrument to measure a magnetic field excited by the transfer coil, and the closed circuit includes the detection coil, the transfer coil, and the resonance frequency variable device. 2. The magnetic particle imaging device according to claim 1 , wherein the resonance frequency variable device includes: a plurality of capacitors including the capacitor, the plurality of capacitors being connected in parallel with each other; and a switching circuit to switch one of the plurality of capacitors to be connected to the detection coil, and a capacity of each of the plurality of the capacitors is adjusted such that a resonance frequency of a closed circuit including the detection coil, the measuring instrument, and the one of the plurality of the capacitors coincides with a frequency of one of a plurality of harmonic signals. 3. The magnetic particle imaging device according to claim 1 , wherein both or any one of the detection coil and the transfer coil is a superconducting coil. 4. The magnetic particle imaging device according to claim 3 , wherein the superconducting coil includes a superconductor and a cooler, and the detection coil, the transfer coil, and the resonance frequency variable device are connected by a normal conducting cable. 5. The magnetic particle imaging device according to claim 4 , wherein the superconducting coil includes a heater thermally connected to the superconducting coil, and the heater heats only a predetermined portion of the superconducting coil to cause transition of only the predetermined portion to a normal conduction band. 6. The magnetic particle imaging device according to claim 3 , wherein the superconducting coil includes a heater thermally connected to the superconducting coil, and the heater heats only a predetermined portion of the superconducting coil to cause transition of only the predetermined portion to a normal conduction band. 7. The magnetic particle imaging device according to claim 1 , wherein the transfer coil is arranged in parallel with the capacitor in the resonance frequency variable device and in parallel with the detection coil. 8. The magnetic particle imaging device according to claim 1 , wherein the magnetic measuring instrument includes a flux gate sensor or a Magnetic Impedance (MI) effect element.

Assignees

Inventors

Classifications

  • with superconducting coils, e.g. power supply therefor · CPC title

  • Additional hardware for cooling or heating of the magnet assembly, for housing a cooled or heated part of the magnet assembly or for temperature control of the magnet assembly · CPC title

  • involving electronic [EMR] or nuclear [NMR] magnetic resonance, e.g. magnetic resonance imaging · CPC title

  • Magnetic particle imaging · CPC title

  • Magnetic field sensors · CPC title

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Frequently asked questions

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What does patent US12287388B2 cover?
A static magnetic field generator generates a non-magnetic field region. An AC magnetic field application instrument applies an AC magnetic field to the non-magnetic field region. A detection coil has an axis parallel to a direction of the AC magnetic field in order to detect a magnetization signal. A measuring instrument is connected to the detection coil. A resonance frequency variable device…
Who is the assignee on this patent?
Mitsubishi Electric Corp
What technology area does this patent fall under?
Primary CPC classification G01R33/56375. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 29 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).