Systems and methods for computed tomography

US12274577B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12274577-B2
Application numberUS-202217658715-A
CountryUS
Kind codeB2
Filing dateApr 11, 2022
Priority dateApr 11, 2022
Publication dateApr 15, 2025
Grant dateApr 15, 2025

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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Methods and systems are provided for increasing a quality of computed tomography (CT) images generated by a CT system by altering a shape of a focal spot of an X-ray emitter of the CT system. In one embodiment, a method comprises controlling the CT system to focus a beam of electrons generated by a cathode of the CT system at a plurality of focal spots on a surface of an target of the CT system; generating a composite focal spot from the plurality of focal spots; and obtaining projection data of the CT system with the composite focal spot. For example, two focal spots may be combined to generate the composite focal spot. By combining focal spots to generate composite focal spots, a quality of a resulting view produced by the CT system may be increased.

First claim

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The invention claimed is: 1. A method for a computed tomography (CT) system, comprising: controlling an X-ray source of the CT system to create a desired distribution of electrons striking a target of the CT system at each view of a subject, the desired distribution forming a composite focal spot, the composite focal spot including a first focal spot having a first distribution of electrons striking the target and a second focal spot having a second distribution of electrons striking the target, wherein a center of the first focal spot is separated from a center of the second focal spot; obtaining projection data from X-rays generated as a result of electrons of the desired distribution of electrons striking the target; and reconstructing an image from the projection data. 2. The method of claim 1 , wherein the first focal spot and the second focal spot differ with respect to at least one of: a size of each focal spot; a shape of each focal spot; a position of each focal spot; a dwell time of each focal spot; and a transition time between each focal spot. 3. The method of claim 2 , wherein the first focal spot has a first width in an X dimension, and the second focal spot has a second width in the X dimension, and a width of the composite focal spot in the X dimension is larger than a sum of the first width and the second width. 4. The method of claim 2 , wherein the composite focal spot includes the first focal spot at a first edge of the composite focal spot, and the second focal spot at a second edge of the composite focal spot, and the desired distribution of electrons includes side lobes. 5. The method of claim 1 , further comprising electrostatically and/or magnetically controlling a beam of electrons to alternate between a first electron beam that impinges on the target at the first focal spot for a first dwell time, and a second electron beam that impinges on the target at the second focal spot for a second dwell time, the second dwell time starting after the first dwell time ends, within a single view acquired by the CT system. 6. The method of claim 5 , wherein electrostatically and/or magnetically controlling the beam of electrons to alternate between the first electron beam that impinges on the target at the first focal spot for the first dwell time, and the second electron beam that impinges on the target at the second focal spot for the second dwell time further comprises: switching off the beam of electrons between the first dwell time and the second dwell time. 7. The method of claim 6 , wherein the desired distribution of electrons striking the target and forming the composite focal spot generates a composite effective focal spot on the subject of the CT system, and a shape of the composite effective focal spot is determined by the first dwell time, the second dwell time, and a transition time between the first dwell time and the second dwell time. 8. The method of claim 7 , further comprising increasing the first dwell time relative to the second dwell time to adjust a shape of the composite effective focal spot to match a shape of the first electron distribution of the first focal spot. 9. The method of claim 8 , further comprising adjusting the shape of the composite effective focal spot in a Z dimension, the Z dimension aligned with a length of the subject. 10. The method of claim 7 , wherein the second electron distribution is a narrower electron distribution than the first electron distribution, and the method further comprises increasing a spatial resolution of the composite effective focal spot by increasing the second dwell time relative to the first dwell time. 11. The method of claim 1 , wherein the desired distribution of electrons striking the target of the CT system forming the composite focal spot is generated both within a view of the projection data of the CT system and between consecutive views acquired by the CT system. 12. The method of claim 1 , wherein a cathode of the CT system includes a plurality of emitters, and a number of focal spots is generated by activating a respective number of emitters. 13. The method of claim 12 , wherein the plurality of emitters further includes a first emitter with a first filament of a first emission area, and a second emitter with a second filament of a second emission area, where the first focal spot is generated by the first emitter and the second focal spot is generated by the second emitter. 14. A computed tomography (CT) system, comprising: an X-ray tube including a cathode and a target, and an X-ray controller including one or more processors having executable instructions stored in a non-transitory memory of the CT system that, when executed, cause the one or more processors to: create a desired distribution of electrons striking the target at each view of a subject of the CT system, the desired distribution forming a composite focal spot, the composite focal spot including a first focal spot having a first distribution of electrons striking the target based on a first configuration of electrostatic controls and/or electromagnetic controls of the X-ray controller, and a second focal spot having a second distribution of electrons striking the target based on a second configuration of electrostatic controls and/or electromagnetic controls of the X-ray controller, wherein a center of the second focal spot is separated from a center of the first focal spot; obtain projection data from X-rays generated as a result of electrons of desired distribution of electrons striking the target; and reconstruct an image from the projection data. 15. The system of claim 14 , wherein further instructions are stored in the memory that when executed, cause the one or more processors to apply the first configuration of electrostatic controls and/or electromagnetic controls to generate the first focal spot for a first dwell time; and apply the second configuration of electrostatic controls and/or electromagnetic controls to generate the second focal spot for a second dwell time, the second dwell time starting after an end of the first dwell time. 16. The system of claim 14 , wherein the first focal spot is generated by directing electrons at a first edge of the first distribution of electrons towards a center of the first distribution of electrons via the first configuration of electrostatic controls and/or electromagnetic controls, and the second focal spot is generated by directing electrons at a second edge of the second distribution of electrons towards a center of the second distribution of electrons via the second configuration of electrostatic controls and/or electromagnetic controls. 17. A method for a computed tomography (CT) system, comprising: focusing a first beam of electrons generated by a cathode of the CT system at a first focal spot on a surface of a target of the CT system to generate a first distribution of electrons striking the target; focusing a second beam of electrons generated by the cathode at a second focal spot on the surface of the target to generate a second distribution of electrons striking the target, wherein a center of the second focal spot is separated from a center of the first focal spot; generating an image from projection data of the CT system acquired at a composite focal spot having a combined electron distribution that is a combination of the first distribution and the second distribution, the image including an area of focus corresponding to the composite focal spot, the area of focus including a larger area of high X-ray flux where small contrast differences between larg

Assignees

Inventors

Classifications

  • Details of data transmission or power supply, e.g. use of slip rings · CPC title

  • involving movement of the focal spot · CPC title

  • A61B6/032Primary

    Transmission computed tomography [CT] · CPC title

  • A61B6/54Primary

    Control of apparatus or devices for radiation diagnosis · CPC title

  • Circuit arrangements for X-ray tubes with target movable relatively to the anode · CPC title

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What does patent US12274577B2 cover?
Methods and systems are provided for increasing a quality of computed tomography (CT) images generated by a CT system by altering a shape of a focal spot of an X-ray emitter of the CT system. In one embodiment, a method comprises controlling the CT system to focus a beam of electrons generated by a cathode of the CT system at a plurality of focal spots on a surface of an target of the CT system…
Who is the assignee on this patent?
Ge Prec Healthcare Llc
What technology area does this patent fall under?
Primary CPC classification A61B6/032. Mapped technology areas include Human Necessities.
When was this patent published?
Publication date Tue Apr 15 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).