Quality control of high performance superconductor tapes

Patent metadata

Field	Value
Publication number	US-12256649-B2
Application number	US-202318509125-A
Country	US
Kind code	B2
Filing date	Nov 14, 2023
Priority date	Aug 30, 2016
Publication date	Mar 18, 2025
Grant date	Mar 18, 2025

Abstract

A superconductor tape and method for manufacturing, measuring, monitoring, and controlling same are disclosed. Embodiments are directed to a superconductor tape which includes a superconductor film overlying a buffer layer which overlies a substrate. In one embodiment, the superconductor film is defined as having a c-axis lattice constant higher than 11.74 Angstroms. In another embodiment, the superconductor film comprises BaMO3, where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO3 elongated along an axis that is between 60° to 90° from an axis of the (001) peaks of the superconductor film. These and other embodiments achieve well-aligned nanocolumnar defects and thus a high lift factor, which can result in superior critical current performance of the tape in, for example, high magnetic fields.

First claim

What is claimed is:

1. A superconductor tape comprising:
a substrate;
a buffer layer overlying the substrate; and
a RE-Ba—Cu—O superconductor film overlying the buffer layer;
wherein the superconductor film comprises BaMO 3 , where M=Zr, Sn, Ta, Nb, Hf, or Ce, and which has a (101) peak of BaMO 3 elongated along an axis that is between 60° to 90° from an axis of the (001) peaks of the superconducting film.

2. The superconductor tape of claim 1 , wherein the superconductor film comprises 5 to 30 mol % of dopant selected from the group consisting of Zr, Sn, Ta, Nb, Hf, Ce, and a combination thereof.

3. The superconductor tape of claim 1 , wherein the superconductor film is defined as having a c-axis lattice constant higher than 11.74 Angstroms.

4. The superconductor tape of claim 1 , wherein the superconductor film is over 10 meters in length.

5. The superconductor tape of claim 1 , wherein the (101) peak of BaMO 3 is measured by Xray diffraction.

Assignees

• Univ Houston System

Inventors

• Majkic Goran
• Selvamanickam Venkat

Classifications

• H10N60/857

  comprising copper oxide · CPC title

• H10N60/0464

  by metalloorganic chemical vapour deposition [MOCVD] · CPC title

• H10N60/203 Primary

  comprising high-Tc ceramic materials · CPC title

• Y02E40/60

  Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment · CPC title

• H10N60/0828

  Introducing flux pinning centres · CPC title