Photoelectric conversion device, imaging device, and imaging system

Patent metadata

Field	Value
Publication number	US-12255216-B2
Application number	US-202217682195-A
Country	US
Kind code	B2
Filing date	Feb 28, 2022
Priority date	Aug 30, 2019
Publication date	Mar 18, 2025
Grant date	Mar 18, 2025

Abstract

A photoelectric conversion device including a substrate including a charge generation region, a dielectric layer formed on the substrate, and a phase adjustment layer formed on the dielectric layer and having an upper surface and a lower surface. In a cross-sectional view of the photoelectric conversion device, a first plane extends parallel to the substrate in contact with the upper surface of the phase adjustment layer, a second plane is the lower surface of the phase adjustment layer, and the phase adjustment layer is formed such that the reflected light which has entered the first plane perpendicularly to the photoelectric conversion device and travels from the first plane to the second plane has an optical path length that varies depending on a position where the reflected light is incident on the first plane.

First claim

What is claimed is:

1. A photoelectric conversion device, comprising:
a substrate including a charge generation region;
a dielectric layer formed on the substrate; and
a phase adjustment layer formed on the dielectric layer and comprising a plurality of scattering particles such that the plurality of scattering particles is forming a fine concavo-convex surface having a plurality of concave portions and a plurality of convex portions and that the fine concavo-convex surface is configured to receive reflected light from reflection of emitted light on an object and vary an optical path length to the charge generation region of the substrate depending on a position of the reflected light incident on the fine concavo-convex surface of the phase adjustment layer.

2. The photoelectric conversion device according to claim 1 , wherein the fine concavo-convex surface of the phase adjustment layer is formed such that a maximum difference in the optical path length of the reflected light transmitted through the phase adjustment layer is ¼ or more of an average wavelength of the emitted light.

3. The photoelectric conversion device according to claim 1 , wherein the phase adjustment layer comprises a transparent base resin and the scattering particles dispersed in the transparent base resin.

4. The photoelectric conversion device according to claim 2 , wherein the phase adjustment layer comprises a transparent base resin and the scattering particles dispersed in the transparent base resin.

5. The photoelectric conversion device according to claim 1 , wherein the plurality of scattering particles in the phase adjustment layer includes a plurality of transparent scattering particles.

6. The photoelectric conversion device according to claim 1 , wherein the plurality of scattering particles in the phase adjustment layer includes a plurality of opaque scattering particles.

7. The photoelectric conversion device according to claim 1 , wherein the dielectric layer includes a low refractive index layer formed on the substrate and a high refractive index layer formed on the low refractive index layer.

8. The photoelectric conversion device according to claim 2 , wherein the dielectric layer includes a low refractive index layer formed on the substrate and a high refractive index layer formed on the low refractive index layer.

9. The photoelectric conversion device according to claim 1 , wherein the phase adjustment layer comprises the plurality of scattering particles comprising a plurality of silica particles.

10. The photoelectric conversion device according to claim 1 , wherein the phase adjustment layer comprises the plurality of scattering particles comprising a plurality of silica particles.

11. The photoelectric conversion device according to claim 1 , wherein the scattering particles in the phase adjustment layer have particle sizes in a range of 10 nm to 3 μm.

12. An imaging device, comprising:
a plurality of photoelectric conversion devices each comprising the photoelectric conversion device of claim 1 such that the photoelectric conversion devices are two-dimensionally positioned.

13. An imaging system, comprising:
the imaging device of claim 12 ; and
a light source which emits the emitted light.

14. An imaging system, comprising:
the photoelectric conversion device of claim 1 ; and
a light source which emits the emitted light.

15. An imaging device, comprising:
a plurality of photoelectric conversion devices each is comprising the photoelectric conversion device of claim 3 such that the photoelectric conversion devices are two-dimensionally positioned.

16. An imaging system, comprising:
the imaging device of claim 15 ; and
a light source which emits the emitted light.

17. The photoelectric conversion device according to claim 3 , wherein the dielectric layer includes a low refractive index layer formed on the substrate and a high refractive index layer formed on the low refractive index layer.

18. The photoelectric conversion device according to claim 4 , wherein the dielectric layer includes a low refractive index layer formed on the substrate and a high refractive index layer formed on the low refractive index layer.

19. The photoelectric conversion device according to claim 5 , wherein the dielectric layer includes a low refractive index layer formed on the substrate and a high refractive index layer formed on the low refractive index layer.

20. The photoelectric conversion device according to claim 6 , wherein the dielectric layer includes a low refractive index layer formed on the substrate and a high refractive index layer formed on the low refractive index layer.

Assignees

• Toppan Inc

Inventors

• Nakagome Tomohiro
• Ookubo Yu

Classifications

• H10F39/8063 Primary

  Microlenses · CPC title

• H10F39/8067 Primary

  Reflectors · CPC title

• H10F39/12

  Image sensors · CPC title

• H04N25/70

  SSIS architectures; Circuits associated therewith · CPC title

• H01L27/14627

  Electricity · mapped topic