Charged-particle measurement apparatus and control method of charged-particle measurement apparatus

Patent metadata

Field	Value
Publication number	US-12248116-B2
Application number	US-202217843043-A
Country	US
Kind code	B2
Filing date	Jun 17, 2022
Priority date	Jul 20, 2021
Publication date	Mar 11, 2025
Grant date	Mar 11, 2025

Abstract

According to one embodiment, a charged-particle measurement apparatus comprising: a plurality of gas detectors in each of which gas for detecting passage of a charged particle is enclosed; a trajectory calculator configured to calculate a trajectory of the charged particle based on detection signals outputted from the gas detectors and each of the parameters associated with the gas detectors; a measurer configured to measure an object based on the trajectory of the charged particle, the object being a measurement target; a signal intensity acquirer configured to acquire signal intensity of the detection signals; an operating state monitor configured to evaluate the operating states of the gas detectors based on the signal intensity corresponding to the gas detectors; and a parameter updating processor configured to update at least one parameter when at least one of the operating states of the gas detectors associated with this parameter changes.

First claim

What is claimed is:

1. A charged-particle measurement apparatus comprising:
a plurality of gas detectors in each of which gas for detecting passage of a charged particle is enclosed;
a trajectory calculator configured to calculate a trajectory of the charged particle based on detection signals outputted from the plurality of gas detectors and each of parameters associated with the plurality of gas detectors;
a measurer configured to measure an object based on the trajectory of the charged particle, the object being a measurement target;
a signal intensity acquirer configured to acquire signal intensity of the detection signals;
an operating state monitor configured to evaluate each of operating states of the plurality of gas detectors based on the signal intensity corresponding to each of the plurality of gas detectors; and
a parameter updating processor configured to update at least one parameter when at least one of the operating states of the plurality of gas detectors associated with this parameter changes, wherein
the signal intensity acquirer includes a time difference distribution acquirer configured to acquire time difference distribution of at least one detection signal; and
the operating state monitor is configured to evaluate at least one operating state based on the time difference distribution corresponding to at least one gas detector.

2. The charged-particle measurement apparatus according to claim 1 , wherein:
the signal intensity acquirer includes an operating-voltage characteristic acquirer configured to acquire an operating voltage characteristic of at least one detection signal; and
the operating state monitor is configured to evaluate at least one operating state based on the operating voltage characteristic corresponding to at least one gas detector.

3. The charged-particle measurement apparatus according to claim 1 , further comprising a shape comparator configured to generate a histogram of the time difference distribution and compare a shape of the histogram with a reference shape,
wherein the operating state monitor is configured to evaluate at least one operating state based on a comparison result of the histogram.

4. The charged-particle measurement apparatus according to claim 1 , further comprising a muon signal extractor, wherein:
the charged particle includes at least a muon;
the muon signal extractor is configured to extract only one or plurality of detection signals attributable to passage of the muon from among the detection signals outputted from the gas detectors; and
the operating state monitor is configured to evaluate at least one operating state based on the signal intensity of the one or plurality of detection signals attributable to passage of the muon.

5. The charged-particle measurement apparatus according to claim 1 , wherein:
the charged-particle measurement apparatus is configured to sequentially measure a plurality of objects; and
the operating state monitor is configured to evaluate at least one operating state based on the signal intensity acquired in both of a period during which one of the plurality of objects is measured and another period during which none of the plurality of objects are measured.

6. A charged-particle measurement apparatus, comprising
a plurality of gas detectors in each of which gas for detecting passage of a charged particle is enclosed;
a trajectory calculator configured to calculate a trajectory of the charged particle based on detection signals outputted from the plurality of gas detectors and each of parameters associated with the plurality of gas detectors;
a measurer configured to measure an object based on the trajectory of the charged particle, the object being a measurement target;
a signal intensity acquirer configured to acquire signal intensity of the detection signals;
an operating state monitor configured to evaluate each of operating states of the plurality of gas detectors based on the signal intensity corresponding to each of the plurality of gas detectors;
a parameter updating processor configured to update at least one parameter when at least one of the operating states of the plurality of gas detectors associated with this parameter changes; and
a non-measurement region data acquirer configured to acquire at least one detection signal corresponding to a non-measurement region among regions that can be measured by the plurality of gas detectors, the non-measurement region being a region where the object is not set,
wherein the operating state monitor is configured to evaluate at least one operating state based on the signal intensity of the at least one detection signal corresponding to the non-measurement region.

7. A charged-particle measurement apparatus, comprising
a plurality of gas detectors in each of which gas for detecting passage of a charged particle is enclosed;
a trajectory calculator configured to calculate a trajectory of the charged particle based on detection signals outputted from the plurality of gas detectors and each of parameters associated with the plurality of gas detectors;
a measurer configured to measure an object based on the trajectory of the charged particle, the object being a measurement target;
a signal intensity acquirer configured to acquire signal intensity of the detection signals;
an operating state monitor configured to evaluate each of operating states of the plurality of gas detectors based on the signal intensity corresponding to each of the plurality of gas detectors;
a parameter updating processor configured to update at least one parameter when at least one of the operating states of the plurality of gas detectors associated with this parameter changes; and
a passing position discriminator configured to identify a passing position of the charged particle in at least one of the plurality of gas detectors,
wherein the operating state monitor is configured to evaluate at least one operating state based on the signal intensity of at least one detection signal that is outputted at a time when the charged particle passes a preset setting region in a total range of the gas detector.

Assignees

• Toshiba Kk
• Toshiba Energy Systems & Solutions Corp

Inventors

• Kume Naoto
• Miyadera Haruo
• Fujimaki Takuro
• Sugita Tsukasa
• Nakai Yuki
• Suga Masataka
• Nobe Kohei

Classifications

• G01T1/2985

  In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis); (using external radiation sources A61B6/02) · CPC title

• G01T1/2935

  using ionisation detectors · CPC title

• G01V5/22 Primary

  Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays · CPC title