Device and method to calibrate parallax optical element for temperature change

Patent metadata

Field	Value
Publication number	US-12242129-B2
Application number	US-202318095338-A
Country	US
Kind code	B2
Filing date	Jan 10, 2023
Priority date	Jan 12, 2022
Publication date	Mar 4, 2025
Grant date	Mar 4, 2025

Abstract

Provided is an electronic device including a display, a parallax optical element configured to provide light corresponding to an image output from the display to an eyebox of a user, a temperature sensor configured to measure a temperature around the parallax optical element, a memory configured to store a plurality of parameter calibration models for determining correction information in different temperature ranges for a parameter of the parallax optical element, and a processor configured to determine correction information corresponding to the measured temperature based on a parameter calibration model corresponding to the measured temperature among the plurality of parameter calibration models, and adjust the parameter of the parallax optical element based on the correction information.

First claim

What is claimed is:

1. An electronic device comprising:
a display;
a parallax optical element configured to provide light corresponding to an image output from the display to an eyebox of a user;
a temperature sensor configured to measure a temperature around the parallax optical element;
a memory configured to store a plurality of parameter calibration models for determining correction information configured to correct a parameter of the parallax optical element corresponding to a plurality of temperature ranges, respectively; and
a processor configured to:
determine correction information corresponding to the measured temperature based on a parameter calibration model corresponding to the measured temperature among the plurality of parameter calibration models, and
adjust the parameter of the parallax optical element based on the correction information,

wherein the plurality of temperature ranges corresponding to the plurality of parameter calibration models are different from each other, and
wherein each temperature range among the plurality of temperature ranges comprises a plurality of temperature values corresponding to measured temperature values that are respectively input to parameter calibration model corresponding to the temperature range for determining the correction information.

2. The electronic device of claim 1 , wherein the processor is further configured to:
determine the correction information based on a first parameter calibration model corresponding to a first temperature range based on the measured temperature included in the first temperature range being greater than a reference temperature; and
determine the correction information based on a second parameter calibration model corresponding to a second temperature range based on the measured temperature included in the second temperature range being less than or equal to the reference temperature.

3. The electronic device of claim 2 , wherein the reference temperature is determined based on a temperature section in which the parameter of the parallax optical element changes non-linearly,
wherein the processor is further configured to:
based on the measured temperature being greater than the reference temperature, determine the correction information based on the first parameter calibration model; and
based on the measured temperature being less than or equal to the reference temperature, determine the correction information based on the second parameter calibration model.

4. The electronic device of claim 3 , wherein a value of the reference temperature is in a range of 20° C. to 30° C.

5. The electronic device of claim 1 , wherein the memory is further configured to store a first parameter calibration model corresponding to a first temperature that is greater than a default temperature upper limit, a second parameter calibration model corresponding to a second temperature that is less than or equal to a default temperature lower limit, and a third parameter calibration model corresponding to a default temperature range between the default temperature upper limit and the default temperature lower limit, and
wherein the processor is further configured to:
select one of the first parameter calibration model, the second parameter calibration model, and the third parameter calibration model based on the measured temperature, and
determine the correction information corresponding to the measured temperature based on the selected model.

6. The electronic device of claim 1 , wherein each of the plurality of parameter calibration models is built based on reference parameter values obtained by performing calibration at two or more temperature values within a temperature range corresponding to a model among the plurality of parameter calibration models.

7. The electronic device of claim 6 , wherein each of the plurality of parameter calibration models comprise at least one of a function representing a relationship between correction information and a temperature obtained based on a regression analysis corresponding to the reference parameter values, and mapping information corresponding to correction information mapped for each predetermined temperature.

8. The electronic device of claim 6 , wherein at least one of the plurality of parameter calibration models is built based on reference parameter values obtained at first temperature intervals in a non-linear temperature section of a temperature range corresponding to the at least one of the plurality of parameter calibration models and reference correction values obtained at second temperature intervals, being wider than the first temperature intervals, in a temperature section other than the non-linear temperature section.

9. The electronic device of claim 1 , wherein the processor is further configured to:
obtain a correction value corresponding to a pitch as the correction information, and
perform parameter correction by applying the correction value to a pitch parameter value of the parallax optical element.

10. A parameter correction method performed by a processor, the parameter correction method comprising:
providing, via a parallax optical element, light corresponding to an image output from a display to an eyebox of a user;
determining correction information corresponding to a temperature range, among a plurality of temperature ranges, including a temperature measured for the parallax optical element based on a parameter calibration model corresponding to the measured temperature among a plurality of parameter calibration models for determining correction information in different temperature ranges; and
adjusting a parameter of the parallax optical element based on the correction information,
wherein the plurality of temperature ranges corresponding to the plurality of parameter calibration models are different from each other, and
wherein each temperature range among the plurality of temperature ranges comprises a plurality of temperature values corresponding to measured temperature values that are respectively input to parameter calibration model corresponding to the temperature range for determining the correction information.

11. The parameter correction method of claim 10 , wherein the determining of the correction information comprises:
determining the correction information based on a first parameter calibration model corresponding to a first temperature range based on the measured temperature included in the first temperature range exceeding a reference temperature; and
determining the correction information based on a second parameter calibration model corresponding to a second temperature range based on the measured temperature included in the second temperature range being less than or equal to the reference temperature.

12. The parameter correction method of claim 11 , wherein the reference temperature is determined based on a temperature section in which the parameter of the parallax optical element changes non-linearly,
wherein the determining of the correction information further comprises:
based on the measured temperature being greater than the reference temperature, determining the correction information based on the first parameter calibration model; and
based on the measured temperature being less than or equal to the reference temperature, determining the correction information based on the second parameter calibration model.

13. The parameter correction method of claim 12 , wherein a temperature value of the reference temperature is in a range of 20° C. to 30° C.

14. The parameter correction method of claim 10 , further comprising:
storing a first parame

Assignees

• Samsung Electronics Co Ltd

Inventors

• Hwang Chansol
• Kang Byong Min
• Kim Chansu
• Choi Yoonsun

Classifications

• G02B2207/101

  Nanooptics · CPC title

• G02B27/01

  Head-up displays · CPC title

• G02B30/27

  involving lenticular arrays · CPC title

• G02B2027/0123

  comprising devices increasing the field of view · CPC title

• G02B2027/0134

  of stereoscopic type · CPC title