Sensitive detection of low doses of beta particles using quartz crystal oscillators

US12239474B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-12239474-B1
Application numberUS-202418767749-A
CountryUS
Kind codeB1
Filing dateJul 9, 2024
Priority dateJul 9, 2024
Publication dateMar 4, 2025
Grant dateMar 4, 2025

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A method of determining beta radiation intensity based on calculated resonance frequency and calculated quality factor can include providing an electrical sensor comprising at least one prong, irradiating the first composite material of the one of the plurality of planar surfaces and the material of the second section with beta radiation from a beta radiation source; measuring at least one impedance value from the electrical sensor with an impedance analyzer; calculating at least one resonance frequency value based on the measured at least one impedance value; calculating at least one quality factor value based on the calculated at least one resonance frequency value; and determining the beta radiation intensity based on the calculated at least one resonance frequency value and the calculated at least one quality factor value.

First claim

Opening claim text (preview).

We claim: 1. A system comprising: an electrical sensor comprising at least one prong and a cylindrical substrate, the at least one prong comprising a first section and a second section, the first section comprising a plurality of planar surfaces, each of the plurality of planar surfaces having a first end and a second end, the first end of each of the plurality of planar surfaces being connected to the cylindrical substrate, and the second end of each of the plurality of planar surfaces being connected to the second section, wherein each of the plurality of planar surfaces comprises a first material, one of the plurality of planar surfaces is coated with a second material to form a first composite material, and wherein the first composite material is different from a material of the second section; a beta radiation source configured to irradiate the first composite material of the one of the plurality of planar surfaces and the material of the second section with beta radiation; an impedance analyzer configured to measure at least one impedance value from the electrical sensor; and a data acquisition device configured to: calculate at least one resonance frequency value based on the measured at least one impedance value; and calculate at least one quality factor value based on the calculated at least one resonance frequency value. 2. The system of claim 1 , wherein the electrical sensor comprises a quartz tuning fork. 3. The system of claim 1 , wherein the first material and the second material comprise quartz and silver, respectively. 4. The system of claim 1 , wherein the material of the second section comprises the first material. 5. The system of claim 1 , wherein the material of the second section comprises the first material, which is coated with a third material to form a second composite material. 6. The system of claim 5 , wherein the third material comprises an aluminum film. 7. The system of claim 1 , wherein the beta radiation source comprises a strontium-90 beta radiation source. 8. A method of determining an intensity of beta radiation based on a calculated resonance frequency and a calculated quality factor comprising: providing an electrical sensor comprising at least one prong and a cylindrical substrate, the at least one prong comprising a first section and a second section, the first section comprising a plurality of planar surfaces, each of the plurality of planar surfaces having a first end and a second end, the first end of each of the plurality of planar surfaces being connected to the cylindrical substrate, and the second end of each of the plurality of planar surfaces being connected to the second section, wherein each of the plurality of planar surfaces comprises a first material, one of the plurality of planar surfaces is coated with a second material to form a first composite material, and wherein the first composite material is different from a material of the second section; irradiating the first composite material of the one of the plurality of planar surfaces and the material of the second section with beta radiation from a beta radiation source; measuring at least one impedance value from the electrical sensor with an impedance analyzer; calculating at least one resonance frequency value based on the measured at least one impedance value; calculating at least one quality factor value based on the calculated at least one resonance frequency value; and determining the intensity of beta radiation based on the calculated at least one resonance frequency value and the calculated at least one quality factor value. 9. The method of claim 8 , wherein the first material and the second material comprise quartz and silver, respectively. 10. The method of claim 8 , wherein the material of the second section comprises the first material. 11. The method of claim 10 , wherein the at least one resonance frequency value comprises a range of about 32.9567 kHz to about 32.9922 kHz. 12. The method of claim 8 , wherein the material of the second section comprises the first material, which is coated with a third material to form a second composite material. 13. The method of claim 12 , wherein the third material comprises an aluminum film. 14. The method of claim 13 , wherein the at least one resonance frequency value comprises a range of about 32.9567 kHz to about 33.0162 kHz. 15. The method of claim 8 , wherein the beta radiation source comprises a strontium-90 beta radiation source.

Assignees

Inventors

Classifications

  • and measuring the absorption · CPC title

  • consisting of quartz · CPC title

  • A61B6/4258Primary

    for detecting non x-ray radiation, e.g. gamma radiation (A61B6/037 takes precedence) · CPC title

  • Measuring radiation intensity (G01T1/29 takes precedence {; self-powered detectors G01T3/006; using an ionisation chamber filled with a liquid or solid, e.g. frozen liquid, dielectric G01T3/008}) · CPC title

  • Emission tomography · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US12239474B1 cover?
A method of determining beta radiation intensity based on calculated resonance frequency and calculated quality factor can include providing an electrical sensor comprising at least one prong, irradiating the first composite material of the one of the plurality of planar surfaces and the material of the second section with beta radiation from a beta radiation source; measuring at least one impe…
Who is the assignee on this patent?
Univ King Saud
What technology area does this patent fall under?
Primary CPC classification A61B6/4258. Mapped technology areas include Human Necessities.
When was this patent published?
Publication date Tue Mar 04 2025 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).