Measurement system and method of determining a corrected averaged power signal

Patent metadata

Field	Value
Publication number	US-12235299-B2
Application number	US-202217933716-A
Country	US
Kind code	B2
Filing date	Sep 20, 2022
Priority date	Sep 20, 2022
Publication date	Feb 25, 2025
Grant date	Feb 25, 2025

Abstract

A measurement system includes an input port, a signal splitter, first and second signal paths, an analysis circuit, and a control circuit. The input port is configured to receive an input signal to be measured. The signal splitter is configured to split the input signal into a first signal that is forwarded to the first signal path and a second signal that is forwarded to the second signal path. The analysis circuit is connected to the first signal path and the second signal path so as to receive both a first processed signal and a second processed signal. The analysis circuit is configured to a complex-valued product signal from the processed signals average the complex-valued product signal over a predetermined number of samples, and determine an averaged power signal based thereon. The control circuit is configured to directly or indirectly add an offset to the averaged power signal.

First claim

The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows:

1. A measurement system, comprising:
an input port is configured to receive an input signal to be measured;
a first signal path and a second signal path;
a signal splitter comprises a common port that is connected to the input port so as to receive the input signal from the input port, a first port that is connected to the first signal path and a second port being connected to the second signal path, wherein the signal splitter is configured to split the input signal into a first signal that is forwarded to the first signal path and a second signal that is forwarded to the second signal path,
the first signal path configured to process the first signal, thereby obtaining a first processed signal, and the second signal path configured to process the second signal, thereby obtaining a second processed signal,
an analysis circuit connected to the first signal path and the second signal path so as to receive both the first processed signal and the second processed signal, wherein the analysis circuit is configured to: perform a conjugate complex multiplication of the first processed signal and the second processed signal, thereby obtaining a complex-valued product signal; average the complex-valued product signal over a predetermined number of samples, thereby obtaining an averaged product signal; and determine an averaged power signal based on the averaged product signal; and
a control circuit configured to directly or indirectly add an offset to the averaged power signal.

2. The measurement system of claim 1 , wherein the offset is configured to compensate for anti-correlated thermal noise added by the signal splitter into the first signal path and the second signal path.

3. The measurement system of claim 1 , wherein the control circuit is configured to add the offset to the complex-valued product signal.

4. The measurement system of claim 1 , wherein the averaged power signal is associated with a phase noise power density, an amplitude noise power density, a time domain power measurement, or an error vector magnitude measurement.

5. The measurement system of claim 1 , wherein the control circuit is configured to add the offset to the averaged product signal.

6. The measurement system of claim 1 , wherein the analysis circuit is configured to determine an absolute value of the averaged product signal or a real value of the averaged product signal, and wherein the control circuit is configured to add the offset to the absolute value of the averaged product signal or the real value of the averaged product signal.

7. The measurement system of claim 1 , wherein the control circuit is configured to add a first partial offset in the first signal path and a second partial offset in the second signal path.

8. The measurement system of claim 7 , wherein the first partial offset is equal to the second partial offset.

9. The measurement system of claim 7 , wherein the first signal path and the second signal path each comprise an analog-to-digital converter, respectively, wherein the first partial offset and the second partial offset are established as a digital signal that is added after the analog-to-digital converter, respectively.

10. The measurement system of claim 7 , wherein the first signal path and the second signal path each comprise an analog-to-digital converter, respectively, wherein the first partial offset and the second partial offset are established as an analog signal that is added before the analog-to-digital converter, respectively.

11. The measurement system of claim 1 , wherein the first port and the second port of the signal splitter are isolated from each other.

12. The measurement system of claim 1 , wherein the signal splitter is a Wilkinson divider.

13. The measurement system of claim 1 , wherein the measurement system is configured to measure a temperature of the signal splitter, an operating temperature of the measurement system and/or an ambient temperature, and wherein the control circuit is configured to determine the offset based on the temperature of the signal splitter, based on the operating temperature and/or based on the ambient temperature.

14. The measurement system of claim 13 , wherein the control circuit is configured to load a preliminary offset from a memory, and wherein the control circuit is configured to adapt the preliminary offset based on the temperature of the signal splitter, based on the operating temperature and/or based on the ambient temperature in order to obtain the offset that is added to the averaged power signal.

15. The measurement system of claim 1 , further comprising a termination load having a predefined electric resistance, wherein the termination load is connected to the input port, or wherein the termination load is connectable to the input port by a switch.

16. The measurement system of claim 15 , wherein the termination load is integrated into the measurement system, wherein the measurement system comprises an internal calibration line, wherein the internal calibration line is connected to the termination load, and wherein the internal calibration line is connectable to the input port by a switch.

17. The measurement system of claim 1 , wherein the first signal path and the second signal path are functionally identical.

18. The measurement system of claim 1 , wherein the first signal path and the second signal path each comprise a Fourier transform circuit, wherein the Fourier transform circuits are each configured to determine a Fourier transform of the respective signal processed in the respective signal path over a predetermined time interval.

19. A measurement method of determining a corrected averaged power signal, the measurement method comprising the following steps:
receiving, by an input port, an input signal to be measured;
splitting, by a signal splitter, the input signal into a first signal and a second signal;
processing, by a first signal path, the first signal, thereby obtaining a first processed signal;
processing, by a second signal path, the second signal, thereby obtaining a second processed signal;
performing, by an analysis circuit, a conjugate complex multiplication of the first processed signal and the second processed signal, thereby obtaining a complex-valued product signal;
averaging, by the analysis circuit, the complex-valued product signal over a predetermined number of samples, thereby obtaining an averaged product signal;
determining, by the analysis circuit, an averaged power signal based on the averaged product signal; and
adding, by a control circuit, an offset to the averaged power signal directly or indirectly.

20. The measurement method of claim 19 , wherein the offset is configured to compensate for anti-correlated thermal noise added by the signal splitter into the first signal path and the second signal path.

Assignees

• Rohde & Schwarz

Inventors

• Roth Alexander
• Feldhaus Gregor
• Gaede Bernhard

Classifications

• G01R21/133

  by using digital technique · CPC title

• G01R23/16

  Spectrum analysis; Fourier analysis · CPC title

• G01R29/26

  Measuring noise figure; Measuring signal-to-noise ratio · CPC title

• G01R35/005

  Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence) · CPC title

• G01R21/14 Primary

  Compensating for temperature change · CPC title