Processing machine and method for aligning a substrate in a processing machine

Patent metadata

Field	Value
Publication number	US-12187575-B2
Application number	US-202318695025-A
Country	US
Kind code	B2
Filing date	Jan 20, 2023
Priority date	Feb 4, 2022
Publication date	Jan 7, 2025
Grant date	Jan 7, 2025

Abstract

A processing machine includes at least one processing unit configured as at least one shaping unit following, in a transport direction of a substrate, at least one processing unit configured as at least one application unit. Additionally, at least one transport unit is arranged between the at least one application unit and at least one succeeding processing unit. The at least one transport unit includes a plurality of transport elements that are arranged one behind the other in the transport direction. At least one transport element is axially adjustable based on detection of at least one image-producing element of a substrate by at least one sensor for substrate alignment.

First claim

The invention claimed is:

1. A processing machine ( 01 ) comprising: at least one processing unit ( 900 ) configured as a shaping unit ( 900 ) succeeding at least one processing unit ( 600 ) configured as an application unit ( 600 ) in a transport direction (T) of a substrate ( 02 ); at least one transport unit ( 700 ) being arranged between the at least one processing unit ( 600 ) configured as an application unit ( 600 ) and the at least one succeeding processing unit ( 900 ); the at least one transport unit ( 700 ) comprising a plurality of transport elements ( 701 ) configured to contact and transport the substrate ( 02 ); and the transport elements ( 701 ) of the plurality of transport elements ( 701 ) being arranged one behind another in the transport direction (T), characterized in that at least one transport element ( 701 ) of the plurality of transport elements ( 701 ) is axially adjustable based on detection of at least one image element on the substrate ( 02 ) by at least one sensor ( 704 ) for substrate alignment.

2. The processing machine according to claim 1 , characterized in that a section, defined by the at least one transport unit ( 700 ), of a transport path provided for a transport of substrate ( 02 ) is located beneath a transport surface ( 702 ) of the transport unit ( 700 ) and/or that the at least one succeeding processing unit ( 900 ) is configured as a die-cutting unit ( 900 ) and/or that the processing machine ( 01 ) is configured as a rotary die-cutting machine ( 01 ) and/or that the at least one transport unit ( 700 ) is configured as a suction transport means ( 700 ) and/or that the at least one transport unit ( 700 ) is configured as a suction box.

3. The processing machine according to claim 1 , characterized in that the at least one transport unit ( 700 ) comprises the at least one transport element ( 701 ) and at least one further transport element ( 701 ) arranged thereafter and/or therebefore in the transport direction (T), which are each axially adjustable, and/or that the plurality of transport elements ( 701 ) are individually axially adjustable or that the plurality of transport elements ( 701 ) are groupwise axially adjustable and/or that the at least one transport element ( 701 ) comprises a dedicated drive (ME) for the axial adjustment.

4. The processing machine according to claim 1 , characterized in that the at least one sensor ( 704 ) for substrate alignment is arranged between the at least one application unit ( 600 ) and the at least one succeeding processing unit ( 900 ) and/or that the at least one sensor ( 704 ) for substrate alignment is arranged at the at least one transport unit ( 700 ) and/or that the at least one sensor ( 704 ) for substrate alignment is configured as a sensor for contrast recognition.

5. The processing machine according to claim 1 , characterized in that the at least one sensor ( 704 ) for substrate alignment is arranged in the transport direction (T) before at least 75% of the transport elements ( 701 ) of the transport unit ( 700 ) and/or that the at least one sensor ( 704 ) for substrate alignment is arranged after at least one first transport element ( 701 ) of the transport unit ( 700 ).

6. The processing machine according to claim 1 , characterized in that the at least one transport unit ( 700 ) comprises at least one main drive (M), which is configured so as to generate a rotative movement of the at least one transport element ( 701 ).

7. The processing machine according to claim 6 , characterized in that the plurality of transport elements ( 701 ) are coupled to the at least one main drive (M) and/or that at least one sensor ( 622 ; 922 ) for recognizing a leading edge ( 03 ) of a substrate ( 02 ) is arranged at least before a last transport element ( 701 ), in the transport direction T, of the at least one transport unit ( 700 ) before the at least one succeeding processing unit ( 900 ) and the at least one sensor ( 622 ; 922 ) is connected to the at least one main drive (M) by means of at least one control unit.

8. The processing machine according to claim 6 , characterized in that at least one sensor ( 622 ; 922 ) for recognizing a leading edge ( 03 ) of a substrate ( 02 ) is in each case arranged before each processing unit ( 600 ; 900 ) of the processing machine ( 01 ), and that the at least one sensor ( 622 ; 922 ) for recognizing a leading edge is in each case connected by means of at least one control unit to at least one main drive (M) of a transport unit ( 700 ) arranged before the particular processing unit ( 600 ; 900 ).

9. The processing machine according to claim 1 , characterized in that at least two transport units ( 700 ) are arranged consecutively between the two processing units ( 600 ; 900 ), which are configured so as to cooperate with one another for aligning substrate ( 02 ).

10. A method for aligning a substrate ( 02 ) in a processing machine ( 01 ) comprising: at least one processing unit ( 900 ) configured as a shaping unit ( 900 ) succeeding at least one processing unit ( 600 ) configured as an application unit ( 600 ) in a transport direction (T) of substrate ( 02 ); at least one transport unit ( 700 ) being arranged between the at least one processing unit ( 600 ) configured as an application unit ( 600 ) and the at least one succeeding processing unit ( 900 ); the at least one transport unit ( 700 ) comprising a plurality of transport elements ( 701 ) configured to contact and transport the substrate ( 02 ); and the transport elements ( 701 ) of the plurality of transport elements ( 701 ) being arranged one behind the other in the transport direction (T), wherein the method comprises: adjusting at least one transport element ( 701 ) of the plurality of transport elements ( 701 ) axially based on a detection of at least one image element on the substrate ( 02 ) by at least one sensor ( 704 ) for substrate alignment.

11. The method according to claim 10 , characterized in that a section, defined by the at least one transport unit ( 700 ), of a transport path provided for a transport of substrate ( 02 ) is located beneath a transport surface ( 702 ) of the transport unit ( 700 ) and/or that at least two transport units ( 700 ) are arranged consecutively between the two processing units ( 600 ; 900 ), which cooperate with one another for aligning the substrate ( 02 ).

12. The method according to claim 10 , characterized in that the plurality of transport elements ( 701 ) are individually axially adjusted or that the plurality of transport elements ( 701 ) are groupwise axially adjusted and/or that the at least one sensor ( 704 ) for substrate alignment controls by open loop and/or closed loop at least one dedicated drive (ME) for axially adjusting the at least one transport element ( 701 ).

13. The method according to claim 10 , characterized in that the at least one sensor ( 704 ) for substrate alignment is arranged between the at least one application unit ( 600 ) and the at least one succeeding processing unit ( 900 ) and/or that the at least one sensor ( 704 ) for substrate alignment is arranged at the at least one transport unit ( 700 ) and/or that the at least one sensor ( 704 ) for substrate alignment is arranged in the transport direction (T) before at least 75% of the transport elements ( 701 ) of the transport unit ( 700 ) and/or that the at least one sensor ( 704 ) for substrate alignment is arranged after at least one first transport element ( 701 ) of the transport unit ( 700 ) and/or that the at least one image element is recognized as a result of a difference in contrast with respect to a surrounding area of an object to be recognized.

14.

Assignees

• Koenig & Bauer Ag

Inventors

• Deppisch Bastian
• Müller Torsten
• Masuch Bernd

Classifications

• B65H2701/1311

  leading edge · CPC title

• B65H2553/41

  Photoelectric detectors · CPC title

• B65H2406/31

  Suction box; Suction chambers · CPC title

• B65H2404/16

  Details of driving · CPC title

• B65H2404/1523

  moving in parallel to its axis · CPC title