Imaging mechanism and sample analyzing apparatus provided with the same

Patent metadata

Field	Value
Publication number	US-12174360-B2
Application number	US-201917619624-A
Country	US
Kind code	B2
Filing date	Jul 18, 2019
Priority date	Jul 18, 2019
Publication date	Dec 24, 2024
Grant date	Dec 24, 2024

Abstract

An image capturing mechanism includes: an optical measurement unit for optically observing a sample; a temperature conditioning unit for heating or cooling the sample, the temperature conditioning unit being mounted on a table by means of a support member; and a moving mechanism for moving the table in order to photograph the sample. The temperature conditioning unit includes: a temperature conditioning part for heating or cooling the sample, abutted on one face of a Peltier device; a heat conducting member abutted on the other face of the Peltier device; and the support member for holding the temperature conditioning part and the heat conducting member and securing the temperature conditioning part and the heat conducting member on the table. At least the heat conducting member is connected to a cooling means, and the thermal conductivity of the support member is low relative to the thermal conductivity of the heat conducting member.

First claim

The invention claimed is:

1. An imaging mechanism comprising:
an optical measurement unit for optically observing a sample;
a temperature conditioning unit for heating or cooling the sample, the temperature conditioning unit being mounted on a table by means of a support member; and
a moving mechanism for moving the table in order to photograph an entire region of the sample,
wherein the temperature conditioning unit is provided with a temperature conditioning part for heating or cooling the sample, abutted on one face of a Peltier device, a heat conducting member abutted on an other face of the Peltier device, and the support member having a groove-shaped portion for holding the temperature conditioning part and the heat conducting member and fixing the temperature conditioning part and the heat conducting member on the table, and
wherein the heat conducting member is provided in the groove-shaped portion and connected to cooling means, and thermal conductivity of the support member is low relative to thermal conductivity of the heat conducting member.

2. The imaging mechanism according to claim 1 ,
wherein the support member is made of a material having a lower linear expansion coefficient than the heat conducting member.

3. A sample analyzing apparatus comprising:
the imaging mechanism according to claim 1 .

4. An imaging mechanism comprising:
an optical measurement unit for optically observing a sample;
a temperature conditioning unit for heating or cooling the sample, the temperature conditioning unit being mounted on a table by means of a support member; and
a moving mechanism for moving the table in order to photograph an entire region of the sample,
wherein the temperature conditioning unit is provided with a temperature conditioning part for heating or cooling the sample, abutted on one face of a Peltier device, a heat conducting member abutted on an other face of the Peltier device, and the support member having a hole-shaped portion for holding the temperature conditioning part and the heat conducting member and fixing the temperature conditioning part and the heat conducting member on the table, and
wherein the heat conducting member is provided so as to pass through at least the hole-shaped portion and connected to cooling means, and thermal conductivity of the support member is low relative to thermal conductivity of the heat conducting member.

5. The imaging mechanism according to claim 4 ,
wherein the support member is made of a material having a lower linear expansion coefficient than the heat conducting member.

6. The imaging mechanism according to claim 4 ,
wherein the Peltier device is sandwiched and fixed between the temperature conditioning part and the heat conducting member, and the support member is connected to the temperature conditioning part and is attached without being in contact with the Peltier device and the heat conducting member.

Assignees

• Hitachi High Tech Corp

Inventors

• Mitsuyama Toshifumi
• Doi Akira
• Miyata Hitoshi
• Shoji Tomohiro

Classifications

• B01L7/52

  with provision for submitting samples to a predetermined sequence of different temperatures, e.g. for treating nucleic acid samples · CPC title

• G02B21/30

  with heating device · CPC title

• G02B21/36

  arranged for photographic purposes or projection purposes (G02B21/18 takes precedence){or digital imaging or video purposes including associated control and data processing arrangements (image data processing per se G06T)} · CPC title

• G02B21/28

  with cooling device · CPC title

• G02B21/16

  adapted for ultraviolet illumination {; Fluorescence microscopes (G02B21/0076 takes precedence)} · CPC title