Apparatus for measuring dynamic on-resistance of nitride-based semiconductor device

Patent metadata

Field	Value
Publication number	US-12174229-B2
Application number	US-202217923598-A
Country	US
Kind code	B2
Filing date	Jul 13, 2022
Priority date	Jul 13, 2022
Publication date	Dec 24, 2024
Grant date	Dec 24, 2024

Abstract

An apparatus for measuring dynamic on-resistance of a device under test (DUT) is provided. The apparatus comprises a testing interface configured for coupling between the DUT and a measuring equipment; a first measuring circuit configured for sensing a drain-source voltage of the DUT and generating a first measuring signal proportional to the drain-source voltage; a current sensing circuit configured for sensing a drain current flowing from a drain to a source of the DUT and generating a current sensing signal; a second measuring circuit configured for receiving the current sensing signal and generating a second measuring signal proportional to the drain current; a first clamping circuit configured for eliminating overshoots in the first measuring signal; a second clamping circuit configured for eliminating overshoots in the second measuring signal. As the overshoot in the measuring voltage signals can be eliminated, the time required for the measuring signal to settle is shortened.

First claim

The invention claimed is:

1. An apparatus for measuring dynamic on-resistance of a device under test (DUT), comprising:
a testing interface configured for coupling between the DUT and a measuring equipment;
a first measuring circuit configured for sensing a drain-source voltage of the DUT and generating a first measuring signal proportional to the drain-source voltage;
a current sensing circuit configured for sensing a drain current flowing from a drain to a source of the DUT and generating a current sensing signal proportional to the drain current;
a second measuring circuit configured for receiving the current sensing signal and generating a second measuring signal proportional to the drain current;
a first clamping circuit configured for eliminating overshoots in the first measuring signal;
a second clamping circuit configured for eliminating overshoots in the second measuring signal;
a plurality of driving circuits configured for driving the DUT, the first measuring circuit, the second measuring circuit, the first clamping circuit and the second clamping circuit respectively; and
a controller configured for controlling the plurality of driving circuits;
wherein the testing interface includes:
a DUT control node for connecting to a control terminal of the DUT;
a first DUT conduction node for connecting to a first conduction terminal of the DUT;
a second DUT conduction node for connecting to a second conduction terminal of the DUT;
a first measuring node for connecting to a first input port of the measuring equipment;
a second measuring node for connecting to a second input port of the measuring equipment; and
a ground node for connecting to ground;
and wherein:
the first measuring circuit has a first conduction terminal connected to the first DUT conduction node, a second conduction terminal connected to the first measuring node and a reference terminal connected to the second DUT conduction node;
the current sensing circuit has a first terminal connected to the second DUT conduction node and a second terminal connected to the ground node;
the second measuring circuit has a first conduction terminal connected to the second DUT conduction node, a second conduction terminal connected to the second measuring node and a reference terminal connected to the ground node;
the first clamping circuit has a first conduction terminal connected to the first measuring node and a second conduction terminal connected to the second DUT conduction node; and
the second clamping circuit having a first conduction terminal connected to the second measuring node and a second conduction terminal connected to the ground node.

2. The apparatus according to claim 1 , wherein the plurality of driving circuits includes:
a first driving circuit having an output terminal connected to the DUT control node Ctrl_DUT;
a second driving circuit having an output terminal connected to a control terminal of first measuring circuit;
a third driving circuit having an output terminal connected to a control terminal of second measuring circuit;
a fourth driving circuit having an output terminal connected to a control terminal of the first clamping circuit; and
a fifth driving circuit having an output terminal connected to a control terminal of the second clamping circuit.

3. The apparatus according to claim 2 , wherein the controller comprises:
a first output terminal connected to an input terminal of the first driving circuit;
a second output terminal connected to an input terminal of the second driving circuit;
a third output terminal connected to an input terminal of the third driving circuit;
a fourth output terminal connected to an input terminal of the fourth driving circuit; and
a fifth output terminal connected to an input terminal of the fifth driving circuit.

4. The apparatus according to claim 3 , wherein the controller is configured to:
generate a first control signal to the first driving circuit to switch on and off the DUT with a switching cycle time; and
generate a second control signal to the second driving circuit to switch on and off the first measuring circuit and a third control signal to the second driving circuit to switch on and off the second measuring circuit such that the first measuring circuit and the second measuring circuit are turned on later than the DUT being turned on for a first time interval and the first measuring circuit is turned off earlier than the DUT being turned off for a second time interval.

5. The apparatus according to claim 4 , wherein the controller is further configured to generate a fifth control signal to the fifth driving circuit to switch on and off the second clamping circuit such that the second clamping circuit is:
turned on, at the first time within a switching cycle, earlier than the DUT being turned on for a third time interval;
turned off, at the first time within the switching cycle, earlier than the second measuring circuit being turned on for a fourth time interval;
turned on, at the second time within the switching cycle, later than the second measuring circuit being turned off for a fifth time interval; and
turned off, at the second time within the switching cycle, later than the DUT being turned off for a sixth time interval.

6. The apparatus according to claim 4 , wherein the controller is further configured to generate a fourth driving signal to the fourth driving circuit to switch on and off the first clamping circuit such that the first clamping circuit is:
turned off when the first measuring circuit is turned on; and
turned on when the first measuring circuit is turned off.

7. The apparatus according to claim 4 , wherein the controller is further configured to generate a fifth driving signal to the fifth driving circuit to switch on and off the second clamping circuit such that the second clamping circuit is:
turned off when the second measuring circuit is turned on; and
turned on when the second measuring circuit is turned off.

8. The apparatus according to claim 4 , wherein the controller is further configured to generate a fourth control signal to the fourth driving circuit to switch on and off the first clamping circuit such that the first clamping circuit is:
turned on, at the first time within a switching cycle, earlier than the DUT being turned on for a third time interval;
turned off, at the first time within the switching cycle, earlier than the first measuring circuit being turned on for a fourth time interval;
turned on, at the second time within the switching cycle, later than the first measuring circuit being turned off for a fifth time interval; and
turned off, at the second time within the switching cycle, later than the DUT being turned off for a sixth time interval.

9. The apparatus according to claim 8 , wherein the third time interval is equal to the sixth time interval; and the fourth time interval is equal to the fifth time interval.

10. An apparatus for measuring dynamic on-resistance of a device under test (DUT), comprising:
a testing interface configured for coupling between the DUT and a measuring equipment;
a first measuring circuit configured for sensing a drain-source voltage of the DUT and generating a first measuring signal proportional to the drain-source voltage;
a current sensing circuit configured for sensing a drain current flowing from a drain to a source of the DUT and generating a current sensing signal proportional to the drain current;
a second measuring circuit configured for receiving the current sensing signal and generating a second measuring signal proportional to the drain current;
a first clamping circuit configured for eliminating overshoots in the first measuring si

Assignees

• Innoscience Zhuhai Technology Co Ltd

Inventors

• Lin Yiming
• Sheng Jianjian

Classifications

• G01R31/2601

  Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence) · CPC title

• G01R27/08 Primary

  Measuring resistance by measuring both voltage and current · CPC title

• G01R31/2607 Primary

  Circuits therefor (G01R31/2642 takes precedence) · CPC title