Thermoelectric power meter

Patent metadata

Field	Value
Publication number	US-12174228-B2
Application number	US-202217887596-A
Country	US
Kind code	B2
Filing date	Aug 15, 2022
Priority date	Aug 15, 2022
Publication date	Dec 24, 2024
Grant date	Dec 24, 2024

Abstract

An apparatus and a system measure electrical power with improved accuracy as a result of compensating for sources of thermal energy that are not caused by the electrical power of the electrical circuit under test. The apparatuses and systems provide a separate electrical signal source (e.g. RF electrical circuits under test) and DC sides. The apparatuses and systems include devices adapted to convert thermal energy into voltages having reversed polarities. The apparatuses and systems are adapted to compensate for temperature changes not caused by the electrical power of the electrical circuit under test (e.g., ambient temperature change and thermal energy transmitted through the signal transmission lines from sources in the electrical circuit).

First claim

The invention claimed is:

1. An apparatus for measuring electrical power, comprising:
a substrate;
a first device adapted to convert thermal energy into a first voltage, the first device comprising a first thermopile or a first thermocouple, the first device having a first input and a first output, the first device being disposed over the substrate adjacent to a first resistor;
a second device adapted to convert thermal energy into a second voltage, the second device comprising a second thermopile or a second thermocouple, the second device having a second input and a second output, the second device being disposed over the substrate adjacent to a second resistor, wherein the first output and the second output have opposite polarities; and
a source measurement unit comprising a direct current (DC) voltage source and a DC voltmeter connected to the second resistor, wherein the source measurement unit provides a third voltage to the second resistor to maintain a voltage between the first and second outputs at a balanced level.

2. The apparatus of claim 1 , wherein the first resistor is connected to an electrical source that causes a temperature change across the first resistor and the source measurement unit is adapted to change the third voltage across the second resistor to return the voltage between the first and second outputs to the balanced level.

3. The apparatus of claim 2 , wherein a change in the third voltage across the second resistor is proportional to a change in output power of the electrical source.

4. The apparatus of claim 3 , wherein the electrical source comprises a radio frequency (RF) circuit, and a voltage change across the second resistor is proportional to a change in output power of the RF source.

5. The apparatus of claim 1 , wherein a change in an ambient temperature causes a substantially uniform temperature change across the substrate, and a change in a voltage across the first device caused by the change in the ambient temperature is compensated by application of a voltage across the second resistor to return the voltage between the first and second outputs at the balanced level.

6. The apparatus of claim 1 , wherein the substrate has a substantially uniform coefficient of thermal conductivity.

7. The apparatus of claim 6 , wherein the substrate comprises silicon, gallium arsenide (GaAs), and/or gallium nitride (GaN).

8. The apparatus of claim 1 , wherein a change in a temperature caused by an electrical circuit connected to the first resistor causes a change in the first voltage, which is compensated by application of the third voltage across the second resistor to return the voltage between the first and second outputs at the balanced level.

9. The apparatus of claim 1 , wherein the first and second devices adapted to convert thermal energy are substantially thermally isolated from one another.

10. The apparatus of claim 1 , wherein the first and second devices adapted to convert thermal energy are thermally isolated from one another up to a power level across the first resistor of approximately 20 dBm.

11. A system for measuring electrical power of an electrical circuit, the system comprising:
a controller comprising a processor;
a tangible, non-transitory computer-readable medium that stores instructions;
a substrate;
a first device adapted to convert thermal energy into a first voltage, the first device comprising a first thermopile or a first thermocouple, the first device having a first input and a first output, the first device being disposed over the substrate adjacent to a first resistor;
a second device adapted to convert thermal energy into a second voltage, the second device comprising a second thermopile or a second thermocouple, the second device having a second input and a second output, the second device being disposed over the substrate adjacent to a second resistor, wherein the first output and the second output have opposite polarities; and
a source measurement unit comprising a direct current (DC) voltage source and a DC voltmeter connected to the second resistor, wherein the instructions, when executed by the processor cause the source measurement unit to provide a third voltage to the second resistor to maintain a voltage between the first and second outputs at a balanced level.

12. The system of claim 11 , wherein the first resistor is connected to an electrical source that causes a temperature change across the first resistor and the source measurement unit is adapted to provide a voltage change across the second resistor to return the voltage between the first and second outputs to the balanced level.

13. The system of claim 12 , wherein the voltage change across the second resistor is proportional to a change in output power of the electrical source.

14. The system of claim 13 , wherein the electrical source comprises a radio frequency (RF) circuit, and the voltage change across the second resistor is proportional to a change in output power of the RF source.

15. The system of claim 11 , wherein a change in an ambient temperature causes a substantially uniform temperature change across the substrate, wherein the instructions further cause a voltage to be applied by the source measurement unit across the second resistor that compensates for the change in the ambient temperature to return the voltage between the first and second outputs at the balanced level.

16. The system of claim 11 , wherein the substrate has a substantially uniform coefficient of thermal conductivity.

17. The system of claim 16 , wherein the substrate comprises silicon, gallium arsenide, (GaAs), and/or gallium nitride (GaN).

18. The system of claim 11 , wherein a change in a temperature caused by an electrical circuit connected to the first resistor causes a change in the first voltage across the first device, which is compensated by application of the third voltage across the second resistor to return the voltage between the first and second outputs at the balanced level.

19. The system of claim 11 , wherein the first and second devices are substantially thermally isolated from one another.

20. The system of claim 11 , wherein the first device and the second device are thermally isolated from one another up to a power level across the first resistor of approximately 20 dBm.

Assignees

• Keysight Technologies Inc

Inventors

• Hussin Ghazali Bin

Classifications

• G01R21/14

  Compensating for temperature change · CPC title

• G01R19/32

  Compensating for temperature change · CPC title

• G01R21/02

  by thermal methods {, e.g. calorimetric} · CPC title

• G01R22/04 Primary

  by calorimetric methods · CPC title