Electronic device including a transistor and a variable capacitor
US-2020098745-A1 · Mar 26, 2020 · US
US12166033B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12166033-B2 |
| Application number | US-202117513865-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 28, 2021 |
| Priority date | Nov 26, 2020 |
| Publication date | Dec 10, 2024 |
| Grant date | Dec 10, 2024 |
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The disclosure provides an electronic device. The electronic device includes a substrate, a transistor, and a variable capacitor. The transistor is disposed on the substrate. The variable capacitor is disposed on the substrate and adjacent to the transistor. A material of the transistor and a material of the variable capacitor both a include a III-V semiconductor material. The electronic device of an embodiment of the disclosure may simplify manufacturing process, reduce costs, or reduce dimensions.
Opening claim text (preview).
What is claimed is: 1. An electronic device, comprising: a substrate; a transistor disposed on the substrate, wherein the transistor is a high electron mobility transistor; and a variable capacitor disposed on the substrate and adjacent to the transistor, wherein the variable capacitor is a variable capacitance diode; wherein a material of the transistor and a material of the variable capacitor both comprise a III-V semiconductor material, wherein the variable capacitor comprises: a first-type semiconductor layer disposed on the substrate; a first part of a second-type semiconductor layer disposed on the first-type semiconductor layer; a first-type pad disposed on the first-type semiconductor layer and electrically connected to the first-type semiconductor layer; and a second-type pad disposed on the first part of the second-type semiconductor layer and electrically connected to the first part of the second-type semiconductor layer, wherein the transistor comprises: a second part of the second-type semiconductor layer disposed on the first-type semiconductor layer; a semiconductor material layer disposed on the second part of the second-type semiconductor layer; a gate disposed on the semiconductor material layer; and a source and a drain respectively disposed on the semiconductor material layer. 2. The electronic device of claim 1 , wherein a conductivity type of the first-type semiconductor layer is different from a conductivity type of the second-type semiconductor layer. 3. The electronic device of claim 1 , wherein the first-type pad is disposed between the first part and the second part of the second-type semiconductor layer. 4. The electronic device of claim 1 , wherein the first-type pad is in contact with the first-type semiconductor layer. 5. The electronic device of claim 1 , wherein the first-type pad is not in contact with the second-type semiconductor layer. 6. The electronic device of claim 1 , wherein the source is regarded as the first-type pad. 7. The electronic device of claim 1 , wherein the first part and the second part of the second-type semiconductor layer are physically separated from each other. 8. The electronic device of claim 1 , wherein a junction between the first-type semiconductor layer and the first part of the second-type semiconductor layer has a depletion region. 9. The electronic device of claim 1 , wherein the transistor is electrically connected to the variable capacitor.
Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs · CPC title
Combinations of field-effect devices and capacitor only · CPC title
using Group III-V technology · CPC title
having wider bandgap layer formed on top of lower bandgap active layer, e.g. undoped barrier HEMTs such as i-AlGaN/GaN HEMTs · CPC title
Variable-capacitance diodes, e.g. varactors · CPC title
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