Self-radiated loopback test procedure for millimeter wave antennas

Patent metadata

Field	Value
Publication number	US-12149295-B2
Application number	US-202318162805-A
Country	US
Kind code	B2
Filing date	Feb 1, 2023
Priority date	Oct 26, 2018
Publication date	Nov 19, 2024
Grant date	Nov 19, 2024

Abstract

Methods and systems for automated testing of extremely-high frequency devices are disclosed. A device under test (DUT) is set in a simultaneous transmit and receive mode. The DUT receives a lower frequency radio frequency (RF) signal from a test unit and up-converts the lower frequency RF signal to a higher frequency RF signal. The DUT transmits the higher frequency RF signal using a first antenna, and receives the higher frequency RF signal using a second antenna. The DUT down-converts the received higher frequency RF signal to a received test RF signal and provides the received test RF signal to the test unit for comparing measurements derived from the received test signal to a design specification for the DUT.

First claim

What is claimed is:

1. A method of testing a device under test (DUT) performed by a test unit, the method comprising:
configuring the DUT to set a simultaneous transmit and receive mode;
generating a lower frequency radio frequency (RF) signal, the test unit comprising only lower frequency RF components;
providing the lower frequency RF signal to the DUT;
receiving a received test RF signal from the DUT; and
comparing measurements derived from the received test RF signal to a design specification for the DUT.

2. The method of claim 1 , wherein comparing measurements further comprises:
calculating and comparing receiver gain and transmit power at the DUT to the design specification.

3. The method of claim 1 , wherein the test unit generates the lower frequency RF signal from a signal generator.

4. The method of claim 1 , wherein the lower frequency RF signal comprises a multi-tone RF signal.

5. The method of claim 1 , wherein the lower frequency RF signal comprises a non-millimeter wave RF signal.

6. A device test system, including a test unit, wherein the test unit comprises:
a signal generator configured to generate a lower frequency RF signal and to provide the lower frequency radio frequency (RF) signal to a device under test (DUT) set to a simultaneous transmit and receive mode, the test unit comprising only lower frequency RF components;
a signal analyzer configured to receive a received test RF signal from the DUT and to compare measurements from the received test RF signal to a design specification for the DUT; and
a fixture for mounting the DUT to the test unit.

7. The device test system of claim 6 , wherein the signal analyzer is further configured to calculate and compare receiver gain and transmit power of the DUT to the design specification for the DUT.

8. The device test system of claim 6 , wherein the signal analyzer is a vector signal analyzer (VSA).

9. The device test system of claim 6 , wherein the lower frequency RF signal comprises a non-millimeter wave RF signal and the higher frequency RF signal comprises a millimeter wave RF signal.

Assignees

• Qualcomm Inc

Inventors

• Verma Gaurav
• Collins David
• Wendlandt Ryan Reddy
• Deshpande Prachi
• Singhania Gaurav
• Moncombu Ramakrishnan Karthik
• Carr Jeffrey
• Bhattacharya Anushruti
• Feenaghty Dennis

Classifications

• H04B17/297

  Self-testing arrangements · CPC title

• H04B1/50

  using different frequencies for the two directions of communication · CPC title

• H04B17/19

  Self-testing arrangements · CPC title

• H01Q3/267

  Phased-array testing or checking devices · CPC title

• H04B1/0064

  with separate antennas for the more than one band (H04B1/0053 takes precedence) · CPC title