Method for measuring phase currents of a device under test, in particular of an inverter

Patent metadata

Field	Value
Publication number	US-12140649-B2
Application number	US-202117995494-A
Country	US
Kind code	B2
Filing date	Mar 3, 2021
Priority date	Apr 9, 2020
Publication date	Nov 12, 2024
Grant date	Nov 12, 2024

Abstract

A method is for measuring phase currents of a device under test, in particular of an inverter, in which a sensor arrangement, which has a component including a crystal lattice with a defect, is arranged in a region of the device under test. The method includes using the sensor arrangement to detect a magnetic field formed by a vector of magnetic fields, the magnetic fields each in turn being brought about by one of the phase currents of the device under test, and calculating a vector of the phase currents from the vector of the magnetic fields based on a coefficient matrix.

First claim

The invention claimed is:

1. A method for measuring phase currents of a device under test in which a sensor arrangement is arranged in a region of the device under test, the method comprising:
using the sensor arrangement to detect a magnetic field formed by a vector of a plurality of magnetic fields, each magnetic field of the plurality magnetic fields induced by a corresponding phase current of a plurality of phase currents of the device under test;
determining the vector of the plurality of magnetic fields based on the detected magnetic field; and
calculating a vector for each phase current of the plurality of phase currents based on the determined vector of the plurality of magnetic fields and a coefficient matrix,
wherein the sensor arrangement includes a component comprising a crystal lattice with at least one defect configured to generate an output corresponding to the detected magnetic field,
wherein the device under test is a three-phase inverter,
wherein the three-phase inverter is operably connected to an electric motor, and
wherein the three-phase inverter is operated based on the calculated vector for each phase current in order control a drive torque of the electric motor.

2. A sensor arrangement for measuring phase currents of a device under test, the sensor arrangement comprising:
a component defining a crystal lattice with at least one defect, the component arranged in a region of the device under test; and
a processor operably connected to the component, the processor configured to (i) detect a magnetic field formed by a vector of a plurality of magnetic fields, each magnetic field of the plurality of magnetic fields induced by a corresponding phase current of a plurality of phase currents of the device under test, (ii) determine the vector of the plurality of magnetic fields based on the detected magnetic field, and (iii) calculate a vector for each phase current of the plurality of phase currents based on the determined vector of the plurality of magnetic fields and a coefficient matrix,
wherein the at least one defect is configured to generate an output corresponding to the detected magnetic field,
wherein the device under test is a three-phase inverter,
wherein the three-phase inverter is operably connected to an electric motor, and
wherein the three-phase inverter is operated based on the calculated vector for each phase current in order control a drive torque of the electric motor.

3. The method as claimed in claim 1 , wherein the plurality of phase currents includes three phases and the method further comprises:
positioning the sensor arrangement at approximately the same distance to each of the three phases of the device under test.

4. The method as claimed in claim 1 , wherein the output of the at least one defect has a fluorescent effect and the method further comprises:
detecting the magnetic field using an optically detected magnetic resonance (“ODMR”).

5. The method as claimed in claim 1 , wherein the output of the at least one defect induces a magnetic resonance and the method further comprises:
detecting the magnetic field using a photoelectric detection of the magnetic resonance (“PDMR”) measurement.

6. The method as claimed in claim 1 , further comprising:
determining the coefficient matrix using a calibration.

7. The method as claimed in claim 1 , further comprising:
determining the coefficient matrix using a trained neural network.

8. The sensor arrangement as claimed in claim 2 , wherein the crystal lattice is a diamond.

9. The sensor arrangement as claimed in claim 8 , wherein the at least one defect is formed as a nitrogen defect or a nitrogen-vacancy center (“NV center”).

10. The sensor arrangement as claimed in claim 2 , further comprising:
at least one microwave source.

Assignees

• Bosch Gmbh Robert

Inventors

• Brenneis Andreas
• Fuchs Tino
• Stuerner Felix Michael
• Roelver Robert

Classifications

• G01R33/032

  using magneto-optic devices, e.g. Faraday {or Cotton-Mouton effect} · CPC title

• G01R33/0206

  Three-component magnetometers · CPC title

• G01R33/1284

  Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices · CPC title

• G01R15/14

  Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks · CPC title

• G01R15/207

  Constructional details independent of the type of device used · CPC title