Method of finding optimized analog measurement hardware settings as well as method of measuring a device under test

Patent metadata

Field	Value
Publication number	US-12140630-B2
Application number	US-202117547681-A
Country	US
Kind code	B2
Filing date	Dec 10, 2021
Priority date	Dec 10, 2021
Publication date	Nov 12, 2024
Grant date	Nov 12, 2024

Abstract

Embodiments of the present disclosure relate to methods of finding optimized analog measurement hardware settings of a measurement system for a target measurement. The method can include one or more of the following steps: applying initial settings to the measurement system; varying the settings over a power sweep while processing a test signal used for the target measurement or a representative signal; performing the target measurement during the power sweep, thereby determining a hardware contribution of the measurement system over the power sweep; and identifying the respective settings that lead to a minimum hardware contribution of the measurement system at various powers.

First claim

The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows:

1. A method of finding optimized analog measurement hardware settings of a measurement system for a target measurement, the method comprising:
applying initial settings to the measurement system;
varying the settings over a power sweep while processing a test signal used for the target measurement or a representative signal;
performing the target measurement during the power sweep, thereby determining a hardware contribution of the measurement system over the power sweep; and
identifying the respective settings that lead to a minimum hardware contribution of the measurement system at various powers, wherein the power sweep is a stepped power sweep such that the power is altered in a stepwise manner during the power sweep.

2. The method of claim 1 , wherein settings are saved that lead to a low hardware contribution of the measurement system at specific power levels.

3. The method of claim 2 , wherein the specific power levels correspond to the ones that will be used when performing the target measurement of a device under test.

4. The method of claim 1 , wherein the settings comprise a setting for at least one attenuator of the measurement system, a setting for a reference level used by the measurement system, and/or a setting of at least one pre-amplifier of a measurement system.

5. The method of claim 1 , wherein the settings applied on the waveform and/or frequency of the test signal used in the target measurement.

6. The method of claim 1 , wherein functional dependencies of the settings with respect to the power level are determined.

7. The method of claim 1 , wherein at least one additional component is added to the measurement system, which is also taken into consideration when finding the optimized settings.

8. A method of measuring a device under test, wherein the method of finding optimized analog measurement hardware settings of a measurement system for a target measurement according to claim 1 is performed, thereby obtaining optimized settings to be applied for the target measurement, and wherein the obtained settings are applied for at least one specific power level.

9. The method of claim 8 , wherein a power measurement of the device under test is performed prior to applying the obtained settings, and wherein the power measurement of the device under test reveals an output power of the device under test.

10. The method of claim 9 , wherein the settings are applied that match with the output power of the device under test.

11. A method of measuring a device under test, the method comprising:
finding optimized analog measurement hardware settings of a measurement system for a target measurement, wherein said finding optimized analog measurement hardware settings includes:
applying initial settings to the measurement system;
varying the settings over a power sweep while processing a test signal used for the target measurement or a representative signal;
performing the target measurement during the power sweep, thereby determining a hardware contribution of the measurement system over the power sweep; and
identifying the respective settings that lead to a minimum hardware contribution of the measurement system at various powers;

performing a power measurement of the device under test, wherein the power measurement of the device under test reveals an output power of the device under test; thereafter
applying said identified settings for at least one specific power level, wherein said identified settings are applied that match with the output power of the device under test.

Assignees

• Rohde & Schwarz

Inventors

• Tipton Darren
• Simon Michael
• Ramian Florian
• Breinbauer Martin

Classifications

• G01R31/318575 Primary

  Power distribution; Power saving · CPC title

• G01R31/3191

  Calibration · CPC title

• G01R31/31901 Primary

  Analysis of tester Performance; Tester characterization · CPC title