Electronic component testing system and time certification method

Patent metadata

Field	Value
Publication number	US-12135350-B2
Application number	US-202117315313-A
Country	US
Kind code	B2
Filing date	May 9, 2021
Priority date	May 11, 2020
Publication date	Nov 5, 2024
Grant date	Nov 5, 2024

Abstract

Herein disclosed are an electronic component testing system and a time certification method. The electronic component testing system comprising a testing device and an interface device. The testing device comprises a backboard, and the backboard electrically connected to at least one test board and comprising a time certification component. The interface device, electrically connected to the testing device, provides a test instruction. Wherein the time certification component stores an authorization start time and an authorization end time. Wherein the testing device starts a test procedure according to the test instruction, the time certification component updates the authorization start time to a first stop time of the test procedure after the test procedure is completed.

First claim

What is claimed is:

1. An electronic component testing system, comprising:
a testing device comprising a backboard, electrically connected to at least one test board and comprising a time certification component; and
an interface device, electrically connected to the testing device, providing a test instruction;
wherein the time certification component stores an authorization start time and an authorization end time;
wherein the testing device starts a test procedure according to the test instruction, the time certification component updates the authorization start time to a first stop time of the test procedure after the test procedure is completed.

2. The electronic component testing system according to claim 1 , wherein when the testing device receives the test instruction, the time certification component checks whether a first execution time of the test instruction is later than the authorized start time to determine whether the testing device starts the test procedure.

3. The electronic component testing system according to claim 2 , wherein when the first execution time is later than the authorization start time, the time certification component generates a certification pass signal, and the testing device starts the test procedure according to the certification pass signal.

4. The electronic component testing system according to claim 3 , wherein when the first execution time is not later than the authorization start time, the time certification component does not generate the certification pass signal.

5. The electronic component testing system according to claim 2 , wherein when the testing device receives the test instruction, the time certification component checks whether the first execution time of the test instruction is earlier than the authorized end time to determine whether the testing device starts the test procedure.

6. The electronic component testing system according to claim 5 , wherein when the first execution time is earlier than the authorized end time, the time certification component generates a certification pass signal, and the testing device starts the test procedure according to the certification pass signal.

7. The electronic component testing system according to claim 6 , wherein when the first execution time is not earlier than the authorized end time, the time certification component does not generate the certification pass signal.

8. The electronic component testing system according to claim 1 , wherein before the time certification component updates the authorization start time to the first stop time, the time certification component checks whether the first execution time of the test instruction is earlier than the first stop time.

9. The electronic component testing system according to claim 8 , wherein when the first execution time is not earlier than the first stop time, the time certification component adds an internal timing value to the first execution time to obtain a real stop time, and the time certification component updates the authorization start time to the real stop time.

10. A time certification method, comprising:
providing a time certification component storing an authorization start time and an authorization end time;
starting a test procedure according to a test instruction; and
updating the authorization start time to a first stop time of the test procedure by the time certification component after the test procedure is completed.

11. The time certification method according to claim 10 , wherein in the step of starting the test procedure according to the test instruction, further comprising:
checking whether a first execution time of the test instruction is later than the authorized start time by the time certification component;
generating a certification pass signal by the time certification component when the first execution time is later than the authorization start time; and
starting the test procedure according to the certification pass signal.

12. The time certification method according to claim 11 , wherein when the first execution time is not later than the authorization start time, the time certification component does not generate the certification pass signal.

13. The time certification method according to claim 11 , wherein in the step of starting the test procedure according to the test instruction, further comprising:
checking whether a first execution time of the test instruction is earlier than the authorized end time by the time certification component;
generating a certification pass signal by the time certification component when the first execution time is earlier than the authorized end time; and
starting the test procedure according to the certification pass signal.

14. The time certification method according to claim 13 , wherein when the first execution time is not earlier than the authorized end time, the time certification component does not generate the certification pass signal.

15. The time certification method according to claim 10 , wherein before the step of updating the authorization start time to the first stop time of the test procedure, further comprising:
checking whether a first execution time of the test instruction is earlier than the first stop time by the time certification component;
adding an internal timing value to the first execution time to obtain a real stop time by the time certification component when the first execution time is not earlier than the first stop time; and
updating the authorization start time to the real stop time by the time certification component.

Assignees

• Yang Tzu Ching
• Lin Shih Chao
• Chroma Ate Inc

Inventors

• Yang Tzu-Ching
• Lin Shih-Chao

Classifications

• G01R31/2849

  Environmental or reliability testing, e.g. burn-in or validation tests (of individual semiconductors G01R31/2642; of printed circuits boards G01R31/2817; of IC's G01R31/2855) · CPC title

• G01R31/31726

  Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals · CPC title

• G01R31/31719

  Security aspects, e.g. preventing unauthorised access during test · CPC title

• G01R31/287

  Procedures; Software aspects · CPC title

• G01R31/2889 Primary

  Interfaces, e.g. between probe and tester (G01R31/31905 and G01R1/07364 take precedence) · CPC title