Laterally grown edge emitting laser
US-10096975-B1 · Oct 9, 2018 · US
US12126142B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12126142-B2 |
| Application number | US-201917292975-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 25, 2019 |
| Priority date | Nov 20, 2018 |
| Publication date | Oct 22, 2024 |
| Grant date | Oct 22, 2024 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A nitride semiconductor laser device of one embodiment of the present disclosure includes a single-crystal substrate, a base layer, a sheet-shaped structure, a light emitting layer, and a resonator mirror. The single-crystal substrate extends in one direction. The base layer is provided on the single-crystal substrate and includes a nitride semiconductor. The sheet-shaped structure is provided on the base layer to stand in a direction perpendicular to the base layer. The sheet-shaped structure has an area of a side surface that is greater than an area of an upper surface. The side surface extends in a longitudinal direction of the single-crystal substrate. The sheet-shaped structure includes a nitride semiconductor. The light emitting layer is provided at least on the side surface of the sheet-shaped structure. The light emitting layer includes a nitride semiconductor. The resonator mirror is provided by a pair of end surfaces of the sheet-shaped structure that oppose each other in the longitudinal direction.
Opening claim text (preview).
The invention claimed is: 1. A nitride semiconductor laser device, comprising: a single-crystal substrate that extends in one direction; a base layer on the single-crystal substrate, wherein the base layer includes a nitride semiconductor; a sheet-shaped structure on the base layer to stand in a direction perpendicular to the base layer, wherein the sheet-shaped structure has an area of a side surface that is greater than an area of an upper surface, the side surface extends in a longitudinal direction of the single-crystal substrate, the sheet-shaped structure includes a nitride semiconductor, and a dopant concentration of the sheet-shaped structure differs based on a growth direction; a light emitting layer at least on the side surface of the sheet-shaped structure, wherein the light emitting layer includes a nitride semiconductor; and a resonator mirror that comprises a pair of end surfaces of the sheet-shaped structure, wherein a first end surface of the pair of end surfaces is opposite to a second end surface of the pair of end surfaces in the longitudinal direction. 2. The nitride semiconductor laser device according to claim 1 , wherein a crystal structure of the nitride semiconductor included in the sheet-shaped structure is a wurtzite structure, and the light emitting layer is on a non-polar {11-20} plane of the side surface of the sheet-shaped structure or on a semipolar plane in a range of greater than or equal to −32 degrees and less than or equal to +32 degrees with respect to the non-polar {11-20} plane. 3. The nitride semiconductor laser device according to claim 1 , wherein a crystal structure of the nitride semiconductor included in the sheet-shaped structure is a wurtzite structure, and the light emitting layer is on a non-polar {1-100} plane of the side surface of the sheet-shaped structure or on a semipolar plane in a range of greater than or equal to −28 degrees and less than or equal to +28 degrees with respect to the non-polar {1-100} plane. 4. The nitride semiconductor laser device according to claim 1 , wherein a magnitude relationship between lattice constants of the base layer, lattice constants of the sheet-shaped structure, and lattice constants of the light emitting layer satisfies expressions (1) and (2), (ax, cx) are the lattice constants of the nitride semiconductor included in the base layer, (ay, cy) are the lattice constants of the nitride semiconductor included in the sheet-shaped structure, and (az, cz) are the lattice constants of the nitride semiconductor included in the light emitting layer, ax≤ay (1) cy≤cz (2). 5. The nitride semiconductor laser device according to claim 1 , wherein a composition of the nitride semiconductor included in the base layer is Alx1Gax2Inx3N, a composition of the nitride semiconductor included in the sheet-shaped structure is Aly1Gay2Iny3N, and a composition of the nitride semiconductor included in the light emitting layer is Alz1Gaz2Inz3N, and In compositions in the base layer, the sheet-shaped structure, and the light emitting layer satisfy an expression (3), Z 3> Y 3> X 3>0 (3) (X1+X2+X3=1, Y1+Y2+Y3=1, Z1+Z2+Z3=1, 0≤{X1, X2, X3, Y1, Y2, Y3, Z1, Z2, Z3}≤1). 6. The nitride semiconductor laser device according to claim 1 , wherein the light emitting layer has a single layer. 7. The nitride semiconductor laser device according to claim 1 , wherein the light emitting layer has at least two layers. 8. The nitride semiconductor laser device according to claim 1 , wherein the light emitting layer has a single layer and includes quantum dots. 9. The nitride semiconductor laser device according to claim 1 , wherein the light emitting layer has at least two layers and includes quantum dots. 10. The nitride semiconductor laser device according to claim 1 , wherein the dopant concentration of the sheet-shaped structure varies continuously in the growth direction. 11. The nitride semiconductor laser device according to claim 1 , wherein the dopant concentration of the sheet-shaped structure varies in a stepwise manner in the growth direction. 12. The nitride semiconductor laser device according to claim 1 , wherein the dopant concentration of the sheet-shaped structure is maximum at an end in the growth direction. 13. The nitride semiconductor laser device according to claim 1 , wherein the dopant concentration of the sheet-shaped structure is maximum in middle in the growth direction. 14. The nitride semiconductor laser device according to claim 1 , wherein a light emission wavelength of the light emitting layer is longer than or equal to 200 nanometers and shorter than or equal to 1800 nanometers. 15. The nitride semiconductor laser device according to claim 1 , wherein each of the base layer and the light emitting layer includes an n-type nitride semiconductor, and the nitride semiconductor laser device further includes a p-type nitride semiconductor layer and a p-type electrode in order in a vicinity of the light emitting layer. 16. The nitride semiconductor laser device according to claim 15 , wherein the p-type electrode comprises a transparent electrode. 17. A method of manufacturing, comprising: in a nitride semiconductor laser device: providing a base layer on a single-crystal substrate that extends in one direction, the base layer including a nitride semiconductor; forming a sheet-shaped structure in a specific direction perpendicular to the base layer, the sheet-shaped structure having an area of a side surface that is greater than an area of an upper surface, the side surface extending in a longitudinal direction of the single-crystal substrate, the sheet-shaped structure including a nitride semiconductor; forming a light emitting layer at least on the side surface of the sheet-shaped structure, the light emitting layer including a nitride semiconductor, wherein the sheet-shaped structure has a dopant concentration that differs in accordance with a growth direction; and forming a resonator mirror on a pair of end surfaces of the sheet-shaped structure, wherein a first end surface of the pair of end surfaces is opposite to a second end surface of the pair of end surfaces in the longitudinal direction. 18. The method of manufacturing according to claim 17 , further comprising providing a mask layer with an opening on the base layer and growing a crystal from the opening in the specific direction perpendicular to a surface of the base layer. 19. The method of manufacturing according to claim 17 , further comprising the resonator mirror by cleaving or dry etching.
having a ridge or stripe structure · CPC title
characterised by the material · CPC title
Array arrangements, e.g. constituted by discrete laser diodes or laser bar (H01S5/42 takes precedence) · CPC title
characterised by the configuration · CPC title
asymmetric clading layers · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.