Component inspection system and method

US12117813B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12117813-B2
Application numberUS-202117497504-A
CountryUS
Kind codeB2
Filing dateOct 8, 2021
Priority dateOct 8, 2021
Publication dateOct 15, 2024
Grant dateOct 15, 2024

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  1. Title

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  2. Abstract

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for inspecting components includes providing a plurality of different three-dimensional component CAD models with each three-dimensional component CAD model of the plurality of different three-dimensional component CAD models sharing at least one common geometric feature. The method further includes generating an inspection sequence for the at least one common geometric feature, collecting feature manufacturing data for the at least one common geometric feature during manufacturing of a plurality of different components corresponding to the respective plurality of different three-dimensional component CAD models, analyzing the feature manufacturing data associated with the at least one common geometric feature, modifying the inspection sequence for the at least one common geometric feature based on the analyzed feature manufacturing data, and inspecting components based on the modified inspection sequence.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for inspecting components, the method comprising: providing a plurality of different three-dimensional component CAD models, each three-dimensional component CAD model of the plurality of different three-dimensional component CAD models sharing at least one common geometric feature, and each three-dimensional component CAD model of the plurality of different three-dimensional component CAD models is different than each other three-dimensional component CAD model of the plurality of different three-dimensional component CAD models for at least one geometric feature of the each three-dimensional component CAD model; generating an inspection sequence for the at least one common geometric feature; collecting feature manufacturing data for the at least one common geometric feature during manufacturing of a plurality of different components corresponding to the respective plurality of different three-dimensional component CAD models; analyzing the feature manufacturing data associated with the at least one common geometric feature; modifying the inspection sequence for the at least one common geometric feature based on the analyzed feature manufacturing data; and inspecting components based on the modified inspection sequence. 2. The method of claim 1 , wherein the at least one common geometric feature includes at least one geometric characteristic and wherein the inspection sequence for the at least one common geometric feature includes measuring the at least one geometric characteristic. 3. The method of claim 2 , wherein the at least one geometric characteristic includes a dimension of the at least one common geometric feature. 4. The method of claim 1 , wherein the at least one common geometric feature is a surface. 5. The method of claim 1 , wherein the inspection sequence includes an inspection frequency and a number of inspection measurements for the at least one common geometric feature. 6. The method of claim 5 , wherein the step of analyzing the feature manufacturing data includes determining one or both of a process capability (Cpk) and a process performance (Ppk) for the at least one common geometric feature. 7. The method of claim 6 , wherein the step of modifying the inspection sequence includes: identifying the one or both of the Cpk and the Ppk is greater than a predetermined threshold value; and reducing the inspection frequency for the at least one common geometric feature based on the identification of the one or both of the Cpk and the Ppk greater than the predetermined threshold value. 8. The method of claim 6 , wherein the step of modifying the inspection sequence includes: identifying the one or both of the Cpk and the Ppk is greater than a predetermined threshold value; and reducing the number of inspection measurements for the at least one common geometric feature based on the identification of the one or both of the Cpk and the Ppk greater than the predetermined threshold value. 9. The method of claim 1 , further comprising indexing the at least one common geometric feature by assigning the at least one common geometric feature a unique identification code identifying the at least one common geometric feature in each three-dimensional component CAD model of the plurality of different three-dimensional component CAD models sharing the at least one common geometric feature. 10. The method of claim 9 , further comprising storing the feature manufacturing data associated with the at least one common geometric feature as a dataset in a database and assigning the unique identification code to the dataset. 11. The method of claim 10 , wherein the feature manufacturing data includes an inspection history of the at least one common geometric feature. 12. A system for inspecting components, the system comprising: a processor; a database in signal communication with the processor; and memory in signal communication with the processor, the memory containing instructions recorded therein which, when executed by the processor, cause the processor to: collect component manufacturing data for at least one common geometric feature during manufacturing of a component, the component corresponding to a three-dimensional component CAD model which is one of a plurality of different three-dimensional component CAD models in the database sharing the at least one common geometric feature; analyze the component manufacturing data; modify an inspection frequency for an inspection sequence for the at least one common geometric feature based on the analyzed feature manufacturing data; retrieve an inspection history of the at least one common geometric feature from the database; determine whether at least one component geometric feature of the component, corresponding to the respective at least one common geometric feature, should be inspected based on the inspection history and the modified inspection frequency; and inspect the at least one component geometric feature corresponding to the respective at least one common geometric feature based on the determination that the at least one component geometric feature should be inspected. 13. The system of claim 12 , wherein analyzing the component manufacturing data includes determining whether the component manufacturing data includes an abnormal deviation. 14. The system of claim 13 , wherein the at least one common geometric feature has a unique identification code. 15. The system of claim 14 , wherein the memory contains instructions recorded therein which, when executed by the processor, further cause the processor to: store the component manufacturing data with feature manufacturing data which is stored as a dataset in the database, wherein the feature manufacturing data includes the inspection history and the dataset has the unique identification code. 16. The system of claim 12 , wherein the memory contains instructions recorded therein which, when executed by the processor, further cause the processor to: compare the inspection history to an inspection sequence for the at least one common geometric feature. 17. A method for inspecting components, the method comprising: manufacturing a component, the component corresponding to a three-dimensional component CAD model which is one of a plurality of different three-dimensional component CAD models sharing at least one common geometric feature; collecting component manufacturing data for the at least one common geometric feature during manufacturing of the component; analyzing the component manufacturing data; modifying an inspection frequency for an inspection sequence for the at least one common geometric feature based on the analyzed feature manufacturing data; retrieving an inspection history of the at least one common geometric feature; determining whether at least one component geometric feature of the component, corresponding to the respective at least one common geometric feature, should be or should not be inspected based on the inspection history and the modified inspection frequency; and inspecting the at least one component geometric feature corresponding to the respective at least one common geometric feature based on the determination that the at least one component geometric feature should be inspected. 18. The method of claim 17 , wherein the step of analyzing the component manufacturing data includes determining whether the component manufacturing data includes an abnormal deviation. 19. The method of claim 17 , further comprising comparing the inspection his

Assignees

Inventors

Classifications

  • Store audit, history of inspection, control and workpiece data into database · CPC title

  • 3-D cad-cam · CPC title

  • Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS] · CPC title

  • Manufacturability analysis or optimisation for manufacturability · CPC title

  • Mechanical parametric or variational design · CPC title

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What does patent US12117813B2 cover?
A method for inspecting components includes providing a plurality of different three-dimensional component CAD models with each three-dimensional component CAD model of the plurality of different three-dimensional component CAD models sharing at least one common geometric feature. The method further includes generating an inspection sequence for the at least one common geometric feature, collec…
Who is the assignee on this patent?
Pratt & Whitney Canada
What technology area does this patent fall under?
Primary CPC classification G05B19/41875. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 15 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).