Method and electronic device for monitoring a manufacturing of a metal product, related computer program and installation

US12111642B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12111642-B2
Application numberUS-201917273612-A
CountryUS
Kind codeB2
Filing dateSep 6, 2019
Priority dateSep 6, 2018
Publication dateOct 8, 2024
Grant dateOct 8, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for monitoring a manufacturing of a metal product, the metal product being manufactured according to a manufacturing process, is implemented by an electronic monitoring device. This method includes acquiring (100) a measured value of at least one representative parameter, each representative parameter being a parameter relating to the metal product or a parameter relating to the manufacturing process, determining (130) a status of the metal product among a compliant status and an analysis status, depending on the at least one acquired value and on at least one target, and when the determined status is the analysis status, computing (150) a corrective action to be applied to the product, among a set of corrective actions and depending on the at least one acquired value, the set of corrective actions including a product repair, a product downgrading, a product expertise and a product acceptance.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for monitoring a manufacturing of a metal product, the metal product being manufactured according to a manufacturing process, the manufacturing process including a manufacturing route of a manufacturing line for obtaining a final metal product with final characteristics, the manufacturing route comprising one or several intermediate metal products, each one with intermediate characteristics, and the metal product whose manufacturing is monitored being the final metal product, the metal product being chosen from among a group consisting of a slab, a coil, a beam, a bloom, a billet, and a steel product, the monitoring method being implemented by an electronic monitoring device on the manufacturing line that is connected to at least one sensor of the manufacturing line and comprising the following steps: acquiring, from the at least one sensor, a measured value of at least one representative parameter, each representative parameter being a parameter relating to the final metal product or a parameter relating to the manufacturing process; determining a status of the final metal product among a compliant status and an analysis status, depending on the at least one acquired measured value and on at least one target; and when the determined status is the analysis status, computing a corrective action to be applied to the final metal product, among a set of corrective actions and depending on the at least one acquired measured value, the set of corrective actions including a product repair, a product downgrading, a product expertise and a product acceptance. 2. The method according to claim 1 , further comprising validating at least one value validated from among the at least one acquired measured value according to a coherence test, the status of the product being then determined on the basis of the at least one value validated from among the at least one acquired measured value. 3. The method according to claim 2 , further comprising of modeling at least one characteristic of the metal product from the at least one value which have been validated from among the at least one acquired measured value, the status of the product being determined further on the modeled at least one characteristic. 4. The method according to claim 1 , wherein each parameter relating to the metal product is a parameter from among the group consisting of: a parameter relating to mechanical properties of the product, a parameter relating to a roughness of the product, a parameter relating to a chemical composition of the product, a parameter relating to the properties of a coating of the product, a parameter relating to dimensions of the product, a parameter relating to a surface aspect of the product and a parameter relating to defectology of the product. 5. The method according to claim 1 , wherein each parameter relating to the manufacturing process is a parameter depending on a type of the manufacturing process. 6. The method according to claim 1 , wherein the step of computing the corrective action comprises comparing the at least one acquired measured value with a respective predefined acceptability range of values and identifying an abnormality event for each acquired measured value outside the respective predefined acceptability range of values, wherein each abnormality event is associated to an elementary zone of the metal product, the elementary zone having a length along the longitudinal direction, each elementary zone with at least one abnormality event being identified as an abnormality elementary zone, and when a cumulated length of all the abnormality elementary zones is greater than a predefined percentage of a length of the metal product, the computed corrective action is a product downgrading, otherwise, when the cumulated length of all the abnormality elementary zones is lower than or equal to said predefined percentage of the length of the metal product, the computed corrective action is a product repair. 7. The method according to claim 1 , wherein the step of determining the status of the metal product comprises comparing the at least one acquired measured value with a respective predefined compliant range of values, each respective predefined compliant range of values depending on the corresponding at least one target, the determined status being the compliant status if said at least one acquired measured value belong to the respective predefined compliant range of values, the determined status being otherwise the analysis status. 8. The method according to claim 7 , wherein the step of computing the corrective action comprises comparing at least one acquired measured value with a respective predefined acceptability range of values, each respective predefined acceptability range of values depending on the corresponding at least one target and including the corresponding predefined compliant range of values, for at least one parameter the predefined acceptability range strictly including the predefined compliant range of values, the computed corrective action being equal to the product expertise if the metal product is tagged as a specific product or the corresponding parameter is tagged as specific and if said at least one acquired measured value belongs to the respective predefined acceptability range of values. 9. The method according to claim 8 , wherein the computed corrective action is equal to the product acceptance if the metal product is not tagged as a specific product and the corresponding parameter is not tagged as specific and if said at least one acquired measured value belong to the respective predefined acceptability range of values. 10. The method according to claim 7 , wherein the step of computing the corrective action comprises comparing the at least one acquired measured value with a respective predefined acceptability range of values, each respective predefined acceptability range of values depending on the corresponding at least one target and being disjoint from the corresponding predefined compliant range of values, the computed corrective action being equal to the product expertise if the metal product is tagged as a specific product or the corresponding parameter is tagged as specific and if said at least one acquired measured value belongs to the respective predefined acceptability range of values. 11. The method according to claim 10 , wherein the computed corrective action is equal to the product acceptance if the metal product is not tagged as a specific product and the corresponding parameter is not tagged as specific and if said at least one acquired measured value belongs to the respective predefined acceptability range of values. 12. The method according to claim 7 , wherein the step of computing the corrective action comprises identifying an abnormality event for each acquired measured value outside the respective predefined acceptability range of values, the computed corrective action then depending on at least one worst abnormality event, the at least one worst abnormality event being the one or more with a greatest deviation with respect to the corresponding predefined acceptability range of values. 13. A method of manufacturing a metal product comprising: performing the monitoring method according to claim 1 ; and applying the computed corrective action to the final metal product. 14. A non-transitory computer-readable medium comprising a computer program including software instructions which, when executed by a processor, implement the method according to claim 1 . 15. An electronic monitoring device for monitoring a manufacturing of a metal product, the metal p

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Classifications

  • by heating · CPC title

  • with means for measuring or sensing · CPC title

  • Computer-controlled implementation · CPC title

  • Snouts · CPC title

  • characterised by the pre-treatment chambers located immediately upstream of the bath or occurring locally before the dipping process · CPC title

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What does patent US12111642B2 cover?
A method for monitoring a manufacturing of a metal product, the metal product being manufactured according to a manufacturing process, is implemented by an electronic monitoring device. This method includes acquiring (100) a measured value of at least one representative parameter, each representative parameter being a parameter relating to the metal product or a parameter relating to the manufa…
Who is the assignee on this patent?
Arcelormittal
What technology area does this patent fall under?
Primary CPC classification G05B19/41875. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 08 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).