Analyzing quality of sensed force-response data during testing and mitigation poor quality output

US12104987B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12104987-B2
Application numberUS-202217583756-A
CountryUS
Kind codeB2
Filing dateJan 25, 2022
Priority dateJan 25, 2022
Publication dateOct 1, 2024
Grant dateOct 1, 2024

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Abstract

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Systems and methods for automated MIMO force-response characterization of a structure-under-test. The structure-under-test is coupled to a plurality of exciter devices and a plurality of response sensors. An excitation signal is automatically and iteratively applied to each exciter device while sensor data is collected from each response sensor to collect response data for a plurality of different exciter-sensor combinations (i.e., response data collected by a single response sensor while the excitation signal is applied to a single exciter device). A signal quality test is applied to the collected sensor data and, in response to determining that the collected response data for a particular exciter-sensor combination is of insufficient quality, the data collection for that exciter-sensor combination is automatically repeated. The excitation signal can be automatically adjusted before repeating the data collection to improve the quality of the collected data for the exciter-sensor combination.

First claim

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What is claimed is: 1. A method of automated MIMO force-response characterization of a structure-under-test, the method comprising: coupling the structure-under-test to a plurality of exciter devices and a plurality of response sensors; generating an excitation signal; automatically applying the excitation signal iteratively to each exciter device of the plurality of exciter devices, wherein applying the excitation signal to an exciter device causes the exciter device to impart an excitation force to the structure-under-test; collecting sensor data from each response sensor of the plurality of response sensors while iteratively applying the excitation signal to the plurality of exciter devices, wherein the collected sensor data includes response data for each of a plurality of different exciter-sensor combinations, wherein the response data for each of the plurality of different exciter-sensor combinations includes the sensor data collected by a single response sensor while the excitation force is imparted to the structure-under-test by a single exciter device; applying a signal quality test to the collected sensor data to determine whether the collected response data for a first exciter-sensor combination of the plurality of different exciter-sensor combinations does not satisfy a defined signal quality condition; and repeating a data collection for the first exciter-sensor combination in response to determining that the collected response data for the first exciter-sensor combination does not satisfy the defined signal quality condition, wherein repeating the data collection for the first exciter-sensor combination includes applying the excitation signal to a first exciter device of the first exciter-sensor combination and collecting updated sensor data from a first response sensor of the first exciter-sensor combination while the excitation signal is applied to the first exciter device. 2. The method of claim 1 , wherein repeating the data collection for the first exciter-sensor combination further includes adjusting the excitation signal, and wherein repeating the data collection for the first exciter-sensor combination include applying the excitation signal to the first exciter device by applying the adjusted excitation signal to the first exciter device, and collecting the updated sensor data from the first response sensor by collecting the updated sensor data from the first response sensor while the adjusted excitation signal is applied to the first exciter device. 3. The method of claim 2 , wherein applying the excitation signal iteratively to each exciter device of the plurality of exciter devices includes applying a white-noise excitation signal, wherein applying the signal quality test includes analyzing a frequency spectrum signal-to-noise ratio of the response data for the first exciter-sensor combination, and wherein repeating the data collection for the first exciter-sensor combination includes repeating the data collection for the first exciter-sensor combination in response to determining that the frequency spectrum signal-to-noise ratio of the response data for the first exciter-sensor combination is below a threshold, and adjusting the excitation signal by changing a type of the excitation signal from the white-noise excitation signal to at least one selected from a group consisting of a logarithmic sweep excitation signal and a linear sweep excitation signal. 4. The method of claim 2 , wherein applying the signal quality test includes analyzing a frequency domain magnitude of the response data for the first exciter-sensor combination in a defined frequency range, and wherein repeating the data collection for the first exciter-sensor combination includes repeating the data collection in response to determining that the frequency domain magnitude of the response data for the first exciter-sensor combination in the defined frequency range exceeds a threshold, and adjusting the excitation signal by applying a frequency filter to the excitation signal, wherein the frequency filter includes at least one selected from a group consisting of a low-pass filter, a high-pass filter, and a band-pass filter, wherein the frequency filter is configured to filter out components of the excitation signal corresponding to the defined frequency range used in the signal quality test. 5. The method of claim 2 , wherein adjusting the excitation signal includes at least one selected from a group consisting of applying a multiple sine sweep excitation signal, and adjusting at least one parameter of the multiple sine sweep excitation signal. 6. The method of claim 1 , wherein applying the signal quality test includes applying at least one selected from a group consisting of signal conditioning statistical analysis, signal-to-noise ratio analysis, coherence function analysis, data consistency analysis, and interface completeness criterion analysis. 7. The method of claim 1 , further comprising: calculating a frequency response function for each exciter-sensor combination of the plurality of different exciter-sensor combinations, the frequency response function including a ratio of the excitation force applied by the exciter device of the exciter-sensor combination and the sensed excitation force sensed by the response sensor of the exciter-sensor combination, wherein calculating the frequency response function for each exciter-sensor combination of the plurality of different exciter-sensor combinations includes determining a frequency response function for the first exciter-sensor combination based on the updated sensor data collected by the first response sensor after repeating the data collection for the first exciter-sensor combination; and determining a system response function based on a plurality of frequency response functions including the calculated frequency response function for each exciter-sensor combination, wherein determining the system response function based on the plurality of frequency response functions includes populating a system response function matrix with the plurality of frequency response functions. 8. The method of claim 1 , further comprising: applying a set quality test to a set of collected response data to determine whether the set of collected response data does not satisfy a set quality condition, wherein the set of collected response data includes the collected response data for the first exciter-sensor combination and collected response data for a plurality of exciter-sensor combinations collected before the collected response data for the first exciter-sensor combination; and repeating a data collection for one or more exciter-sensor combinations of the plurality of exciter-sensor combinations in response to determining that the set of collected response data does not satisfy the set quality condition. 9. The method of claim 1 , wherein the response data for each of the plurality of different exciter-sensor combinations includes acceleration response data collected by the single response sensor while the excitation force is imparted to the structure-under-test by the single exciter device and applied force data collected by a load cell corresponding to the single exciter device, wherein the applied force data is indicative of an actual excitation force applied to the structure-under-test by the single exciter device. 10. The method of claim 1 , wherein collecting the sensor data from each response sensor of the plurality of response sensors while iteratively applying the excitation signal to the plurality of exciter devices includes iteratively coupling each response sensor of the plurality of response sensors to an input channel of a data acquisition system

Assignees

Inventors

Classifications

  • G01M99/008Primary

    by doing functionality tests · CPC title

  • Vibration-testing {by means of a shake table} · CPC title

  • Testing or calibrating of detectors covered by the subgroups of G01H3/00 (calibrating geophysical instruments, e.g. seismic receivers G01V13/00) · CPC title

  • G01H1/00Primary

    Measuring {characteristics of} vibrations in solids by using direct conduction to the detector (G01H9/00, G01H11/00 take precedence) · CPC title

  • Vibration-testing of structures; Shock-testing of structures (G01M9/00 takes precedence) · CPC title

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What does patent US12104987B2 cover?
Systems and methods for automated MIMO force-response characterization of a structure-under-test. The structure-under-test is coupled to a plurality of exciter devices and a plurality of response sensors. An excitation signal is automatically and iteratively applied to each exciter device while sensor data is collected from each response sensor to collect response data for a plurality of differ…
Who is the assignee on this patent?
Bosch Gmbh Robert
What technology area does this patent fall under?
Primary CPC classification G01M99/008. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Oct 01 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 10 related publications on this page (citations in our corpus or others sharing the same primary CPC).