Substrate cleaning method and apparatus

US12100586B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12100586-B2
Application numberUS-201917755505-A
CountryUS
Kind codeB2
Filing dateNov 1, 2019
Priority dateNov 1, 2019
Publication dateSep 24, 2024
Grant dateSep 24, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for cleaning a substrate with pattern structures comprises the following steps: using gas-liquid atomization to clean a substrate surface (601); using TEBO megasonic to clean the substrate surface (602); and drying the substrate (603). The TEBO megasonic cleaning is used to remove small size particles on the substrate and the gas-liquid atomization cleaning is used to remove large size particles on the substrate. The method enables achieving an effect of cleaning the substrate without or with less device damage. A substrate cleaning apparatus is also provided.

First claim

Opening claim text (preview).

What is claimed is: 1. An apparatus for cleaning a substrate with pattern structures, comprising: a substrate holding device, configured to hold a substrate; a mega sonic cleaning device, configured to provide a cleaning liquid to the substrate, and apply mega sonic waves to the substrate, a power of the mega sonic waves is 10 to 50 watts; a gas-liquid atomization cleaning device, configured to provide gas-liquid atomization cleaning, a gas flow rate of the gas-liquid atomization cleaning is 20 to 40 lpm; and a process chamber, wherein the substrate holding device, the mega sonic cleaning device and the gas-liquid atomization cleaning device are located in the process chamber, wherein: the mega sonic cleaning device comprises: a shielding cover; a mega sonic device; a connecting arm; and a nozzle device, wherein the nozzle device comprises at least one nozzle configured to discharge liquid onto the substrate, the gas-liquid atomization cleaning device comprises: a fixing member; and a gas-liquid atomization device comprising a liquid inlet pipe, a gas inlet pipe, and a jet-spray nozzle, the mega sonic device is fixed at the bottom of the shielding cover, a first side of the shielding cover is connected to the connecting arm, a second side of the shielding cover is connected to the nozzle device, a first side of the fixing member is connected to the nozzle device, and a second side of the fixing member is connected to the gas-liquid atomization device such that the nozzle device is positioned between the shielding cover and the gas-liquid atomization device, and wherein the connecting arm is configured to support the mega sonic device, the nozzle device, and the gas-liquid atomization device above the substrate such that movement of the connecting arm can cause movement of the mega sonic device, the nozzle device, and the gas-liquid atomization device above the substrate. 2. The apparatus according to claim 1 , wherein the mega sonic cleaning device comprises: a connecting spindle, being connected to the connecting arm; and a driving mechanism, being connected to the connecting spindle for driving the connecting spindle to rotate and move up and down. 3. The apparatus according to claim 1 , wherein the mega sonic cleaning device is capable of removing small size particles, the size of small particles is 0.5 um or less than 0.5 um. 4. The apparatus according to claim 1 , wherein the gas-liquid atomization cleaning device is capable of removing large size particles, the size of large particles is greater than 0.5 um.

Assignees

Inventors

Classifications

  • using mainly spraying means, e.g. nozzles · CPC title

  • H10P70/20Primary

    Cleaning during device manufacture · CPC title

  • Polymers · CPC title

  • by sonic or ultrasonic vibrations · CPC title

  • Cleaning travelling work · CPC title

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Frequently asked questions

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What does patent US12100586B2 cover?
A method for cleaning a substrate with pattern structures comprises the following steps: using gas-liquid atomization to clean a substrate surface (601); using TEBO megasonic to clean the substrate surface (602); and drying the substrate (603). The TEBO megasonic cleaning is used to remove small size particles on the substrate and the gas-liquid atomization cleaning is used to remove large size…
Who is the assignee on this patent?
Acm Research Shanghai Inc
What technology area does this patent fall under?
Primary CPC classification H10P72/0414. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 24 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).