Methods and devices for processing and retrieving defect information of product

Patent metadata

Field	Value
Publication number	US-12092587-B2
Application number	US-202117765595-A
Country	US
Kind code	B2
Filing date	Apr 30, 2021
Priority date	Apr 30, 2021
Publication date	Sep 17, 2024
Grant date	Sep 17, 2024

Abstract

The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.

First claim

The invention claimed is:

1. A method for processing defect information of a product, the product comprising a plurality of film layers, and the method comprising:
acquiring defect information on a current film layer and defect information on historical film layers, where the historical film layers were formed before formation of the current film layer;
determining a target location in the current film layer for the defect information, and determining whether defect information exists for a corresponding location to the target location in any of the historical film layers;
if defect information exists for the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and
if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer;
wherein the method further comprising:
storing recorded defect information in a first data table;
aggregating data in the first data table according to information on processing procedures in a manufacturing process so as to obtain a second data table; and
retrieving data in the second data table according to a received query instruction.

2. The method of claim 1 , wherein determining whether defect information exists for a corresponding location to the target location in any of the historical film layers comprises:
determining whether defect information exists for a range with a preset threshold distance from the target location in any of the historical film layers; and
if defect information exists, determining that defect information exists for a corresponding location to the target location in at least one of the historical film layers.

3. The method of claim 2 , wherein determining whether defect information exists for a range with a preset threshold distance from the target location in any of the historical film layers comprises:
if a defect in a row direction exists in the current film layer, determining whether defect information exists for a range with the preset threshold distance in a column direction from the target location in any of the historical film layers; and
if defect information exists, determining that defect information exists for a corresponding location to the target location in at least one of the historical film layers.

4. The method of claim 2 , wherein determining whether defect information exists for a range with a preset threshold distance from the target location in any of the historical film layers comprises:
if a defect in a column direction exists in the current film layer, determining whether defect information exists for a range with the preset threshold distance in a row direction from the target location in any of the historical film layers; and
if defect information exists, determining that defect information exists for a corresponding location to the target location in at least one of the historical film layers.

5. The method of claim 1 , wherein prior to acquiring defect information on a current film layer and defect information on historical film layers, the method further comprises:
determining a defect location of the defect information on the current film layer and information on cutting of a display panel at which the defect location is located;
according to historical information on cutting, determining an association relationship between a coordinate in the display panel and a coordinate in a glass substrate at which the display panel is located before cutting;
determining a location of the defect location in the glass substrate according to the association relationship.

6. The method of claim 1 , further comprising:
counting and then storing in the second data table at least one of the following items:
a ratio of a number of pieces of deleted defect information on the current film layer to a total number of pieces of defect information on the current film layer;
a ratio of a number of pieces of recorded defect information on the current film layer to a total number of pieces of defect information on the current film layer; and
a ratio of a number of pieces of recorded defect information on the current film layer to a number of pieces of defect information on all film layers.

7. The method of claim 1 , wherein prior to determining a target location in the current film layer for the defect information, the method further comprises:
aggregating the detected defect information according to a display panel to which the detected defect information belongs.

8. The method of claim 7 , wherein prior to aggregating the detected defect information according to a display panel to which the detected defect information belongs, the method further comprises:
reading historical defect information recorded for the historical film layers; and
loading the defect information detected in the current film layer into the historical defect information.

9. A method for retrieving defect information of a product, the product comprising a plurality of film layers, and the method comprising:
receiving a query instruction sent by a client;
retrieving defect information for the plurality of film layers according to the query instruction; and
generating front-end data according to a query result,
wherein the defect information for the plurality of film layers is determined by: acquiring defect information on a current film layer and defect information on historical film layers, where the historical film layers were formed before formation of the current film layer;
determining a target location for the defect information on the current film layer, and determining whether defect information exists for a corresponding location to the target location in any of the historical film layers; if defect information exists for the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer; wherein defect information in a data table includes recorded defect information; and
wherein prior to receiving a query instruction sent by a client, the method further comprises:
storing recorded defect information in a first data table; and
aggregating data in the first data table according to information on processing procedures in a manufacturing process so as to obtain a second data table.

10. The method of claim 9 , wherein if a distance between a defect location at which defect information exists in the historical film layer and the target location is less than a threshold distance, whether defect information exists at a corresponding location to the target location in the historical film layer is determined.

11. The method of claim 10 , wherein if a defect in a row direction exists in the current film layer, a first distance in a column direction between the defect location at which defect information exists in the historical film layer and a row of pixels corresponding to the defect in the row direction is determined; and if the first distance is less than a first threshold distance, that defect information exists at the corresponding location to the target location in the historical film layer is determined.

12. The method of claim 10 , wherein if a defect in a column direction exists in the current film layer, a second distance in a row direction between the defect location at which defect information exists in

Assignees

• Beijing Zhongxiangying Tech Co Ltd
• Boe Technology Group Co Ltd

Inventors

• Wang Haijin
• Wang Chuan
• Lan Tian
• Wu Jianmin
• Feng Yu
• Wang Hong
• Wang Yu
• Zhang Fan
• Ren Jiawei
• Xue Jing
• Zeng Jianfeng

Classifications

• G01N21/95 Primary

  characterised by the material or shape of the object to be examined (G01N21/89 - G01N21/91, G01N21/94 take precedence) · CPC title

• G05B19/41875 Primary

  characterised by quality surveillance of production · CPC title

• G01N2021/9511

  Optical elements other than lenses, e.g. mirrors · CPC title

• G02F1/13

  based on liquid crystals, e.g. single liquid crystal display cells · CPC title