Automatic analysis device, automatic analysis system, and automatic analysis method for analytes

Patent metadata

Field	Value
Publication number	US-12085582-B2
Application number	US-201917284763-A
Country	US
Kind code	B2
Filing date	Dec 2, 2019
Priority date	Jan 18, 2019
Publication date	Sep 10, 2024
Grant date	Sep 10, 2024

Abstract

The present invention comprises: an incubator disk 22 upon which a plurality of reaction containers holding a reaction solution being an analyte and a reagent that have been mixed and reacted are mounted; a immunoassay unit 23 that measures the physical properties of the reaction solution; and a planning unit 103 that determines the order for measurement of analyte requested to be executed by the immunoassay unit 23 . Measurement by the immunoassay unit 23 includes items having different measurement times. When measurement of sequence items having the longest measurement time will occur at least a prescribed number of times in a row, said prescribed number being at least two, the planning unit 103 provides at least one empty cycle after measurement has occurred at least the prescribed number of times.

First claim

The invention claimed is:

1. An automatic analyze system which analyzes a specimen, comprising:
at least two automatic analyze devices operating in conjunction and which are individually connected to two or more transport devices and analyze measurement items which are different from each other;
a transport device which supplies the specimen to the at least two automatic analyze devices, the transport device including a transport line and specimen rack waiting disk; and
a processor, a memory, and a storage in communication with the at least two automatic analyze devices and the transport device,
wherein the automatic analyze system further includes:
an incubator which is equipped with a plurality of reaction containers which hold reaction solution obtained by mixing and reacting the specimen with a reagent;
a detection circuit which measures a physical property of the reaction solution; and
a planning circuit which determines an order of a measurement of the specimen requested to be executed on the detection circuit,

the measurement in the detection circuit includes items with different measurement times,
the planning circuit provides at least one free cycle after the measurement of at least a predetermined number of times which is at least two, when continuously measuring an item of a sequence with the longest measurement time for at least the predetermined number of times,
the specimen is preferentially transported to a one of the at least two automatic analyze devices with a light load obtained by multiplying measurement time by a number of measurement items among the two or more sets of the automatic analyze devices, and
when the measurement item in the plurality of automatic analyze devices on the same specimen is requested, a waiting time is long at a dispensing position in the automatic analyze device on the side with the light load, and when dispensing in the other automatic analyze device of the same specimen is delayed, the specimen is transported to the other automatic analyze device first regardless of the load.

2. The automatic analyze system according to claim 1 , wherein
the planning circuit is further configured to interrupt in the measurement of an item of a sequence with a short measurement time in the free cycle when the item of the sequence with the short measurement time is requested.

3. The automatic analyze system according to claim 2 , further comprising:
a setting circuit which sets the predetermined number of times for provision of the free cycle.

4. The automatic analyze system according to claim 3 , wherein
the setting circuit is capable of manually setting the predetermined number of times to at least one of each day of a week, and each date and time.

5. The automatic analyze system according to claim 3 , wherein
the planning circuit calculates a ratio of the measurement of the specimen in the sequence with the short measurement time for each date and time or each day of a week from a past measurement status of the automatic analyze device, and automatically sets the predetermined number of times to provide the free cycle.

6. The automatic analyze system according to claim 5 , wherein
the manual setting of the predetermined number of times by the setting circuit and the automatic setting of the predetermined number of times by the planning circuit are switchable.

Assignees

• Hitachi High Tech Corp

Inventors

• SUENARI Tsukasa
• Akutsu Masashi
• Mishima Hiroyuki
• Setomaru Takeshi
• Yasui Akihiro

Classifications

• G01N35/02

  using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations {(G01N35/0098 and G01N35/0099 take precedence)} · CPC title

• G01N33/5302

  Apparatus specially adapted for immunological test procedures · CPC title

• G01N2035/00326

  Analysers with modular structure · CPC title

• G01N35/0092 Primary

  Scheduling · CPC title

• G01N35/0095 Primary

  introducing urgent samples with priority, e.g. Short Turn Around Time Samples [STATS] · CPC title