Electrolysis electrode
US-2016009574-A1 · Jan 14, 2016 · US
US12084782B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12084782-B2 |
| Application number | US-201715683587-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 22, 2017 |
| Priority date | Aug 26, 2016 |
| Publication date | Sep 10, 2024 |
| Grant date | Sep 10, 2024 |
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A heterojunction anode for electrolysis is disclosed. The anode has a first conductive metal oxide (FCMO) layer, a second semiconductor layer contacting the FCMO layer, and one or more islands of a third semiconductor contacting the second semiconductor layer. The FCMO layer may be formed on a metallic base, such as titanium. The FCMO layer may include iridium, the second semiconductor layer may include titanium oxide, and the third semiconductor may include tin oxide. The anode may be manufactured using spray pyrolysis to apply each semiconductor material. The anode may be configured such that when placed in an electrolyte at least a portion of the second semiconductor layer and the islands are in direct physical contact with the electrolyte. The second semiconductor interlayer and third semiconductor islands enhance the production of reactive chlorine in chlorinated water. A water treatment system and method using the anode are also disclosed.
Opening claim text (preview).
The invenion claimed is: 1. An electrolysis anode, comprising: a first conductive metal oxide layer comprising Ir 0.7 Ta 0.3 O 2 having a mass loading value selected from the group consisting of about 0.3 mg/cm 2 and about 0.05 mg/cm 2; a second semiconductor layer directly physically contacting the first conductive metal oxide layer, wherein the second semiconductor layer includes Co—TiO 2 ; and one or more islands of a third semiconductor contacting the second semiconductor layer, wherein the third semiconductor comprises antimony doped tin dioxide, wherein each of the islands has a general diameter of about 1 μM to 8 μM, wherein the islands cover about 50% of the surface area of the second semiconductor layer. 2. The anode of claim 1 , further comprising: a metal conductor contacting the first conductive metal oxide layer. 3. The anode of claim 2 , wherein the metal conductor is titanium. 4. A water purification system, comprising: an anode of claim 1 , wherein the second semiconductor layer contacting the first conductive metal oxide layer and configured to be, at least in part, in direct contact with water that includes chloride, and the one or more islands of a third semiconductor contacting the second semiconductor layer and configured to be in direct contact with the water. 5. The system of claim 4 , further comprising a stainless steel cathode. 6. The system of claim 4 , further comprising a voltage source connected to a cathode and the anode. 7. The system of claim 4 , further comprising an electrolysis vessel for holding the water, anode and a cathode. 8. An electrolysis anode, consisting essentially of: a first conductive metal oxide layer comprising Ir 0.7 Ta 0.3 O 2 having a mass loading value selected from the group consisting of about 0.3 mg/cm 2 and about 0.05 mg/cm 2; a second semiconductor layer directly physically contacting the first conductive metal oxide layer, wherein the second semiconductor layer includes Co—TiO 2 ; and one or more islands of a third semiconductor contacting the second semiconductor layer, wherein the third semiconductor comprises antimony doped tin dioxide, wherein each of the islands has a general diameter of about 1 μM to 8 μM, wherein the islands cover about 50% of the surface area of the second semiconductor layer.
Chlorine; Compounds thereof (by simultaneous production of alkali metal hydroxides and chlorine, oxyacids or salts of chlorine C25B1/34) · CPC title
with halogen or compound of halogens, e.g. chlorine, bromine · CPC title
Oxides; Hydroxides · CPC title
Compounds of tantalum · CPC title
Oxides; Hydroxides · CPC title
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