Tamper-resistant integrated circuits, and related methods
US-2021057357-A1 · Feb 25, 2021 · US
US12079377B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-12079377-B2 |
| Application number | US-202117189857-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 2, 2021 |
| Priority date | Mar 2, 2021 |
| Publication date | Sep 3, 2024 |
| Grant date | Sep 3, 2024 |
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Official abstract text for this publication.
A method, printed circuit board assembly (PCBA), and device comprising a PCBA are disclosed. The method includes obtaining a material comprising silver halide grains, incorporating the material into a PCBA having at least one component in contact with the material, detecting a variation in electrical properties of the at least one component that is above a threshold variation and, in response, enacting a data protection response. The PCBA includes a material comprising silver halide grains, at least one component in contact with the material, and a monitoring component. The monitoring component is configured to detect a variation in electrical properties of the at least one component that is above a threshold variation and, in response, enact a data protection response.
Opening claim text (preview).
What is claimed is: 1. A method, comprising: obtaining a material comprising silver halide grains; incorporating the material into a printed circuit board assembly (PCBA), the PCBA comprising at least one component in contact with the material; detecting a variation in electrical properties of the at least one component that is above a threshold variation; and in response to the detecting the variation, enacting a data protection response. 2. The method of claim 1 , wherein the enacting the data protection response comprises deleting data. 3. The method of claim 1 , wherein the enacting the data protection response comprises destroying circuit paths. 4. The method of claim 1 , wherein the enacting the data protection response comprises generating an alert. 5. The method of claim 1 , wherein the enacting the data protection response comprises mitigating damage caused by exposure to high energy radiation. 6. The method of claim 1 , further comprising detecting a second variation in the electrical properties of the at least one component that is above a second threshold variation. 7. The method of claim 1 , wherein the incorporating the material comprises emulsifying the material in a thermal interface material. 8. The method of claim 1 , wherein the incorporating the material comprises emulsifying the material in a conformal coating material. 9. The method of claim 1 , wherein the obtaining the material comprises forming shells around droplets of the silver halide grains in a colloidal material. 10. A printed circuit board assembly (PCBA), comprising: a material comprising silver halide grains; at least one component in contact with the material; and a monitoring component configured to: detect a variation in electrical properties of the at least one component that is above a threshold variation; and in response to the detecting the variation, enact a data protection response. 11. The PCBA of claim 10 , wherein the material further comprises a carrier medium. 12. The PCBA of claim 10 , wherein the material is deposited on the surface of the at least one component. 13. The PCBA of claim 10 , wherein the material further comprises a colloidal material. 14. The PCBA of claim 10 , wherein the material further comprises a microcapsule containing the silver halide grains. 15. The PCBA of claim 14 , wherein the silver halide grains are embedded in a shell of the microcapsule. 16. The PCBA of claim 14 , wherein the silver halide grains are suspended in a colloidal material in a core of the microcapsule. 17. The PCBA of claim 10 , wherein the material further comprises a reducing agent. 18. A device, comprising: a printed circuit board assembly (PCBA), comprising: a material comprising silver halide grains; at least one component in contact with the material; and a monitoring component configured to: detect a variation in electrical properties of the at least one component that is above a threshold variation; and in response to the detecting the variation, enact a data protection response. 19. The device of claim 18 , further comprising a housing that is opaque to ultraviolet (UV) light. 20. The device of claim 18 , further comprising a UV-light sensor.
using active circuits · CPC title
Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] (G01R31/318508 takes precedence; contactless testing G01R31/302; testing contacts or connections G01R31/66) · CPC title
associated with surface mounted components · CPC title
inorganic · CPC title
Circuit arrangements not adapted to a particular type of detector {(pulse-selection circuits H03K, G01R)} · CPC title
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