Systems, methods, and media for single photon depth imaging with improved precision in ambient light

Patent metadata

Field	Value
Publication number	US-12078720-B2
Application number	US-201916297320-A
Country	US
Kind code	B2
Filing date	Mar 8, 2019
Priority date	Mar 8, 2019
Publication date	Sep 3, 2024
Grant date	Sep 3, 2024

Abstract

In accordance with some embodiments, systems, methods and media for single photon depth imaging with improved precision in ambient light conditions are provided. In some embodiments, the system comprises: a light source; a single photon detector; an attenuation element configured to provide a variable intensity attenuation factor; and a processor programmed to: (a)-determine an ambient light intensity associated with a scene point; (b)-select an attenuation factor based on the ambient light intensity; (c)-estimate a depth of the scene point based on a multiplicity of photon arrival times determined using the detector during a period of time during which light incident on the detector is attenuated by the selected attenuation factor and during which the light source is configured to periodically emit a pulse of light toward the scene point; (d)-repeat (a)-(c) for each of a multiplicity of scene points.

First claim

What is claimed is:

1. A system for determining depths, comprising:
a light source;
a detector configured to detect arrival of individual photons;
an attenuation element configured to provide a variable intensity attenuation factor to remove pile-up of detected photons and decrease an error associated with a calculation of depth,
wherein an intensity of light perceived by the detector corresponds to a product of the attenuation factor and an intensity of light perceived by the detector in the absence of attenuation by the attenuation element; and

a processor that is programmed to:
(a) determine an ambient light intensity associated with a scene point;
(b) calculate an attenuation factor based on the ambient light intensity;
(c) estimate a depth of the scene point based on a multiplicity of photon arrival times determined using the detector during a period of time during which light incident on the detector is attenuated by an attenuation factor selected based on the calculated attenuation factor and during which the light source is configured to periodically emit a pulse of light toward the scene point;
(d) repeat (a) through (c) for each of a multiplicity of scene points.

2. The system of claim 1 , wherein the detector comprises a single photon avalanche diode (SPAD).

3. The system of claim 1 , wherein the attenuation element comprises a diaphragm with a controllable aperture disposed between the scene point and the detector, and
wherein the attenuation factor varies with a diameter of the aperture.

4. The system of claim 3 , wherein the processor is further programmed to:
cause the diameter of the aperture to adjust to a different diameter that provides the selected attenuation factor.

5. The system of claim 1 , wherein the attenuation element comprises a plurality of attenuation elements, each of the plurality of attenuation elements having a different attenuation factor.

6. The system of claim 5 , wherein one of the plurality of attenuation elements is disposed between the scene point and the detector.

7. The system of claim 5 , wherein the calculated attenuation factor is an optimum attenuation factor, and wherein the processor is further programmed to:
select an attenuation element of the plurality of attenuation elements that has an attenuation factor that is closest to the optimum attenuation factor.

8. The system of claim 7 , wherein each of the plurality of attenuation elements is associated with one of a plurality of detectors and the selected attenuation element is associated with the detector, and
wherein the processor is further programmed to:
estimate the depth of the scene point based on data collected using the detector associated with the selected attenuation element.

9. The system of claim 1 , wherein the attenuation element comprises a circuit that provides a bias voltage to the detector to control a quantum efficiency of the detector, and
wherein the attenuation factor varies with the bias voltage.

10. The system of claim 1 , wherein the processor is further programmed to:
(c1) determine, for an i th time bin of B time bins, a number Ni corresponding to a number of detection events by the detector falling within the i th time bin during N cycles each having a cycle duration,
wherein each of the multiplicity of photon arrival times is associated with one of the B time bins, and
wherein each of the N cycles includes:
(i) the light source emitting a pulse at a first time; and
(ii) based on a signal output from the detector indicating that a photon was detected at a second time within the cycle duration, determining that an elapsed time between the first time and the second time corresponds to the i th time bin;

(c2) repeat (c1) for each i from 1 to B; and
(c3) estimate the depth based on a vector comprising values (N 1 , N 2 , . . . , N B ).

11. The system of claim 10 , wherein the processor is further programmed to:
estimate the depth of the scene point by applying a Coates-correction to the vector comprising values (N 1 , N 2 , . . . , N B ).

12. The system of claim 1 , wherein the processor is further programmed to:
(a1) determine, for an i th time bin of B time bins, a number N′ corresponding to a number of detection events by the detector falling within the i th time bin during N′ cycles each having a cycle duration,
wherein each of the N′ cycles includes:
(i) inhibiting the light source from emitting a pulse at a first time; and
(ii) based on a signal output from the detector indicating that a photon was detected at a second time within the cycle duration, determining that an elapsed time between the first time and the second time corresponds to the i th time bin;

(a2) repeat (a1) for each i from 1 to B; and
(a3) determine the ambient light intensity associated with the scene point based on a vector comprising values (N 1 , N 2 , . . . , N B ).

13. A method for determining depths, comprising:
(a) determining an ambient light intensity associated with a scene point;
(b) calculating an attenuation factor based on the ambient light intensity;
(c) estimating a depth of the scene point based on a multiplicity of photon arrival times detected by a detector during a period of time during which light incident on the detector is attenuated by an attenuation element configured to provide the calculated attenuation factor and during which a light source is configured to periodically emit a pulse of light toward the scene point,
wherein an intensity of light perceived by the detector corresponds to a product of the attenuation factor and an intensity of light perceived by the detector in the absence of attenuation by the attenuation element, and
wherein the attenuation factor is configured to remove pile-up of detected photons and decrease an error associated with the depth of the scene point; and
wherein the detector is configured to detect arrival of individual photons;

(d) repeating (a) through (c) for each of a multiplicity of scene points.

14. The method of claim 13 , wherein the detector comprises a single photon avalanche diode (SPAD).

15. The method of claim 13 , wherein the attenuation element comprises a diaphragm with a controllable aperture disposed between the scene point and the detector, and
wherein the attenuation factor varies with a diameter of the aperture.

16. The method of claim 15 , further comprising causing the diameter of the aperture to adjust to a different diameter that provides the selected attenuation factor.

17. A non-transitory computer readable medium containing computer executable instructions that, when executed by a processor, cause the processor to perform a method for determining depths, comprising:
(a) determining an ambient light intensity associated with a scene point;
(b) calculating an attenuation factor based on the ambient light intensity, which is associated with the scene point;
(c) estimating a depth of the scene point based on a multiplicity of photon arrival times detected by a detector during a period of time during which light incident on the detector is attenuated by an attenuation element configured to provide the calculated attenuation factor and during which a light source is configured to periodically emit a pulse of light toward the scene point,
wherein an intensity of light perceived by the detector corresponds to a product of the attenuation factor and an intensity of light perceived by the detector in the absence of attenuation by the attenuation element, and
wherein the attenuation factor is configured to remove pile-up of detect

Assignees

• Wisconsin Alumni Res Found

Inventors

• Gupta Anant
• Ingle Atul
• Velten Andreas
• Gupta Mohit

Classifications

• H10F30/225

  the potential barrier working in avalanche mode, e.g. avalanche photodiodes · CPC title

• G01S7/484

  Transmitters · CPC title

• G01S7/4868 Primary

  Controlling received signal intensity or exposure of sensor · CPC title

• G01S17/89

  for mapping or imaging · CPC title

• G01S7/487

  Extracting wanted echo signals {, e.g. pulse detection} · CPC title