Device to correct backscatter in X-ray images

Patent metadata

Field	Value
Publication number	US-12076178-B2
Application number	US-202017767184-A
Country	US
Kind code	B2
Filing date	Sep 25, 2020
Priority date	Oct 10, 2019
Publication date	Sep 3, 2024
Grant date	Sep 3, 2024

Abstract

An X-ray imaging detector ( 102 ) is proposed, wherein the X-ray imaging detector comprises an X-ray converter ( 103 ) for converting X-ray radiation into electrical charges. The X-ray imaging detector further comprises a detector plate ( 104 ) for collecting the electrical charges generated by the X-ray converter and for generating an image. In addition, the X-ray imaging detector comprises a structured plate ( 105 ) for modulating the intensity of backscattered X-ray radiation, wherein the structured plate is arranged at a side of the detector plate opposite the side of the X-ray converter. Moreover, the X-ray imaging detector comprises a data processing system, which is configured for mitigating image distortions caused by backscattered X-ray radiation. Thereto, the data processing system uses information about the structured plate.

First claim

The invention claimed is:

1. An X-ray imaging detector, comprising:
an X-ray converter for converting X-ray radiation into electrical charges;
a detector plate for collecting the electrical charges generated by the X-ray converter and for generating an image;
a data processor configured to process the image generated by the detector plate; and
a structured plate for modulating an intensity of backscattered X-ray radiation,
wherein the structured plate is arranged at a side of the detector plate opposite the side of the X-ray converter, and
wherein the data processor is configured to remove image distortions caused by the backscattered X-ray radiation using information about the structured plate.

2. The X-ray imaging detector of claim 1 , wherein the structured plate comprises radiopaque portions and radiolucent portions.

3. The X-ray imaging detector of claim 2 , wherein the radiopaque portions are configured to have a minimum extent in a direction parallel to the structured plate that is larger than a size of gaps between adjacent conversion elements of the X-ray converter.

4. The X-ray imaging detector of claim 3 , wherein the minimum extent of the radiopaque portions in a direction parallel to the structured plate is at least 1 mm.

5. The X-ray imaging detector of claim 2 , wherein the radiopaque portions of the structured plate comprise lead, and wherein an extent of the radiopaque portions in a direction perpendicular to the structured plate is 0.05 mm to 0.2 mm.

6. The X-ray imaging detector of claim 2 , wherein an extent of the radiopaque portions in a direction perpendicular to the structured plate is configured such that the X-ray radiation is attenuated by 50% or less when propagating through the radiopaque portions.

7. The X-ray imaging detector of claim 2 , wherein the radiopaque portions comprise radiopaque spheres and/or ellipsoids embedded in a radiolucent material, or wherein the radiolucent portions comprise radiolucent spheres and/or ellipsoids embedded in a radiopaque material.

8. The X-ray imaging detector of claim 2 , wherein the radiopaque portions comprise radiopaque cylinders and/or bars separated by the radiolucent portions, or wherein the radiolucent portions comprise radiolucent cylinders and/or bars separated by the radiopaque portions.

9. The X-ray imaging detector of claim 2 , wherein the radiopaque or radiolucent portions are distributed and/or oriented irregularly.

10. The X-ray imaging detector of claim 2 , wherein the radiopaque or radiolucent portions form a regular stripe pattern or a regular grid.

11. The X-ray imaging detector of claim 2 , further comprising a component which induces backscattered X-ray radiation with sharp intensity variations in a first region of the structured plate, and wherein a spatial frequency of the radiopaque or radiolucent portions is higher in the first region of the structured plate than in a second region of the structured plate.

12. The X-ray imaging detector of claim 1 , wherein a weight of the structured plate is less than 200 g.

13. The X-ray imaging detector of claim 1 , wherein the data processor is configured to utilize a calibration image of the structured plate for removing the image distortions caused by the backscattered X-ray radiation.

14. The X-ray imaging detector of claim 2 , wherein the radiolucent portions comprise at least one of air, carbon, aluminum, and plastic.

15. An X-ray imaging system, comprising:
an X-ray tube; and
an X-ray imaging detector comprising:
an X-ray converter for converting X-ray radiation into electrical charges;
a detector plate for collecting the electrical charges generated by the X-ray converter and for generating an image;
a data processor configured to process the image generated by the detector plate; and
a structured plate for modulating an intensity of backscattered X-ray radiation, wherein the structured plate is arranged at a side of the detector plate opposite the side of the X-ray converter, and wherein the data processor is configured to remove image distortions caused by the backscattered X-ray radiation using information about the structured plate.

Assignees

• Koninklijke Philips Nv

Inventors

• Koepnick Johannes
• Maack Hanns-Ingo
• Hermann Eugen
• Kuhrmann Bernd

Classifications

• A61B6/585

  Calibration of detector units · CPC title

• A61B6/4291

  the detector being combined with a grid or grating · CPC title

• G01T1/20188

  Auxiliary details, e.g. casings or cooling · CPC title

• A61B6/582

  Calibration · CPC title

• A61B6/5282 Primary

  due to scatter · CPC title