Method of predicting soybean yield

US12073350B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-12073350-B2
Application numberUS-202017603731-A
CountryUS
Kind codeB2
Filing dateApr 16, 2020
Priority dateApr 16, 2019
Publication dateAug 27, 2024
Grant dateAug 27, 2024

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  5. First independent claim

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Abstract

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To provide a method for predicting a soybean yield at an early stage with high accuracy.The method for predicting a soybean yield comprises: acquiring analytical data of one or more components from a leaf sample collected from the soybean; and predicting a soybean yield using a correlation between the data and a soybean yield.

First claim

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The invention claimed is: 1. A method, the method comprising: choosing a plurality of components of a soybean plant; acquiring first analytical data of each of the plurality of chosen components of a leaf sample collected from a plurality of first soybean plants; constructing, by a processor, a first yield prediction model in a form of a machine learning model using the first analytical data of each of the plurality of chosen components of the leaf sample collected from the plurality of first soybean plants; calculating a variable importance in projection (VIP) value for each of the plurality of chosen components of the leaf sample collected from the plurality of first soybean plants with respect to the first yield prediction model; selecting a subset of the plurality of chosen components of the leaf sample collected from the plurality of first soybean plants based upon the VIP values, the subset of the plurality of chosen components of the leaf sample collected from the plurality of first soybean plants including fewer components than the plurality of chosen components; constructing, by the processor, a second yield prediction model in a form of a machine learning model using the first analytical data of each of the components in the subset of the plurality of chosen components which includes fewer components than the plurality of chosen components; acquiring second analytical data of the components of the subset of the plurality of chosen components which includes fewer components than the plurality of chosen components from a leaf sample collected from a second soybean plant from a field; predicting a soybean yield using the second analytical data and the second yield prediction model, which was constructed using the first analytical data of each of the components in the subset of the plurality of chosen components which includes fewer components than the plurality of chosen components; selecting a material for the field from which the second soybean plant came based upon the predicted soybean yield; comparing an actual soybean yield of the second soybean plant and the predicted soybean yield; and optimizing the second yield prediction model based upon a result of the comparison of the actual soybean yield and the predicted soybean yield. 2. The method according to claim 1 , wherein the first analytical data is corrected by a pooled QC method. 3. The method according to claim 1 , wherein the first analytical data is corrected by an internal standard substance. 4. The method according to claim 1 , wherein the plurality of chosen components of the leaf sample collected from the plurality of first soybean plants used for constructing the first yield prediction model are at least two components selected from the group consisting of components having an accurate mass (m/z), provided by mass analysis, of 139 to 1,156. 5. The method according to claim 1 , wherein the plurality of chosen components of the leaf sample collected from the plurality of first soybean plants used for constructing the first yield prediction model are at least two components selected from the group consisting of components described in the following Tables A1a to 1c, defined by an accurate mass (m/z) provided by mass analysis: TABLE A1a Component Component No. m/z No. m/z 1 139.0389 81 259.0827 2 141.9592 82 259.2076 3 147.0435 83 261.1501 4 147.0446 84 261.2233 5 149.0234 85 263.2381 6 149.0241 86 264.2335 7 161.0606 87 265.1440 8 163.0398 88 269.0818 9 163.1325 89 271.0618 10 165.0550 90 271.0619 11 170.0974 91 271.2280 12 171.1501 92 273.0769 13 175.1486 93 274.0541 14 177.0551 94 274.0928 15 179.0717 95 274.1606 16 181.1232 96 275.2020 17 181.1237 97 275.2023 18 183.1865 98 277.2184 19 186.0921 99 277.2186 20 189.1278 100 277.2186 21 190.0506 101 279.0512 22 191.1437 102 279.0515 23 191.1439 103 279.0951 24 193.0859 104 279.1610 25 193.0861 105 279.1611 26 193.1597 106 279.2320 27 194.1182 107 279.23

Assignees

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Classifications

  • G06Q50/02Primary

    Agriculture; Fishing; Forestry; Mining · CPC title

  • Quality analysis or management · CPC title

  • Prediction of business process outcome or impact based on a proposed change · CPC title

  • Botany in general · CPC title

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What does patent US12073350B2 cover?
To provide a method for predicting a soybean yield at an early stage with high accuracy.The method for predicting a soybean yield comprises: acquiring analytical data of one or more components from a leaf sample collected from the soybean; and predicting a soybean yield using a correlation between the data and a soybean yield.
Who is the assignee on this patent?
Kao Corp
What technology area does this patent fall under?
Primary CPC classification G06Q50/02. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Aug 27 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).