Charged particle beam system

Patent metadata

Field	Value
Publication number	US-12068128-B2
Application number	US-202217702343-A
Country	US
Kind code	B2
Filing date	Mar 23, 2022
Priority date	Apr 28, 2021
Publication date	Aug 20, 2024
Grant date	Aug 20, 2024

Abstract

An object of the invention is to acquire a high-quality image while maintaining an improvement in throughput of image acquisition (measurement (length measurement)). The present disclosure provides a charged particle beam system including a charged particle beam device and a computer system configured to control the charged particle beam device. The charged particle beam device includes an objective lens, a sample stage, and a backscattered electron detector that is disposed between the objective lens and the sample stage and that adjusts a focus of a charged particle beam with which a sample is irradiated. The computer system adjusts a value of an electric field on the sample in accordance with a change in a voltage applied to the backscattered electron detector.

First claim

The invention claimed is:

1. A charged particle beam system, comprising:
a charged particle beam device; and
a computer system configured to control the charged particle beam device, wherein
the charged particle beam device includes an objective lens, a sample stage, and a backscattered electron detector that is disposed between the objective lens and the sample stage and that adjusts a focus of a charged particle beam with which a sample is irradiated,
the backscattered electron detector is disposed at a position of a principal surface of the objective lens,
the computer system adjusts a value of an electric field on the sample in accordance with a change in a voltage applied to the backscattered electron detector,
the computer system adjusts the value of the electric field on the sample by controlling a voltage applied to the sample stage, and
the computer system switches a reverse bias voltage applied to a detector element provided in the backscattered electron detector between a breakdown voltage and a GND, and sets or controls the voltage applied to the backscattered electron detector and the voltage applied to the sample stage so that the focus becomes a desired focus state and so that the electric field on the sample becomes a preset value.

2. The charged particle beam system according to claim 1 , wherein
the desired focus state is a state where a focal position and a surface height of the sample coincide.

3. The charged particle beam system according to claim 2 , wherein
the desired focus state is a state where a resolution becomes minimum.

4. The charged particle beam system according to claim 1 , wherein
the charged particle beam device further includes a charging control electrode disposed between the backscattered electron detector and the sample stage, and
the computer system adjusts the value of the electric field on the sample by controlling a voltage applied to the charging control electrode in accordance with the change in the voltage applied to the backscattered electron detector.

5. The charged particle beam system according to claim 4 , wherein
the computer system controls the voltage applied to the backscattered electron detector so as to adjust the focus to a desired focus state, and controls the voltage applied to the charging control electrode so as to adjust the electric field on the sample to a preset value.

6. The charged particle beam system according to claim 1 , wherein
the backscattered electron detector is of a semiconductor type and has a structure that allows voltage application for electrostatic focus correction.

7. The charged particle beam system according to claim 2 , wherein
the computer system outputs a GUI for setting a value of the voltage applied to the sample stage, and adjusts the electric field on the sample according to the value of the voltage set on the GUI.

8. The charged particle beam system according to claim 4 , wherein
the computer system outputs a GUI for setting a value of the voltage applied to the charging control electrode, and adjusts the electric field on the sample according to the value of the voltage set on the GUI.

9. The charged particle beam system according to claim 2 , wherein
the computer system outputs a GUI for setting the value of the electric field on the sample, controls a value of the voltage applied to the sample stage according to the value of the electric field set on the GUI and adjusts the electric field on the sample.

10. The charged particle beam system according to claim 4 , wherein
the computer system outputs a GUI for setting the value of the electric field on the sample, controls an applied voltage of the charging control electrode according to the value of the electric field set on the GUI and adjusts the electric field on the sample.

11. A charged particle beam system comprising:
a charged particle beam device; and
a computer system configured to control the charged particle beam device, wherein
the charged particle beam device includes an objective lens, a sample stage, and a backscattered electron detector that is disposed between the objective lens and the sample stage and that adjusts a focus of a charged particle beam with which a sample is irradiated,
the computer system adjusts a value of an electric field on the sample in accordance with a change in a voltage applied to the backscattered electron detector,
the backscattered electron detector is of a semiconductor type, and
the computer system switches a reverse bias voltage applied to a detector element provided in the backscattered electron detector between a breakdown voltage and a GND, and controls a voltage applied to the sample stage so as to adjust the electric field on the sample to a preset value.

12. A charged particle beam system comprising:
a charged particle beam device; and
a computer system configured to control the charged particle beam device, wherein
the charged particle beam device includes an objective lens, a sample stage, and a backscattered electron detector that is disposed between the objective lens and the sample stage and that adjusts a focus of a charged particle beam with which a sample is irradiated,
the computer system adjusts a value of an electric field on the sample in accordance with a change in a voltage applied to the backscattered electron detector,
the charged particle beam device further includes a charging control electrode disposed between the backscattered electron detector and the sample stage, and
the computer system adjusts the value of the electric field on the sample by controlling a voltage applied to the charging control electrode in accordance with the change in the voltage applied to the backscattered electron detector,
the backscattered electron detector is of a semiconductor type, and
the computer system switches a reverse bias voltage applied to the backscattered electron detector between a breakdown voltage and a GND, and controls, in conjunction, the voltage applied to the charging control electrode so as to adjust the electric field on the sample to a preset value.

13. A charged particle beam system comprising:
a charged particle beam device; and
a computer system configured to control the charged particle beam device, wherein
the charged particle beam device includes an objective lens, a sample stage, and a backscattered electron detector that is disposed between the objective lens and the sample stage and that adjusts a focus of a charged particle beam with which a sample is irradiated,
the computer system adjusts a value of an electric field on the sample in accordance with a change in a voltage applied to the backscattered electron detector,
the computer system adjusts the value of the electric field on the sample by controlling a voltage applied to the sample stage, and
the computer system holds information on the value of the electric field on the sample corresponding to an applied voltage of the backscattered electron detector, acquires the information on the value of the electric field on the sample corresponding to the applied voltage when the applied voltage of the backscattered electron detector changes, and sets the voltage applied to the sample stage such that the electric field on the sample is at the acquired value of the electric field.

14. A charged particle beam system comprising:
a charged particle beam device; and
a computer system configured to control the charged particle beam device, wherein
the charged particle beam device includes an objective lens, a sample stage, and a backscattered electron detector that is disposed between the objective lens and the

Assignees

• Hitachi High Tech Corp

Inventors

• Nakamura Yusuke
• Abe Yusuke
• Tanimoto Kenji
• Ohashi Takeyoshi

Classifications

• H01J37/244 Primary

  Detectors; Associated components or circuits therefor · CPC title

• H01J37/12 Primary

  electrostatic · CPC title

• H01J37/265

  Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination · CPC title

• H01J2237/2448

  Secondary particle detectors · CPC title

• H01J2237/24475

  Scattered electron detectors · CPC title