Test system for an intelligent electronic device in an electric sub-station

Patent metadata

Field	Value
Publication number	US-12066471-B2
Application number	US-202318236315-A
Country	US
Kind code	B2
Filing date	Aug 21, 2023
Priority date	Apr 29, 2019
Publication date	Aug 20, 2024
Grant date	Aug 20, 2024

Abstract

Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.

First claim

The invention claimed is:

1. A test system comprising:
a shaft configured to rotate around a longitudinal axis;
a lever coupled to the shaft; and
a test switch unit comprising
a first lead conductively connected to a first conducting element,
a second lead,
a second conducting element,
a primary contact element, having a first end and a second end, wherein the first end of the primary contact element is connected to the second lead, and the second end of the primary contact element extends away from the second lead and is biased to abut the first conducting element, thereby completing an electrical path from the second lead to the first lead,
a secondary contact element, having a first end and a second end, wherein the first end of the secondary contact element is connected to the second lead, and the second end of the secondary contact element extends away from the second lead and is biased to not contact the second conducting element, and
a cam mounted on the shaft and configured to rotate around the longitudinal axis with the shaft,
wherein the cam comprises a first profiled element and a second profiled element,
wherein the first profiled element is configured to engage with the secondary contact element to move the second end of the secondary contact element to contact the second conducting element,
wherein the second profiled element is configured to engage with the primary contact element to decouple the second end of the primary contact element from the first conducting element,
and wherein the first profiled element and the second profiled element are configured relative to each other, such that during rotation of the cam in the rotation direction, the first profiled element engages with the secondary contact element before the second profiled element engages with the primary contact element.

2. The test system of claim 1 , wherein the second conducting element is a short-circuit element.

3. The test system of claim 1 , wherein the primary contact element is positioned between the cam and the secondary contact element, and wherein the primary contact element comprises a slot that is shaped to allow the first profiled element to pass through and engage with the secondary contact element.

4. The test system of claim 1 , wherein the test switch unit further comprises a connector port conductively connected to the second conducting element.

5. The test system of claim 4 , wherein the test system comprises a plurality of the test switch unit.

6. The test system of claim 5 , wherein the plurality of test switch units are conductively connected to each other via the connector ports.

7. The test system of claim 5 , wherein the shaft extends through each of the plurality of test switch units, such that rotation of the shaft causes rotation of the cam in each of the plurality of test switch units.

8. The test system of claim 1 , wherein one or both of the primary contact element and the secondary contact element are manufactured from an electrically conducting and flexible material.

9. The test system of claim 1 , wherein the lever is moveable in a plane that is orthogonal to the longitudinal axis, and wherein movement of the lever causes rotation of the shaft.

10. The test system of claim 1 , wherein the first lead is a relay lead, adapted to be communicatively coupled to an intelligent electronic device.

11. The test system of claim 10 , wherein the second lead is a field lead, operable to receive an input current.

12. The test system of claim 11 , wherein the relay lead is further adapted to be coupled to a current transformer (CT) circuit.

13. The test system of claim 12 , wherein the test system is configured to test the intelligent electronic device after the test switch unit shorts the CT circuit.

14. The test system of claim 12 , wherein the test switch unit is a first test switch unit, and wherein the test system further comprises:
a second test switch unit that is communicatively coupled to the intelligent electronic device and a trip circuit, and is configured to open the trip circuit when the shaft is rotated in the rotation direction; and
a third test switch unit that is communicatively coupled to the intelligent electronic device and a voltage transformer (VT) circuit, and which is configured to isolate the VT circuit when the shaft is rotated in the rotation direction.

15. The test system of claim 14 , wherein the test system is configured to test the intelligent electronic device upon the CT circuit being short-circuited by the first test switch unit, the trip circuit being opened by the second test switch unit, and the VT circuit being isolated by the third test switch unit.

16. The test system of claim 1 , wherein the test switch unit further comprises a third lead, and wherein the first conducting element is conductively connected to the third lead.

17. The test system of claim 1 , wherein the test switch unit further comprises:
a third lead conductively connected to a third conducting element; and
an additional secondary contact element, having a first end and a second end, wherein the first end of the additional secondary contact element is connected to the first lead, and the second end of the additional secondary contact element extends away from the first lead and is biased to not contact the third conducting element.

18. The test system of claim 17 , wherein the first profiled element comprises two diametrically disposed first elements configured to engage with both the secondary contact element and the additional secondary contact element, and wherein the second profiled element comprises two diametrically disposed second elements configured to engage with both the primary contact element and the first conducting element.

19. The test system of claim 18 , wherein the test switch unit further comprises a connector port conductively connected to the second conducting element.

20. The test system of claim 18 , wherein each of the primary contact element, the first conducting element, the secondary contact element, and the additional secondary contact element is manufactured from an electrically conducting and flexible material.

Assignees

• Hitachi Energy Ltd

Inventors

• V Loganadhan
• Ramachandra Mahesh
• Aj Manjunath
• S Shambhulingappa

Classifications

• G01R35/00

  Testing or calibrating of apparatus covered by the other groups of this subclass · CPC title

• G01R1/20

  Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments · CPC title

• G01R19/2513 Primary

  Arrangements for monitoring electric power systems, e.g. power lines or loads; Logging · CPC title