Robotic inspection devices for simultaneous surface measurements at multiple orientations

Patent metadata

Field	Value
Publication number	US-12061173-B2
Application number	US-202217824261-A
Country	US
Kind code	B2
Filing date	May 25, 2022
Priority date	Apr 22, 2021
Publication date	Aug 13, 2024
Grant date	Aug 13, 2024

Abstract

Robotic inspection devices for simultaneous surface measurements at multiple orientations are described. An example inspection device includes a robot and a first payload, where the robot is structured to move along an inspection surface in a first direction of travel. The first payload includes a first inspection assembly structured to support two phased array elements. The first phased array element has a first surface orientation and a first directional orientation, and the second phased array element has a second surface orientation and a second directional orientation. A raster device is structured to move the first inspection assembly in a second direction of travel along the inspection surface, wherein the first direction of travel and the second direction of travel are different.

First claim

What is claimed:

1. An inspection device, the device comprising:
a robot structured to move in a first direction of travel along an inspection surface; and
a first payload supported by the robot, the first payload comprising:
a first inspection assembly structured to support:
a first phased array element at a first surface orientation, wherein the first surface orientation is relative to the inspection surface, the first phased array element having a first directional orientation, wherein the first directional orientation is relative to a direction of travel of the robot; and
a second phased array element at a second surface orientation, wherein the second surface orientation is relative to the inspection surface, the second phased array element having a second directional orientation, wherein the second directional orientation is relative to the direction of travel of the robot; and

a raster device structured to move the first inspection assembly in a second direction of travel along the inspection surface, wherein the first direction of travel and the second direction of travel are different,
wherein the first inspection assembly includes a first pivot connection to the raster device such that the first inspection assembly, the first phased array element, and the second phased array element each rotate around the first pivot connection.

2. The inspection device of claim 1 , wherein the first surface orientation is distinct from the second surface orientation.

3. The device of claim 2 , wherein the first surface orientation comprises an angle between +5° and −5°, inclusive, relative to the inspection surface.

4. The device of claim 3 , wherein the second surface orientation comprises an angle between 40° and 50°, inclusive, relative to the inspection surface.

5. The device of claim 3 , wherein the second surface orientation comprises an angle between 30° and 60°, inclusive, relative to the inspection surface.

6. The device of claim 3 , wherein the second surface orientation comprises an angle between 30° and 75°, inclusive, relative to the inspection surface.

7. The device of claim 2 , wherein the first and second phased array elements inspect a common location on the inspection surface.

8. The device of claim 1 , wherein the first inspection assembly further comprises an acoustic barrier at a third surface orientation, the acoustic barrier positioned between the first phased array element and the second phased array element.

9. The device of claim 8 , wherein the third surface orientation is between the first surface orientation and the second surface orientation.

10. The device of claim 1 , wherein further comprising a tether fluidly coupled to a couplant source at a first end and to the robot at a second end.

11. The device of claim 10 , wherein the tether further comprises a data connection between a local inspection computing device and the robot.

12. The device of claim 1 , wherein the first inspection assembly further comprises a couplant connection fluidly coupled to the robot, and wherein the first phased array element and the second phased array element are UT sensors.

13. The device of claim 1 , wherein the first directional orientation and the second directional orientation are within 10°.

14. The device of claim 13 , wherein the first directional orientation is approximately longitudinal to the direction of travel.

15. The device of claim 1 , wherein the first payload further comprises a second inspection assembly.

16. The device of claim 15 , wherein the raster device is further structured to move the first and second inspection assemblies in unison.

17. The device of claim 15 , wherein the first inspection assembly and the second inspection assembly are separated by a distance between 2-8 inches, inclusive, along the first payload.

18. The device of claim 1 , further comprising a time of flight sensor.

19. The device of claim 1 , the first inspection assembly further including:
a linking component including the first pivot connection to the raster device;
a first sensor holder connected to the linking component via a first sensor holder pivot connection and structured to support the first phased array element; and
a second sensor holder connected to the linking component via a second sensor holder pivot connection and structured to support the second phased array element.

20. A method, comprising:
moving an inspection device in a first direction of travel along an inspection surface, wherein the inspection device includes a robot and a payload supported by the robot, and the payload includes:
a first inspection assembly structured to support:
a first phased array element at a first surface orientation, wherein the first surface orientation is relative to the inspection surface, the first phased array element having a first directional orientation, wherein the first directional orientation is relative to a direction of travel of the robot; and
a second phased array element at a second surface orientation, wherein the second surface orientation is relative to the inspection surface, the second phased array element having a second directional orientation, wherein the second directional orientation is relative to the direction of travel of the robot; and

moving, by a raster device, the first inspection assembly in a second direction of travel along the inspection surface, wherein the first direction of travel and the second direction of travel are different; and
causing each of the first inspection assembly, the first phased array element, and the second phased array element to rotate around a same pivot connection.

21. The method of claim 20 , wherein the same pivot connection is between the first inspection assembly and the raster device.

22. The method of claim 20 , wherein the payload further comprises a second inspection assembly, and the method further comprises:
moving, by the raster device, the first inspection assembly and the second inspection assembly in unison.

Assignees

• Gecko Robotics Inc

Inventors

• David Chase
• Aparicio Jose
• Mora Juan Roberto Mendoza
• Low Kevin Y

Classifications

• G01N2291/0289

  Internal structure, e.g. defects, grain size, texture · CPC title

• G01N29/04

  Analysing solids (using acoustic emission techniques G01N29/14) · CPC title

• G01N29/043

  in the interior, e.g. by shear waves · CPC title

• G01N29/07

  by measuring propagation velocity or propagation time of acoustic waves · CPC title

• G01N29/262

  by electronic orientation or focusing, e.g. with phased arrays (phased arrays per se G10K11/34) · CPC title